Inventors:
Rouben Toumani - Morgan Hill CA
Paul Bauer - Morgan Hill CA
Brad T. Darnell - San Jose CA
Marco Ruiz - Los Altos CA
Assignee:
Wiltron Company - Morgan Hill CA
International Classification:
H04M 124
Abstract:
A metallic access test extension system architecture for a digital transmission system is provided. The digital transmission system includes a local end and a plurality of remote ends, each of said plurality of remote ends including a digital communication path and a metallic test pair connection. The local end includes a corresponding digital communication path and corresponding metallic pair connection. The architecture includes a remote unit coupled to each metallic test pair and digital communication path at each of said plurality of remote ends. The remote unit includes a metallic access test extension module. The architecture further includes a central office unit at the local end of the digital communication path, the local end unit including a metallic test extension module and a switch system, responsive to a control signal, for selectively connecting the digital communication paths and metallic test pairs at the local and to the metallic test extension module in the local end unit. In a second embodiment, the test system includes a POTS test system, a special services test system, a metallic test extension local end unit module and a metallic test extension remote unit module. Each remote unit is coupled to a metallic bypass pair line at the remote and to which the digital transmission system may connect any of a plurality of metallic pairs connecting to customers.