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Xiaoke N Wan

from Fairfax, VA
Age ~50
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Also known as:
Wan Xiaoke
Phone and address:
3723 Broadrun Dr, Fairfax, VA 22033
(571) 203-0580
Connected to:
Aaron Wan, 41Adrian Wan, 36Angel Wan, 70Benjamin T Wan, 65Bin Wan, 52Chea Wan, 52Cheng H Wan, 61Chien M Wan, 70Choo S Wan, 80Christine H Wan, 51

Xiaoke Wan Phones & Addresses

  • 3723 Broadrun Dr, Fairfax, VA 22033 (571) 203-0580
  • Herndon, VA
  • Corning, NY
  • 2117 77Th St, Gainesville, FL 32607 (352) 331-9780
  • Port Jefferson Station, NY
  • Orange Park, FL
  • College Station, TX
  • Alachua, FL

Work

Company: Digital signal corporation Jul 2013 Position: Senior professional in optics

Education

Degree: Master of Science, Doctorates, Masters, Doctor of Philosophy School / High School: Texas A&M University 1997 to 2003 Specialities: Physics, Philosophy

Skills

Optics • Laser • Laser Physics • Metrology • Spectroscopy • Optical Fiber • Photonics • Sensors • Fiber Optics • Interferometry • Nonlinear Optics • Design of Experiments • R&D • Labview • Physics • Thin Films • Optoelectronics • Opto Mechanical Design • Zemax • Precision Monolithic Assembly • Optical Metrology • Optical Amplifiers • Free Space and Fiber Interferometers • Computer Simulation • Solidworks • Vis/Nir Spectrometers • Matlab • Project Management • Optical Design • Image Processing • Remote Sensing Applications • Hyperspectral Imaging • Research and Development • Laser Processing • Lidar • Machine Shop • Thermal Management • Optical Materials • Micro Optics • Lens Array • Processes Development • Fiber Array • Fourier Transform Spectroscopy and Fts I... • Doppler Imaging • Project and Team Management

Industries

Research

Resumes

Resumes

Xiaoke Wan Photo 1

Senior Professional In Optics

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Location:
Washington, DC
Industry:
Research
Work:
Digital Signal Corporation
Senior Professional In Optics
Corning Incorporated Aug 2012 - Jul 2013
Optical Scientist
University of Florida Sep 2004 - 2012
Associate Scientist, Graduate Faculty
Quantronix Corporation Apr 2003 - Sep 2004
Laser R and D Engineer
Texas A&M University Sep 1997 - Apr 2003
Research and Teaching Assistant
Education:
Texas A&M University 1997 - 2003
Master of Science, Doctorates, Masters, Doctor of Philosophy, Physics, Philosophy Chinese Academy of Sciences 1994 - 1997
Master of Science, Masters Jilin University 1990 - 1994
Bachelors, Bachelor of Science, Physics
Skills:
Optics
Laser
Laser Physics
Metrology
Spectroscopy
Optical Fiber
Photonics
Sensors
Fiber Optics
Interferometry
Nonlinear Optics
Design of Experiments
R&D
Labview
Physics
Thin Films
Optoelectronics
Opto Mechanical Design
Zemax
Precision Monolithic Assembly
Optical Metrology
Optical Amplifiers
Free Space and Fiber Interferometers
Computer Simulation
Solidworks
Vis/Nir Spectrometers
Matlab
Project Management
Optical Design
Image Processing
Remote Sensing Applications
Hyperspectral Imaging
Research and Development
Laser Processing
Lidar
Machine Shop
Thermal Management
Optical Materials
Micro Optics
Lens Array
Processes Development
Fiber Array
Fourier Transform Spectroscopy and Fts Instrumentation
Doppler Imaging
Project and Team Management

Publications

Us Patents

Stable Monolithic Interferometer For Wavelenghth Calibration

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US Patent:
8570524, Oct 29, 2013
Filed:
Aug 3, 2010
Appl. No.:
12/849046
Inventors:
Xiaoke Wan - Gainesville FL, US
Jian Ge - Gainesville FL, US
Assignee:
University of Florida Research Foundation, Inc. - Gainesville FL
International Classification:
G01B 9/02
G01J 3/45
US Classification:
356451
Abstract:
Calibration of an arbitrary spectrometer can use a stable monolithic interferometer as a wavelength calibration standard. Light from a polychromatic light source is input to the monolithic interferometer where it undergoes interference based on the optical path difference (OPD) of the interferometer. The resulting wavelength-modulated output beam is analyzed by a reference spectrometer to generate reference data. The output beam from the interferometer can be provided to an arbitrary spectral instrument. Wavelength calibration of the arbitrary spectral instrument may then be performed based on a comparison of the spectral instrument output with the reference data. By appropriate choice of materials for the monolithic interferometer, a highly stable structure can be fabricated that has a wide field and/or is thermally compensated. Because the interferometer is stable, the one-time generated reference data can be used over an extended period of time without re-characterization.

