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Yves Parent

from Richmond, CA
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Connected to:
Allyson Parent, 53Andre J Parent, 54Barry J Parent, 51Beth Parent, 50Bryce Parent, 29Chance E Parent, 51Claudine M Parent, 57Cyr J Parent, 97Daniel Parent, 38Dawna G Parent, 55

Yves Parent Phones & Addresses

  • 973 30Th St, Richmond, CA 94804
  • Emeryville, CA
  • 1333 Rhode Island St, San Francisco, CA 94107 (415) 970-9478
  • Portland, OR

Work

Company: Cruise automation Jul 2020 Position: Project manager

Education

School / High School: Polytechnique Montréal 1986 to 2003 Specialities: Computer Engineering

Skills

Semiconductors • Software Development • Perl • Software Engineering • Object Oriented Design • Events Organizer • Sailing Teacher • Cruising Skipper • Sailboat Maintenance • Automation • Engineering Management • Manufacturing • Program Management • Agile Methodologies • Electronics • Project Management • Pcb Design • Eda • Agile Project Management • Product Development • Sdlc • Integration • Visio • Events Organisation • Enterprise Software • Visual Studio • Testing • Sql • Ms Project • Quality Assurance

Languages

English • French

Interests

Extreme Programming • Backpacking • Skiing • Research and Development • Software Development Management • Yoga • Sailing Instructor • Software Engineering Processes • Cycling • Bio Sciences • Meditation • Photography • Music • Navigation • Social Development • Woodworking • Advanced Technologies • Neurology

Industries

Computer Software

Resumes

Resumes

Yves Parent Photo 1

Project Manager

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Location:
San Francisco, CA
Industry:
Computer Software
Work:
Cruise Automation
Project Manager
Apportable
Building Engineeer
Cal Sailing Club
Rear Commodore
Cad Design Software Mar 2005 - May 2011
Ic Testing Products Program Manager
City of Culver City Mar 2003 - Mar 2005
Planning Technician
Education:
Polytechnique Montréal 1986 - 2003
Santa Monica College 2002 - 2003
Skills:
Semiconductors
Software Development
Perl
Software Engineering
Object Oriented Design
Events Organizer
Sailing Teacher
Cruising Skipper
Sailboat Maintenance
Automation
Engineering Management
Manufacturing
Program Management
Agile Methodologies
Electronics
Project Management
Pcb Design
Eda
Agile Project Management
Product Development
Sdlc
Integration
Visio
Events Organisation
Enterprise Software
Visual Studio
Testing
Sql
Ms Project
Quality Assurance
Interests:
Extreme Programming
Backpacking
Skiing
Research and Development
Software Development Management
Yoga
Sailing Instructor
Software Engineering Processes
Cycling
Bio Sciences
Meditation
Photography
Music
Navigation
Social Development
Woodworking
Advanced Technologies
Neurology
Languages:
English
French

Publications

Us Patents

Process And Apparatus For Finding Paths Through A Routing Space

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US Patent:
6678876, Jan 13, 2004
Filed:
Aug 24, 2001
Appl. No.:
09/938789
Inventors:
Mac Stevens - San Jose CA
Yves Parent - San Francisco CA
Assignee:
FormFactor, Inc. - Livermore CA
International Classification:
G06F 1750
US Classification:
716 12, 716 13, 716 14
Abstract:
An initial graph of nodes is created within a routing space, and the number and locations of the nodes in the graph are adjusted. Links are created between nodes of the graph, and traces between specified nodes are created through the linked graph.

Method And System For Designing A Probe Card

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US Patent:
6714828, Mar 30, 2004
Filed:
Sep 17, 2001
Appl. No.:
09/954617
Inventors:
Benjamin N. Eldridge - Danville CA
Mark W. Brandemuehl - Mountain Veiw CA
Stefan Graef - Milpitas CA
Yves Parent - San Francisco CA
Assignee:
FormFactor, Inc. - Livermore CA
International Classification:
G06F 1900
US Classification:
700 97, 700 96, 700117, 705 80, 709203
Abstract:
A method and system for designing a probe card from data provided by prospective customers via the Internet is provided. Design specifications are entered into the system by prospective customers and compiled into a database. The collective feasibility of each set of design specifications is determined by an automated computer system and communicated to the prospective customer. If feasible, additional software enables prospective customers to create verification packages according to their respective design specifications. These verification packages further consist of drawing files visually describing the final design and verification files confirming wafer bonding pad data. Verification packages are reviewed and forwarded to an applications engineer after customer approval. An interactive simulation of probe card performance is also provided. Data on probe card performance is incorporated into an overall modeling exercise, which includes not only the probe card, but data on the device(s) under test and wafer, as well as data on automated test equipment.

