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Thomas B Lucatorto

from Washington, DC
Age ~87
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Also known as:
Thoma B Lucatorto, Tom B Lucatorto
Phone and address:
4015 52Nd St, Washington, DC 20016
(202) 244-3948
Related to:
Carol Kimball, 86Barbara J Kimball, 51Renee T Johnson, 69Tom Gambaro
Connected to:
Lisa Lucatorto, 66Joseph L Lucatra, 53Pasquale A Lucatuorto, 73Amber M Lucca, 28Carmen D Lucca, 80Erica Lucca, 47Joseph A Lucca, 48Raquel LuccaDomenick Luccarelli, 107Richard Luccetti, 82

Thomas Lucatorto Phones & Addresses

  • 4015 52Nd St, Wash, DC 20016 (202) 244-3948
  • 922 24Th St, Washington, DC 20037

Work

Company: National institute of standards and technology 1986 Position: Group leader

Education

School / High School: Columbia University In the City of New York

Industries

Research

Resumes

Resumes

Thomas Lucatorto Photo 1

Physicist

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Location:
Washington, DC
Industry:
Research
Work:
National Institute of Standards and Technology
Group Leader
National Institute of Standards and Technology
Physicist
Education:
Columbia University In the City of New York

Publications

Us Patents

Isotope Analysis Device And Method

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US Patent:
47711710, Sep 13, 1988
Filed:
Sep 27, 1985
Appl. No.:
6/780820
Inventors:
James J. Snyder - Clarksburg MD
Thomas B. Lucatorto - Washington DC
Philip H. Debenham - Derwood MD
Assignee:
Atom Sciences Corporation - Oakridge TN
International Classification:
H01J 4926
H05H 1302
B01D 5944
US Classification:
250281
Abstract:
Isotope analysis device comprising a racetrack-shaped ion storage ring, a resonant charge exchange device and a laser photoionization device. Isotope ions to be analyzed are continuously injected into the racetrack in a first orbit and pass through the resonant charge exchange device where they are neutralized and decelerated to produce decelerated isotope particles. Selected isotope particles are then re-ionized by the laser photoionization device, and the resulting selected isotope ions travel around the racetrack in a smaller orbit, while the undesired non-ionized particles exit the storage ring and are separately collected. After several succesively decreasing ion orbits, each isotope of the desired species reaches a detector where it is measured. The device is particularly useful for isotope analysis of strontium and of krypton.

Ultrasensitive Method For Measuring Isotope Abundance Ratios

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US Patent:
47345799, Mar 29, 1988
Filed:
Jul 7, 1986
Appl. No.:
6/882508
Inventors:
Thomas B. Lucatorto - Washington DC
Charles W. Clark - Montgomery County MD
Tom J. Whitaker - Benton County WA
Assignee:
Atom Sciences, Inc. - Oak Ridge TN
International Classification:
B01D 5944
US Classification:
250282
Abstract:
An ultrasensitive mass spectrometry method based on multiphoton sub-Doppler resonance ionization to measure abundance sensitivities. The method preferentially ionizes a selected isotope in a sample by using Doppler-free resonant multiphoton ionization to produce an enhanced ratio of selected isotopes. Background species are separately ionized and rejected. As necessary or desired, selected isotope ions are preferentially ionized by using a second Doppler-free resonant multiphoton ionization to provide an additional isotope enhancement. The ions produced are injected into a mass spectrometer. Isotopic spectrum analysis of the ions is performed by the spectrometer and the ions are then detected by a detector such as a particular photon multiplier capable of observing a single ion. In one embodiment, at least one of the steps of preferentially ionizing the selected isotope is accomplished by two counter propagating laser beams of slightly different frequencies. Further improved sensitivity is achieved by: (1) using a frequency offset of the laser frequency in an amount proportional to the laser intensity to overcome AC Stark shifts, and (2) withdrawing ions for mass separation from only the central portion of the laser interaction volume.