Fiber Delivery System With Enhanced Passive Fiber Protection And Active Monitoring

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US Patent:
20060013532, Jan 19, 2006
Filed:
Jul 19, 2004
Appl. No.:
10/895238
Inventors:
Xiaoke Wan - Port Jefferson Station NY, US
International Classification:
G02B 6/00
US Classification:
385031000, 385012000
Abstract:
In an optical fiber system for delivering laser, a laser beam is focused onto an optical fiber at an injection port of the system. The end portions of the fiber have cladding treatments to attenuate stray light and cladding mode light, so as to enhance the protection of the outer layer joint points. Photodetector sensors monitor scattered stray light, cladding mode light, and/or transmitted cladding mode light. Sensor signals are provided to a control unit for analyzing the fiber coupling performance. If need be, the control unit can control a laser shutter or the like to minimize or prevent damage. In materials processing applications, the photodetector signals can be analyzed to determine the processing status of a work piece.

High-Precision Monolithic Optical Assemblies And Methods For Fabrication And Alignment Thereof

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US Patent:
20110286100, Nov 24, 2011
Filed:
Apr 6, 2009
Appl. No.:
12/933490
Inventors:
Xiaoke Wan - Gainesville FL, US
Jian Ge - Gainesville FL, US
International Classification:
G02B 27/10
G02B 27/00
B23P 11/00
US Classification:
359578, 29428
Abstract:
High-precision monolithic optical assemblies are formed using low-cost standard optical components, such as wedge plates and/or wedge second surface mirrors. By rolling and/or shifting the components relative to each other with matched optical surfaces in contact, a precise alignment solution is found for a particular optical assembly. The resulting arrangement of components can be bonded or held together so as to form a high-precision monolithic optical assembly, which can be inserted into an optical system, according to the assembly's function. The functionality of the monolithic optical assembly can be independent of the optical system in which it is used.

Step-Scanning Sensing Beam For Imaging Interferometer

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US Patent:
20180238675, Aug 23, 2018
Filed:
Jan 14, 2018
Appl. No.:
15/871050
Inventors:
Xiaoke Wan - Fairfax VA, US
International Classification:
G01B 9/02
G01B 11/14
Abstract:
In interferometer imaging signal acquisition using a movable optical beam to sample a target with specular or non specular reflecting surfaces or internal features, beam moving during interferometer signal acquisition can generate unwanted phase error due to shifting speckle field. Examples include coherent LIDAR, Interferometry Doppler sensing and optical coherence tomography. During an interferometer signal acquisition period, an interferometer sensing beam can be substantially stationary, and active step-scanning can be synchronized with interferometer signal acquisition cycles. For interferometers using repetitive chirping lasers, passive dispersive counter-scan mechanisms can be used to assist step-scanning operation.

Apparatus And Method For Terminating An Array Of Optical Fibers

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US Patent:
20170160485, Jun 8, 2017
Filed:
Jul 12, 2016
Appl. No.:
15/207543
Inventors:
- Chantilly VA, US
Xiaoke Wan - Fairfax VA, US
International Classification:
G02B 6/36
G02B 6/32
G02B 6/25
Abstract:
A method for terminating a plurality of optical fibers arranged in a two-dimensional arrangement comprises inserting the plurality of optical fibers into and through a fiber ferrule, where the fiber ferrule has a plurality of parallel channels extending from an entry surface through to a polish surface; polishing the polish surface including an end of each of the plurality of optical fibers to form a coplanar surface at a polish angle relative to a reference plane perpendicular to the parallel channels; and affixing a glass plate to the polish surface.

Apparatus And Method For Terminating An Array Of Optical Fibers

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US Patent:
20160011367, Jan 14, 2016
Filed:
Jul 8, 2014
Appl. No.:
14/325538
Inventors:
- Chantilly VA, US
Xiaoke Wan - Fairfax VA, US
International Classification:
G02B 6/08
G02B 1/11
G02B 6/32
G02B 6/24
G02B 6/25
Abstract:
A method for terminating a plurality of optical fibers arranged in a two-dimensional arrangement comprises inserting the plurality of optical fibers into and through a fiber ferrule, where the fiber ferrule has a plurality of parallel channels extending from an entry surface through to a polish surface; polishing the polish surface including an end of each of the plurality of optical fibers to form a coplanar surface at a polish angle relative to a reference plane perpendicular to the parallel channels; and affixing a glass plate to the polish surface.

Simultaneous Refractive Index And Thickness Measurements With A Monochromatic Low-Coherence Interferometer

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US Patent:
20140168637, Jun 19, 2014
Filed:
Jul 31, 2012
Appl. No.:
14/236613
Inventors:
Xiaoke Wan - Herndon VA, US
Jian Ge - Gainesville FL, US
Assignee:
UNIVERSITY OF FLORIDA RESEARCH FOUNDATION, INC. - Gainesville FL
International Classification:
G01B 11/06
G01N 21/45
US Classification:
356 73
Abstract:
A scanning monochromatic spatial low-coherent interferometer (S-LCI) can be used to simultaneously measure geometric thickness and refractive index. The probe beam of the scanning S-LCI can be an off-axis converging single wavelength laser beam, and the decomposed incident angles of the beam on the sample can be accurately defined in the Fourier domain. The angle dependent phase shift of a plane parallel plate or other sample can be obtained in a single system measurement. From the angle dependent phase shift, the geometric thickness and refractive index of the sample can be simultaneously obtained. Additionally or alternatively, the S-LCI system can interrogate the sample to profile the location and refractive index of one or more layers within the sample using the disclosed techniques.
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Xiaoke N Wan from Fairfax, VA, age ~50 Get Report