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Yu R Lo

from Foster City, CA
Age ~53
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Also known as:
Yu Yining Lo, Yu U Lo, Roger Yu Lo, Lo Yu
Phone and address:
1025 Monterey Ave, San Mateo, CA 94404
Related to:
Li Chun Lo, 73Simon K Poon, 41Ling Liu YiChi Ping Lo, 55Sui L Yung, 70Wangsue S Wang, 54Youyan Yan Wang, 47Yining Wang, 55Peggy Lo, 45Zili W Wang, 69Zili Wang, 55Jim P Wang, 57Youcai Wang, 58Wei Wang, 50Yifan Wang, 32Jimpo Wang, 57Rujia Wang, 34Ying Zou, 70Lingyong Wang, 34
Connected to:
Adrianne Lo, 31Alain M Lo, 71Alice Y Lo, 46Amy T Lo, 69Angelina F Lo, 75Ann P Lo, 72Anthony Lo, 55Ben Lo, 58Benito K Lo, 75Brigitte Lo, 57

Yu Lo Phones & Addresses

  • 1025 Monterey Ave, San Mateo, CA 94404
  • Foster City, CA
  • 6103 Sienna Ter, Fremont, CA 94555 (510) 791-1082
  • 555 Pierce St, Albany, CA 94706 (510) 559-7828
  • Berkeley, CA
  • Alameda, CA

Resumes

Resumes

Yu Lo Photo 1

Software Engineer

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Location:
San Francisco, CA
Industry:
Computer Software
Work:
Facebook
Software Engineer
Pinterest Jun 2015 - Aug 2018
Software Engineer
University of Utah Jul 2013 - May 2015
Graduate Research Assistant
Lawrence Berkeley National Laboratory May 2014 - Aug 2014
Research Intern
Hewlett-Packard Jul 2012 - May 2013
System Software Engineer
Education:
University of Utah 2013 - 2015
Masters, Computer Science National Tsing Hua University 2010 - 2013
Bachelors, Electrical Engineering, Electrical Engineering and Computer Science, Computer Science
Skills:
Fortran
Development
Linux
C
Windows
Html
Java
Xml
Testing
Cuda Programming
Parallel Programming
Php
Javascript
C++
Assessment
Css
Sql
Python
Design
Mysql
Shell Scripting
Yu Lo Photo 2

Yu Lo

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Yu Lo Photo 3

Yu Lo

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Yu Lo Photo 4

Yu Lo

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Location:
United States

Publications

Us Patents

Method For Burnishing Hard Disks

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US Patent:
6526639, Mar 4, 2003
Filed:
Aug 30, 2001
Appl. No.:
09/944226
Inventors:
Shanlin Duan - Fremont CA
Wei-Ming Lee - Pleasanton CA
Yu Lo - Fremont CA
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
B24B 3900
US Classification:
29 9001, 451 63, 451290
Abstract:
The disk burnishing process is conducted with a contact flying burnishing head wherein the leading edge of the burnishing head is disposed above the surface of the disk, while the trailing edge of the burnishing head makes contact with the surface of the disk. The contact flying configuration of the burnishing head is obtained by controlling the rotating disk RPM in conjunction with the burnishing head design characteristics. In the contact flying burnishing process, the burnishing edges of the several burnishing pads of the head are disposed at different heights relative to the disk surface, such that the leading burnishing pad edges are higher than the trailing burnishing pad edges. In this configuration, high asperities are trimmed by the burnishing pads while low asperities are not. Thus, a disk is properly burnished for subsequent hard disk drive performance with a minimum of surface debris being created by the burnishing process.

Disk Drive Laser Melt Bump Disk For Accurate Glide Calibration And Certification Processing

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US Patent:
6530258, Mar 11, 2003
Filed:
Jul 23, 2001
Appl. No.:
09/911147
Inventors:
James Hammond Brannon - Palo Alto CA
Shanlin Duan - Fremont CA
Yu Lo - Fremont CA
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G01B 2130
US Classification:
73 189, 73 1181, 65105
Abstract:
A bump disk for accurate glide calibration has a new type of glass laser melt bumps that give the same signal amplitudes as conventional AlMg laser melt bumps for the same bump height. The present invention provides a solution to switch the calibration bumps from AlMg to glass, and can be used in disk manufacturing lines to save 30% on the cost of hard disks from inaccurate glide certification processes. The solution is to trim or burnish away loose and/or high particles on production disks before the glide tests. This additional processing step causes the responses from the glass bumps to become very similar to those of the AlMg bumps, thereby enabling glass and AlMg disks to become materially compatible.

