Inventors:
Qin Xin - Mountain View CA, US
Oleg Kiselev - Palo Alto CA, US
Assignee:
Symantec Operating Corporation - Mountain View CA
International Classification:
G06F 17/30
Abstract:
A method for rating reliability of storage devices is disclosed. A reliability rating for a group of storage devices is assigned to a first rating. The first rating indicates an expected reliability that is the same for each individual one of the storage devices in the group. The expected reliability provides an indication of how reliable the storage devices in the group are expected to be. Information indicating one or more operational characteristics for one or more of the storage devices in the group may be periodically received and analyzed to determine whether the reliability rating for the group of storage devices should be changed. If so then the reliability rating for the group is changed to a different rating, e. g. , to indicate either a decrease or an increase in the expected reliability of the storage devices in the group.
