Search

Seongsik Chang

from Santa Clara, CA
Age ~57
Get Report
Also known as:
Chang Seongsik
Phone and address:
4064 Crandall Cir, Santa Clara, CA 95054
(408) 855-8507
Related to:
Stephanie Ks Chang, 67Eugene C Lee, 39Nora M Tsui, 63
Connected to:
Aeron Chang, 45Alma L Chang, 58Andrew H Chang, 52Anna Chang, 64Ariene J Chang, 47Arleta Chang, 60Barbie S Chang, 39Belinda Chang, 49Benny C Chang, 76Bing T Chang, 74

Seongsik Chang Phones & Addresses

  • 4064 Crandall Cir, Santa Clara, CA 95054 (408) 855-8507
  • 20 Descanso Dr, San Jose, CA 95134 (408) 434-0780
  • 7997 Lake Dr, Dublin, CA 94568 (925) 875-0274
  • 4856 Bernal Ave, Pleasanton, CA 94566 (925) 600-8820
  • Evanston, IL
  • New Haven, CT
  • Chicago, IL

Work

Company: Hp Sep 2003 Position: Senior research scientist

Education

School / High School: Yale University 1990 to 1998

Skills

Testing • Electronics • Semiconductors • Thin Films • R&D • Integration • Simulations • C++ • Ic • Research and Development

Industries

Computer Hardware

Resumes

Resumes

Seongsik Chang Photo 1

Master Technologist

View page
Location:
2351 Hp Way northeast, Rio Rancho, NM
Industry:
Computer Hardware
Work:
HP since Sep 2003
Senior Research Scientist
Education:
Yale University 1990 - 1998
Seoul National University 1986 - 1990
Skills:
Testing
Electronics
Semiconductors
Thin Films
R&D
Integration
Simulations
C++
Ic
Research and Development

Publications

Us Patents

Apparatus And Method For Reducing Contamination Of An Image Transfer Device

View page
US Patent:
7174114, Feb 6, 2007
Filed:
Jul 29, 2004
Appl. No.:
10/902723
Inventors:
Omer Gila - Cupertino CA, US
Michael H. Lee - San Jose CA, US
Seongsik Chang - San Jose CA, US
Assignee:
Hewlett-Packard Development Company, LP. - Houston TX
International Classification:
G03G 15/02
G03G 21/00
G03G 21/20
US Classification:
399100, 399 92, 399 93, 399 98, 399 99, 399170, 399171
Abstract:
An apparatus and method for reducing contamination of an image transfer surface in an image transfer device includes a charging device for charging the image transfer surface. An airflow control system ventilates the charging device and restricts airflow adjacent the image transfer surface.

Curved Grating Spectrometer With Very High Wavelength Resolution

View page
US Patent:
7283233, Oct 16, 2007
Filed:
Mar 20, 2004
Appl. No.:
10/708730
Inventors:
Seng-Tiong Ho - Wheeling IL, US
Seongsik Chang - Dublin CA, US
International Classification:
G01J 3/28
US Classification:
356328, 356334
Abstract:
The present invention discloses a system comprising a compact curved grating (CCG) and its associated compact curved grating spectrometer (CCGS) module and a method for making the same. The system is capable of achieving very small (resolution vs. size) RS factor. In the invention, the location of entrance slit and detector can be adjusted in order to have the best performance for a particular design goal. The initial groove spacing is calculated using a prescribed formula dependent on operation wavelength. The location of the grooves is calculated based on two conditions: the first one being that the path-difference between adjacent grooves should be an integral multiple of the wavelength in the medium and the second one being specific for a particular design goal of a curved-grating spectrometer. In an embodiment, elliptical mirrors each with focal points at the slit and detector are used for each groove to obtain aberration-free curved mirrors.

Imaging Methods, Image Engines, And Photoconductor Charging Systems

View page
US Patent:
7298993, Nov 20, 2007
Filed:
Jan 5, 2005
Appl. No.:
11/030475
Inventors:
Michael H. Lee - San Jose CA, US
Boaz Tagansky - Rishon-Lezion, IL
Omer Gila - Cupertino CA, US
William D. Holland - Palo Alto CA, US
Seongsik Chang - San Jose CA, US
Assignee:
Hewlett-Packard Development Company, L.P. - Houston TX
International Classification:
G03G 15/02
US Classification:
399176, 399168, 399174
Abstract:
Imaging methods, image engines, and photoconductor charging systems are described. According to one embodiment, an imaging method includes providing a charge device configured to provide an electrical charge to a surface of an imaging member which is usable for imaging, moving a surface of the charge device adjacent to the imaging member and a bias member, during the moving, first charging a discharged portion of the surface of the charge device using the bias member providing a charged portion of the surface of the charge device, during the moving, second charging a portion of the surface of the imaging member using the charged portion of the charge device, the second charging providing the discharged portion of the surface of the charge device, and repeating the first charging and the second charging during the moving.