Automated System For Designing And Testing A Probe Card

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US Patent:
7092902, Aug 15, 2006
Filed:
Mar 26, 2004
Appl. No.:
10/810758
Inventors:
Benjamin N. Eldridge - Danville CA, US
Mark W. Brandemuehl - Mountain View CA, US
Stefan Graef - Milpitas CA, US
Yves Parent - San Francisco CA, US
Assignee:
FormFactor, Inc. - Livermore CA
International Classification:
G06Q 30/00
US Classification:
705 26, 705 1, 705 50, 705 80, 700 83, 700 96, 700 97, 700117, 700180, 324761
Abstract:
A method and system for designing a probe card from data provided by prospective customers via the Internet is provided. Design specifications are entered into the system by prospective customers and compiled into a database. The collective feasibility of each set of design specifications is determined by an automated computer system and communicated to the prospective customer. If feasible, additional software enables prospective customers to create verification packages according to their respective design specifications. These verification packages further consist of drawing files visually describing the final design and verification files confirming wafer bonding pad data. Verification packages are reviewed and forwarded to an applications engineer after customer approval. An interactive simulation of probe card performance is also provided. Data on probe card performance is incorporated into an overall modeling exercise, which includes not only the probe card, but data on the device(s) under test and wafer, as well as data on automated test equipment.

Method And System For Designing A Probe Card

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US Patent:
7593872, Sep 22, 2009
Filed:
Aug 15, 2006
Appl. No.:
11/464760
Inventors:
Benjamin N. Eldridge - Danville CA, US
Mark W. Brandemuehl - Mountain View CA, US
Stefan Graef - Milpitas CA, US
Yves Parent - San Francisco CA, US
Assignee:
FormFactor, Inc. - Livermore CA
International Classification:
G06Q 30/00
US Classification:
705 26, 700 96, 700 97, 700117, 700180, 324761, 709203
Abstract:
A method and system for designing a probe card from data provided by prospective customers via the Internet is provided. Design specifications are entered into the system by prospective customers and compiled into a database. The collective feasibility of each set of design specifications is determined by an automated computer system and communicated to the prospective customer. If feasible, additional software enables prospective customers to create verification packages according to their respective design specifications. These verification packages further consist of drawing files visually describing the final design and verification files confirming wafer bonding pad data. Verification packages are reviewed and forwarded to an applications engineer after customer approval. An interactive simulation of probe card performance is also provided. Data on probe card performance is incorporated into an overall modeling exercise, which includes not only the probe card, but data on the device(s) under test and wafer, as well as data on automated test equipment.

Process And Apparatus For Finding Paths Through A Routing Space

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US Patent:
7814453, Oct 12, 2010
Filed:
Oct 23, 2003
Appl. No.:
10/693484
Inventors:
Mac Stevens - San Jose CA, US
Yves Parent - San Francisco CA, US
Assignee:
FormFactor, Inc. - Livermore CA
International Classification:
G06F 17/50
US Classification:
716 12, 716 13, 716 14, 716 15, 703 13, 717128
Abstract:
An initial graph of nodes is created within a routing space, and the number and locations of the nodes in the graph are adjusted. Links are created between nodes of the graph, and traces between specified nodes are created through the linked graph.

Method And System For Designing A Probe Card

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US Patent:
7930219, Apr 19, 2011
Filed:
Sep 22, 2009
Appl. No.:
12/564799
Inventors:
Benjamin N. Eldridge - Danville CA, US
Mark W. Brandemuehl - Mountain View CA, US
Stefan Graef - Milpitas CA, US
Yves Parent - San Francisco CA, US
Assignee:
FormFactor, Inc. - Livermore CA
International Classification:
G06Q 30/00
US Classification:
705 26, 700 96, 700 97, 700117, 700180, 324761, 709203
Abstract:
A method and system for designing a probe card from data provided by prospective customers via the Internet is provided. Design specifications are entered into the system by prospective customers and compiled into a database. The collective feasibility of each set of design specifications is determined by an automated computer system and communicated to the prospective customer. If feasible, additional software enables prospective customers to create verification packages according to their respective design specifications. These verification packages further consist of drawing files visually describing the final design and verification files confirming wafer bonding pad data. Verification packages are reviewed and forwarded to an applications engineer after customer approval. An interactive simulation of probe card performance is also provided. Data on probe card performance is incorporated into an overall modeling exercise, which includes not only the probe card, but data on the device(s) under test and wafer, as well as data on automated test equipment.

Isbn (Books And Publications)

Aquarelles D'ouest

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Author

Yves Parent

ISBN #

2726201245

Les B.C.D.: Pour Quelle ecole? Pour Quelle Lecture

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Author

Yves Parent

ISBN #

2905377003

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Yves Parent from Richmond, CA Get Report