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Sam Bagwell Phones & Addresses

  • 3152 Eastern Ave, Las Vegas, NV 89109 (702) 735-4062
  • Glendale, CA

Publications

Us Patents

Programmable Global Shutter Timing To Mitigate Transient Glitching

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US Patent:
20140061435, Mar 6, 2014
Filed:
Jul 24, 2013
Appl. No.:
13/950080
Inventors:
David Estrada - Pasadena CA, US
Sam Bagwell - Pasadena CA, US
Loc Truong - Pasadena CA, US
Assignee:
FORZA SILICON CORPORATION - Pasadena CA
International Classification:
H04N 5/376
H03K 5/14
US Classification:
2502081, 327261, 327276
Abstract:
An image sensor system using a circuit that automatically provides a multiple point output which represents, in a first mode, each of the multiple points receiving outputs at substantially the same time delayed only by a transit time across a wire connecting the multiple point outputs, and in a second mode, each of the multiple points producing outputs that are delayed by a delay time, where each output is delayed relative to each other output by said delay time in the second mode.

Method For Reading Out Multiple Sram Blocks With Different Column Sizing In Stitched Cmos Image Senor

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US Patent:
20130334401, Dec 19, 2013
Filed:
May 24, 2013
Appl. No.:
13/902009
Inventors:
Steven Huang - Pasadena CA, US
Christophe Ca Basset - Pasadena CA, US
Sam Bagwell - Pasadena CA, US
Jonathan Bergey - Pasadena CA, US
Loc Truong - Pasadena CA, US
Assignee:
FORZA SILICON CORPORATION - Pasadena CA
International Classification:
H01L 27/146
US Classification:
2502081
Abstract:
A stitched image sensor array on a semiconductor substrate with identical blocks that have wherein said first configuration includes enable inputs, which vary a function of the block depending on the connection to the enable inputs. The enable inputs can set an SRAM to receive different numbers of inputs.

In-Pixel Correlated Double Sampling With Fold-Over Detection

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US Patent:
20160100114, Apr 7, 2016
Filed:
Oct 5, 2015
Appl. No.:
14/875595
Inventors:
- Pasadena CA, US
Sam Bagwell - Glendale CA, US
International Classification:
H04N 5/378
H04N 5/369
H04N 5/3745
Abstract:
Disclosed herein are improved in-pixel correlated double sampling elements for photodetectors. The novel circuits and associated methods of the invention allow for accurate correlated double sampling while avoiding the inherent sampling errors that may occur in prior art in-pixel correlated double sampling techniques when bright or saturating signals are received.
Sam Edward Bagwell from Las Vegas, NVDeceased Get Report