Laser Utilizing Coated, Multicapillary Array As Output Window

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US Patent:
43909949, Jun 28, 1983
Filed:
Jul 14, 1980
Appl. No.:
6/168698
Inventors:
James R. Roberts - Boyds MD
Thomas J. McIlrath - College Park MD
Thomas B. Lucatorto - Washington DC
International Classification:
H01S 308
US Classification:
372 99
Abstract:
Laser utilizing multicapillary array output window.

Ultrasensitive Method For Measuring Isotope Abundance Ratios

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US Patent:
46348646, Jan 6, 1987
Filed:
Oct 27, 1983
Appl. No.:
6/546052
Inventors:
Thomas B. Lucatorto - Washington DC
Charles W. Clark - Gaithersburg MD
Tom J. Whitaker - Kennewick WA
Assignee:
Atom Sciences, Inc. - Oak Ridge TN
International Classification:
B01D 5944
US Classification:
250282
Abstract:
An ultrasensitive mass spectrometry method based on multiphoton sub-Doppler resonance ionization is used to measure abundance sensitivities. The method preferentially ionizes a selected isotope in a sample by using Doppler-free resonant multiphoton ionization to produce an enhanced ratio of selected isotopes. As necessary or desired, selected isotope ions are preferentially ionized by using a second Doppler-free resonant multiphoton ionization to provide an additional isotope enhancement. The ions produced are injected into a mass spectrometer (24). Isotopic spectrum analysis of the ions is performed by the spectrometer (24) and the ions are then detected by a detector (26) such as a particular photon multiplier capable of observing a single ion. In one embodiment, at least one of the steps of preferentially ionizing the selected isotope is accomplished by two counter propagating laser beams of slightly different frequencies.

Method And Apparatus For X-Ray And Extreme Ultraviolet Inspection Of Lithography Masks And Other Objects

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US Patent:
60027401, Dec 14, 1999
Filed:
Oct 2, 1997
Appl. No.:
8/942757
Inventors:
Franco Cerrina - Madison WI
Thomas B. Lucatorto - Washington DC
Assignee:
Wisconsin Alumni Research Foundation - Madison WI
International Classification:
G01B 1506
US Classification:
378 43
Abstract:
Inspection of objects such as X-ray lithography masks is carried out by passing X-rays or extreme ultraviolet light through an object which absorbs in a pattern to provide a patterned X-ray or ultraviolet image which is then directed to a converter. The converter converts the image incident upon it to an image formed by electrons emitted from the converter. The emitted electrons are magnified in an electron microscope and the magnified electron image is displayed by the electron microscope. The visible image may be further digitized and processed by a computer, including long-term storage or display on a computer monitor. X-ray lithography masks may be inspected by passing X-rays through masks of the same type that will be used for lithography so that the magnified image of the X-rays passed through the masks corresponds to the pattern of X-rays that will be incident on a photoresist, allowing accurate inspection of X-ray masks before use.

Optical Devices Utilizing Multicapillary Arrays

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US Patent:
43957757, Jul 26, 1983
Filed:
Jul 14, 1980
Appl. No.:
6/168700
Inventors:
James R. Roberts - Boyds MD
Thomas J. McIlrath - College Park MD
Thomas B. Lucatorto - Washington DC
International Classification:
A61N 510
G02B 500
G02B 2714
US Classification:
378145
Abstract:
Optical devices utilizing multicapillary arrays such as beam splitters, calibrated beam attenuators, collimators, beam steering devices, beam modulators and phase shifters and lens.

Isbn (Books And Publications)

Laser Ablation and Desorption

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Author

Thomas Lucatorto

ISBN #

0124759750

Vacuum Ultraviolet Spectroscopy I

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Author

Thomas Lucatorto

ISBN #

0124759785

Vacuum Ultraviolet Spectroscopy II

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Author

Thomas Lucatorto

ISBN #

0124759793

Cumulative Author Index and Tables of Contents: Volumes 1-32

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Author

Thomas Lucatorto

ISBN #

0124759807

Methods of the Physics of Porous Media

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Author

Thomas Lucatorto

ISBN #

0124759823

Advances in Surface Science

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Author

Thomas Lucatorto

ISBN #

0124759858

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Thomas B Lucatorto from Washington, DC, age ~87 Get Report