Apparatus For Charging An Image Transfer Surface

View page
US Patent:
7609999, Oct 27, 2009
Filed:
Dec 1, 2005
Appl. No.:
11/291379
Inventors:
Omer Gila - Cupertino CA, US
Michael H. Lee - San Jose CA, US
Seongsik Chang - Santa Clara CA, US
Assignee:
Hewlett-Packard Development Company, L.P. - Houston TX
International Classification:
G03G 15/02
US Classification:
399176, 492 53, 492 54, 492 56
Abstract:
An apparatus for charging an image transfer surface in an image transfer device includes a support member and a conductive polymer material surrounding an outer periphery of the support member. An inner portion of the conductive polymer material is loaded with a supplemental conducting agent, and an outer portion of the conductive polymer material is substantially free of the supplemental conducting agent.

Curved Grating Spectrometer With Very High Wavelength Resolution

View page
US Patent:
7623235, Nov 24, 2009
Filed:
Oct 15, 2007
Appl. No.:
11/872455
Inventors:
Seng-Tiong Ho - Wheeling IL, US
Seongsik Chang - Santa Clara CA, US
Yingyan Huang - Evanston IL, US
International Classification:
G01J 3/28
US Classification:
356328, 356334, 359570
Abstract:
The present application discloses a system comprising a compact curved grating (CCG) and its associated compact curved grating spectrometer (CCGS) or compact curved grating wavelength multiplexer/demultiplexer (WMDM) module and a method for making the same. The system is capable of achieving a very small (resolution vs. size) RS factor. In the invention, the location of the entrance slit and detector can be adjusted in order to have the best performance for a particular design goal. The initial groove spacing is calculated using a prescribed formula dependent on operation wavelength. The location of the grooves is calculated based on two conditions. The first one being that the path-difference between adjacent grooves should be an integral multiple of the wavelength in the medium to achieve aberration-free grating focusing at the detector or output slit (or output waveguide) even with large beam diffraction angle from the entrance slit or input slit (or input waveguide). The second one being specific for a particular design goal of a curved-grating spectrometer. In an embodiment, elliptical mirrors each with focal points at the slit and detector are used for each groove to obtain aberration-free curved mirrors.

Apparatus And Method For Charging An Imaging Member

View page
US Patent:
7756430, Jul 13, 2010
Filed:
Apr 27, 2006
Appl. No.:
11/413852
Inventors:
Seongsik Chang - Palo Alto CA, US
Omer Gils - Palo Alto CA, US
William D. Holland - Palo Alto CA, US
Michael H. Lee - Palo Alto CA, US
Boaz Tagansky - Palo Alto CA, US
Gadi Oron - Palo Alto CA, US
Assignee:
Hewlett-Packard Development Company, L.P. - Houston TX
International Classification:
G03G 15/02
US Classification:
399 50, 399159, 399168, 399169, 399176
Abstract:
A method of charging an imaging member having an outer surface with an imaging region and a seam region. A charge device is provided adjacent the imaging member. An electrical charge is provided to the imaging region of the imaging member using a voltage on the charge device. An other electrical charge is provided to the seam region of the imaging member using an other voltage on the charge device.

Printers And Methods To Reduce Vapor Emissions In Printers

View page
US Patent:
7850274, Dec 14, 2010
Filed:
Apr 30, 2010
Appl. No.:
12/771822
Inventors:
Seongsik Chang - Santa Clara CA, US
Omer Gila - Cupertino CA, US
Michael H. Lee - San Jose CA, US
Paul F. Matheson - San Bruno CA, US
Assignee:
Hewlett-Packard Development Company, L.P. - Houston TX
International Classification:
B41J 29/377
US Classification:
347 18, 347223
Abstract:
Printers and methods to reduce vapor emissions in printers are disclosed. An example printer is described, including a fan to urge an airflow from a first printer portion, a duct to direct the airflow from the first printer portion and to substantially prevent adding air to the airflow, a condenser in communication with the duct, the condenser comprising a first condensing fin to condense oil in the airflow into a liquid, and an airflow reflection reducer associated with the condenser to reduce reflection of the airflow off of the first condenser fin.

Hard Imaging Devices, Humidity Control Systems And Hard Imaging Methods

View page
US Patent:
8326173, Dec 4, 2012
Filed:
Sep 18, 2009
Appl. No.:
12/562467
Inventors:
Seongsik Chang - Santa Clara CA, US
Viet Hung Phan - Milpitas CA, US
Michael H. Lee - San Jose CA, US
Omer Gila - Cupertino CA, US
Assignee:
Hewlett-Packard Development Company, L.P. - Houston TX
International Classification:
G03G 21/00
US Classification:
399 97, 399 98
Abstract:
Hard imaging devices, humidity control systems and hard imaging methods are described. According to one arrangement, a hard imaging device includes an imaging member comprising a surface and a writing assembly configured to form latent images upon the surface of the imaging member. The hard imaging device also includes a development assembly configured to provide a marking agent to the surface of the imaging member to develop the latent images to form developed images, a transfer assembly configured to transfer the developed images from the surface of the imaging member to media to form a plurality of hard images, and a humidity control system configured to control humidity within a region of the hard imaging device which is adjacent to the surface of the imaging member during the forming and the development of the latent images. Other structure and methods are described.
Control profile
Seongsik Chang from Santa Clara, CA, age ~57 Get Report