US Patent:
20030231318, Dec 18, 2003
Inventors:
Kevin Sartain - Broken Arrow OK, US
Kevin Dewitt - Appleton WI, US
Wael Elgamal - Tulsa OK, US
Richard Urquhart - Broken Arrow OK, US
Assignee:
Kimberly-Clark Worldwide, Inc.
International Classification:
G01B011/02
Abstract:
A measurement system for measuring a parameter of a log is provided. A measuring device produces an emission in a direction of the log. A portion of the emission measures the parameter, such as log diameter, and communicates the diameter to the measuring device, which in turn communicates the diameter to a controller to selectively adjust converting equipment to vary the diameter.