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Tahani R Amer

from Alexandria, VA
Age ~59
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Also known as:
Gahani R Amer, Tahany R Amer
Related to:
Moushia A AmerMoushira M Amer, 59Mourad E Amer, 70Yasmeen Amer, 29Nader M Amer, 37Ahmad E Amer, 84Layla Amer, 38Jeannette S Amer, 82Tahany R Amer, 59Ahmed M Abbas, 48
Connected to:
Abdel K Amer, 74Abeer G Amer, 40Addison L Amer, 38Ahmed A Amer, 78Alexander V Amer, 39Amal Amer, 50Amani A Amer, 60Ayman A Amer, 56Aziz Amer, 56Beverly E Amer, 67

Tahani Amer Phones & Addresses

  • Alexandria, VA
  • Washington, DC
  • Newport News, VA
  • 103 Kiskiac Turn, Yorktown, VA 23693 (757) 865-0136
  • Vienna, VA
  • Hampton, VA
  • 103 Kiskiac Turn, Yorktown, VA 23693

Resumes

Resumes

Tahani Amer Photo 1

Program Executive

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Location:
7785 Belvale Dr, Alexandria, VA
Industry:
Aviation & Aerospace
Work:
Nasa
Program Executive
Nasa Space Technology Mission Directorate
Senior Technologist - Nasa
Education:
Harvard Kennedy School 2013 - 2013
Old Dominion University 2007 - 2011
Villanova University 2005 - 2007
Masters Old Dominion University 1992 - 1994
Masters, Aerospace Engineering Old Dominion University 1989 - 1992
Bachelors, Design, Mechanical Engineering
Skills:
Engineering
Systems Engineering
Program Management
Process Improvement
Space Systems
Aerospace
Project Management
Proposal Writing
Government Contracting
Earned Value Management
Aircraft
Dod
Flights
Configuration Management
Systems Analysis
Aerospace Engineering
Engineering Management
Interests:
Outreach For Stem
Science Policy
Project Management
Women of Nasa and Women@Nasa
Team Development
Tahani Amer Photo 2

Tahani Amer

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Publications

Wikipedia References

Tahani Amer Photo 3

Tahani Amer

Us Patents

Device And Method For Measuring Thermal Conductivity Of Thin Films

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US Patent:
63310759, Dec 18, 2001
Filed:
Apr 30, 1999
Appl. No.:
9/303725
Inventors:
Tahani R. Amer - Yorktown VA
Chelakara Subramanian - North East Palm Bay FL
Billy T. Upchurch - Virginia Beach VA
David W. Alderfer - Newport News VA
Bradley S. Sealey - Newport News VA
Cecil G. Burkett - Newport News VA
Assignee:
Administrator, National Aeronautics and Space Administration - Washington DC
International Classification:
G01N 2518
US Classification:
374 44
Abstract:
A device and method are provided for measuring the thermal conductivity of rigid or flexible, homogeneous or heterogeneous, thin films between 50. mu. m and 150. mu. m thick with relative standard deviations of less than five percent. The specimen is sandwiched between like material, highly conductive upper and lower slabs. Each slab is instrumented with six thermocouples embedded within the slab and flush with their corresponding surfaces. A heat source heats the lower slab and a heat sink cools the upper slab. The heat sink also provides sufficient contact pressure onto the specimen. Testing is performed within a vacuum environment (bell-jar) between 10. sup. -3 to 10. sup. -6 Torr. An anti-radiant shield on the interior surface of the bell-jar is used to avoid radiation heat losses. Insulation is placed adjacent to the heat source and adjacent to the heat sink to prevent conduction losses.
Control profile
Tahani R Amer from Alexandria, VA, age ~59 Get Report