Search

Snigdha Ghoshal Phones & Addresses

  • Kyle, TX
  • 10421 Indigo Broom Loop, Austin, TX 78733 (512) 263-2661
  • 8419 Galeana Trace Cv, Austin, TX 78733 (512) 663-6736
  • Sunnyvale, CA
  • Richmond, CA
  • Berkeley, CA

Work

Company: Ghoshal law pllc immigration law firm Jul 2015 Position: Immigration attorney

Education

School / High School: The University of Texas School of Law 2012 Specialities: Public Policy, Law

Skills

Employment Based Immigration • H 1B • Family Based Immigration • Litigation • Visas • Legal Writing • Adjustment of Status • Hearings • Asylum • Withholding of Removal • Nonprofits • Legal Research • Naturalization • Public Speaking • Citizenship • Facilitative Mediation • Negotiation

Languages

English • Bengali • Hindi

Ranks

Certificate: The State Bar of California

Interests

Creative Writing • Human Rights • Drama • Acting and Directing

Emails

u***l@gmail.com

Industries

Law Practice

Resumes

Resumes

Snigdha Ghoshal Photo 1

Immigration Attorney

View page
Location:
Austin, TX
Industry:
Law Practice
Work:
Ghoshal Law Pllc Immigration Law Firm
Immigration Attorney

Ibm Jan 2001 - Oct 2001
Engineer
Education:
The University of Texas School of Law 2012
Concord Law School at Purdue University Global 2011
Doctor of Jurisprudence, Doctorates, Law
Santa Clara University 1996
Santa Clara University
The University of Texas at Austin
Bachelors, Bachelor of Arts, Bachelor of Science, Microbiology
Skills:
Employment Based Immigration
H 1B
Family Based Immigration
Litigation
Visas
Legal Writing
Adjustment of Status
Hearings
Asylum
Withholding of Removal
Nonprofits
Legal Research
Naturalization
Public Speaking
Citizenship
Facilitative Mediation
Negotiation
Interests:
Creative Writing
Human Rights
Drama
Acting and Directing
Languages:
English
Bengali
Hindi
Certifications:
The State Bar of California
Center For Public Policy and Dispute Resolution, Law School of University of Texas, Austin
Trained Interpreter
License To Practice Law In Ca
Mediator

Publications

Us Patents

Scanning Heat Flow Probe And The Method Of Fabricating The Same

View page
US Patent:
6652139, Nov 25, 2003
Filed:
Jan 21, 2003
Appl. No.:
10/348532
Inventors:
Steven Alan Cordes - Yorktown Heights NY
David R. DiMilia - Wappingers Falls NY
James Patrick Doyle - Bronx NY
Matthew James Farinelli - Bronx NY
Snigdha Ghoshal - Austin TX
Uttam Shyamalindu Ghoshal - Austin TX
Chandler Todd McDowell - Austin TX
Li Shi - Austin TX
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G01K 1708
US Classification:
374208, 374 29, 374179
Abstract:
A method of fabricating a scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. The invention also relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.

Scanning Heat Flow Probe

View page
US Patent:
6679625, Jan 20, 2004
Filed:
Dec 17, 2001
Appl. No.:
10/022162
Inventors:
Steven Alan Cordes - Yorktown Heights NY
David R. DiMilia - Wappingers Falls NY
James Patrick Doyle - Bronx NY
Matthew James Farinelli - Bronx NY
Snigdha Ghoshal - Austin TX
Uttam Shyamalindu Ghoshal - Austin TX
Chandler Todd McDowell - Austin TX
Li Shi - Austin TX
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G01K 1700
US Classification:
374 29, 374113, 374 57, 374 43
Abstract:
A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.

Scanning Heat Flow Probe

View page
US Patent:
6817761, Nov 16, 2004
Filed:
Apr 21, 2003
Appl. No.:
10/420063
Inventors:
Steven Alan Cordes - Yorktown Heights NY
David R. DiMilia - Wappingers Falls NY
James Patrick Doyle - Bronx NY
Matthew James Farinelli - Bronx NY
Snigdha Ghoshal - Austin TX
Uttam Shyamalindu Ghoshal - Austin TX
Chandler Todd McDowell - Austin TX
Li Shi - Austin TX
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G01K 702
US Classification:
374179, 374 43, 374 44
Abstract:
A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.

Scanning Heat Flow Probe

View page
US Patent:
6866415, Mar 15, 2005
Filed:
Jan 21, 2003
Appl. No.:
10/348541
Inventors:
Steven Alan Cordes - Yorktown Heights NY, US
David R. DiMilia - Wappingers Falls NY, US
James Patrick Doyle - Bronx NY, US
Matthew James Farinelli - Bronx NY, US
Snigdha Ghoshal - Austin TX, US
Uttam Shyamalindu Ghoshal - Austin TX, US
Chandler Todd McDowell - Austin TX, US
Li Shi - Austin TX, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G01K017/00
G01K015/00
US Classification:
374 29, 374 1
Abstract:
A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.

High Speed Magnetic Flux Sampling

View page
US Patent:
61182842, Sep 12, 2000
Filed:
Oct 6, 1997
Appl. No.:
8/943218
Inventors:
Uttam S. Ghoshal - Austin TX
Snigdha Ghoshal - Austin TX
International Classification:
G01R 31315
G01R 3128
US Classification:
324750
Abstract:
A system for measuring magnetic fields produced by an integrated circuit device-under-test includes a clock generator configured to generate a clock signal, a delay circuit configured to generate a delayed clock signal having a known delay relative to the clock signal, a pulse generator configured to generate a series of pulses having a frequency corresponding to a frequency of the clock signal, the pulses of the series of pulses being offset from the clock signal by the known delay, and a sensor having a property that varies in response to a magnetic field at the sensor. A sampling circuit connected to the sensor and to the pulse generator is configured to measure the property of the sensor at times corresponding to pulses of the series of pulses, and to produce a sampling signal having, for each pulse, a first value (e. g. , a logical one) when the property of the sensor indicates that the magnetic field at the sensor exceeds a threshold amount and a second value (e. g. , a logical zero) when the property of the sensor indicates that the magnetic field at the sensor does not exceed the threshold amount.
Snigdha I Ghoshal from Kyle, TX, age ~61 Get Report