US Patent:
20020169379, Nov 14, 2002
Inventors:
Nancy Camacho - Edison NJ, US
Mathias Bostrom - Scarsdale NY, US
Steve Bertha - New York NY, US
Assignee:
HOSPITAL FOR SPECIAL SURGERY - New York NY
International Classification:
A61B005/00
A61B017/22
US Classification:
600/473000, 604/022000, 356/432000, 356/300000
Abstract:
A method of evaluating the surface of a material that has a distinguishable infrared spectrum comprising (a) positioning an infrared fiber optic probe to be in contact with a surface of the sample or material at a region of interest for detecting attenuated total reflectance or within a sufficient distance from the surface of the region for detecting reflection, (b) detecting mid- or near-infrared radiation attenuated total reflectance or reflection off of the surface of the sample or the material, (c) analyzing the infrared radiation from step (b) for at least one of peak height, peak area, frequency and chemometric parameters, and (d) actuating the removal device when a signal from the infrared fiber optic probe is between pre-selected values for at least one of peak height, peak area, frequency and chemometric parameters for the sample of the material.