Apparatus And Method For Glide Height Calibration Of Disk Surfaces By Use Of Dual-Zone Laser Texture

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US Patent:
6662623, Dec 16, 2003
Filed:
Sep 20, 2001
Appl. No.:
09/957291
Inventors:
Bradley Frederick Baumgartner - Los Banos CA
James Hammond Brannon - Palo Alto CA
Jorge Daniel Colonia - San Jose CA
Huyen D. Do - San Jose CA
Shanlin Duan - Fremont CA
Connie H. Moy - San Jose CA
Hang Fai Ngo - San Jose CA
Yu Lo - Fremont CA
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G11B 582
US Classification:
73 189
Abstract:
A disk for calibrating glide heads utilizes a dual-zone configuration of multiple laser melt bumps having selected heights. Averaging the PZT response over many bumps significantly narrows the response distribution, resulting in greater certainty and correlation of the PZT amplitude to bump height. The multiple calibration bumps are circumferentially arranged on a disk surface at a selected radius in a ring-like manner. A second head cleaning zone is provided near the inner diameter of the disk to provide for increased reproducibility of the PZT calibration response. The second zone is densely textured and serves to clean the glide head prior to its use in the calibration zone.

Glide Testing Of Disks With Calibration Confirmation Testing By Inducing Collision Of The Slider With Production Disk Surface

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US Patent:
7064659, Jun 20, 2006
Filed:
Aug 31, 2004
Appl. No.:
10/931316
Inventors:
Bradley Frederick Baumgartner - Los Banos CA, US
Norman Chu - San Francisco CA, US
Patricia Galindo - Morgan Hill CA, US
Hang Fai Ngo - San Jose CA, US
Yu Lo - Foster City CA, US
Nalin Zhou - San Jose CA, US
Assignee:
Hitachi Global Storage Technologies Netherlands B.V. - Amsterdam
International Classification:
G08B 29/00
US Classification:
340514, 360 25, 360 31, 324212
Abstract:
A method is presented for glide testing a disk which tests the glide head fly-height by inducing a collision between the glide head and a disk under test. The glide test system is initially calibrated using calibration disks. The method of the invention periodically tests the calibration without interrupting the production testing by lowering the rotation rate until the glide head collides with the rotating disk surface. The rotation rate at which the collision occurs is then compared with the value expected based on knowledge of disk samples and the initial calibration. Parameters for acceptable high and low values are established to detect changes in the glide test system performance to trigger automatic or manual recalibration.

System, Method, And Apparatus For Glide Head Calibration With Enhanced Pzt Channel For Very Low Qualification Glide Heights

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US Patent:
7121133, Oct 17, 2006
Filed:
May 28, 2004
Appl. No.:
10/857195
Inventors:
Norman Chu - San Francisco CA, US
Shanlin Duan - Fremont CA, US
Patricia Galindo - Morgan Hill CA, US
Hang Fai Ngo - San Jose CA, US
Yu Lo - Foster City CA, US
Nalin Zhou - San Jose CA, US
Assignee:
Hitachi Global Storage Technologies Netherlands B.V. - Amsterdam
International Classification:
G01B 7/34
US Classification:
73 189
Abstract:
A glide head calibration technique uses two fly height calibrations on a disk media certifier. The first calibration point uses a spin down on bump technique at a first height, and the second calibration point uses a spin down on disk media roughness at a second lower height. With two height data points, a fly height curve of each glide head is approximated very accurately. Once the fly height curve is derived for each head, any fly height can be dialed-in by the disk media certifier for glide testing. This technique achieves glide fly heights between about 4 nm and 8 nm and does so with improved tolerances.
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Yu R Lo from Foster City, CA, age ~53 Get Report