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Phil Ray Paone

from Bettendorf, IA
Age ~80
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Also known as:
Phil R Paone, Phil Dr Paone, Phil Christopher Paone, Phil C Paone, Phil F Paone, Drphil Paone, Paone F Phil
Phone and address:
4522 Stone Haven Ct, Panarama Park, IA 52722
(563) 332-6569
Related to:
Gaetano PaoneP Christopher Paone, 49Chris Paone, 49Rose Ann PaoneJohn E Ball, 87Karen E Ball, 47Joanne C Ball, 84Rose A Paone, 79Julia M Rivers, 51Richard James Rivers, 55
Connected to:
Andrew J Paone, 58Antonietta Paone, 63Cacy A Paone, 49Daniela K Paone, 46Diana L Paone, 53Dominic L Paone, 76Douglas B Paone, 74Massimo Paone, 46Steven J Paone, 72Tom J Paone, 51

Phil Paone Phones & Addresses

  • 4522 Stone Haven Ct, Bettendorf, IA 52722 (563) 332-6569
  • Meadowlakes, TX
  • Inver Grove Heights, MN
  • Rochester, MN
  • Colorado Spgs, CO
  • Inver Grove, MN
  • 836 41St St NW #B305, Rochester, MN 55901

Work

Position: Sales Occupations

Education

Degree: Graduate or professional degree

Professional Records

License Records

Phil Ray Paone

Address:
Rochester, MN 55902
License #:
5679 - Expired
Category:
Chiropractic
Issued Date:
Jun 1, 2012
Renew Date:
Jan 1, 2013
Expiration Date:
Dec 31, 2013
Type:
Doctor of Chiropractic

Doctor Of Chiropractic

Address:
3315 W Carefree Cir, Colorado Springs, CO 80917
License #:
1173 - Expired
Issued Date:
Jan 23, 1976
Renew Date:
Sep 30, 1977
Expiration Date:
Sep 30, 1977
Type:
Chiropractic

Phil Ray Paone

Address:
3315 W Carefree Cir, Colorado Springs, CO 80917
License #:
2767133 - Expired
Issued Date:
Jan 23, 1976
Renew Date:
Sep 30, 1977
Expiration Date:
Sep 30, 1977
Type:
Electrotherapy Chiropractic

Phil R Paone

Address:
4522 Stone Hvn Dr, Bettendorf, IA
License #:
4346 - Expired
Category:
Health Care
Issued Date:
Jun 9, 1983
Effective Date:
Jan 1, 1901
Expiration Date:
Feb 28, 1998
Type:
Chiropractic Physician

Business Records

Name / Title
Company / Classification
Phones & Addresses
Phil R. Paone
Principal
Spinal Rehabilitation & Posture Correction of Iowa, Inc
Chiropractor's Office
4522 Stone Hvn Dr, Panarama Park, IA 52722

Publications

Us Patents

Efuse Sense Circuit

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US Patent:
7224633, May 29, 2007
Filed:
Dec 8, 2005
Appl. No.:
11/297311
Inventors:
William Paul Hovis - Rochester MN, US
Alan James Leslie - Wappingers Falls NY, US
Phil Paone - Rochester MN, US
David W. Siljenberg - Byron MN, US
Salvatore Nicholas Storino - Rochester MN, US
Gregory John Uhlmann - Rochester MN, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G11C 17/18
US Classification:
3652257, 365207
Abstract:
An eFuse reference cell on a chip provides a reference voltage that is greater than a maximum voltage produced by an eFuse cell having an unblown eFuse on the chip but less than a minimum voltage produced by an eFuse cell having a blown eFuse on the chip. A reference current flows through a resistor and an unblown eFuse in the eFuse reference cell, producing the reference voltage. The reference voltage is used to create a mirrored copy of the reference current in the eFuse cell. The mirrored copy of the reference current flows through an eFuse in the eFuse cell. A comparator receives the reference voltage and the voltage produced by the eFuse cell. The comparator produces an output logic level responsive to the voltage produced by the eFuse cell compared to the reference voltage.

Changing Chip Function Based On Fuse States

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US Patent:
7336095, Feb 26, 2008
Filed:
Jun 8, 2007
Appl. No.:
11/760575
Inventors:
Karl R. Erickson - Rochester MN, US
John A. Fifield - Underhill VT, US
Chandrasekharan Kothandaraman - Hopewell Junction NY, US
Phil C. Paone - Rochester MN, US
William R. Tonti - Essex Junction VT, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
H03K 19/00
US Classification:
326 8, 326 37
Abstract:
Techniques and systems whereby operation of and/or access to particular features of an electronic device may be controlled after the device has left the control of the manufacturer are provided. The operation and/or access may be provided based on values stored in non-volatile storage elements, such as electrically programmable fuses (eFUSES).

Using Electrically Programmable Fuses To Hide Architecture, Prevent Reverse Engineering, And Make A Device Inoperable

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US Patent:
7442583, Oct 28, 2008
Filed:
Dec 17, 2004
Appl. No.:
11/016219
Inventors:
Anthony R. Bonaccio - Shelburne VT, US
Karl R. Erickson - Rochester MN, US
John A. Fifield - Underhill VT, US
Chandrasekharan Kothandaraman - Hopewell Junction NY, US
Phil C. Paone - Rochester MN, US
William R. Tonti - Essex Junction VT, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
H01L 21/82
US Classification:
438130, 438132, 257209, 326 8
Abstract:
Techniques and systems whereby operation of and/or access to particular features of an electronic device may be controlled after the device has left the control of the manufacturer are provided. The operation and/or access may be provided based on values stored in non-volatile storage elements, such as electrically programmable fused (eFUSES).

Aligning Stacked Chips Using Resistance Assistance

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US Patent:
7514276, Apr 7, 2009
Filed:
Aug 12, 2008
Appl. No.:
12/190395
Inventors:
Corey Elizabeth Yearous - Rochester MN, US
Phil Christopher Paone - Rochester MN, US
Kelly Lynn Williams - Rochester MN, US
David Paul Paulsen - Rochester MN, US
Gregory John Uhlmann - Rochester MN, US
Karl Robert Ericson - Rochester MN, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
H01L 21/20
US Classification:
438 15, 438 14, 438 17, 438 18, 438108, 438126, 257E21511, 257E21606, 257E21705, 257E23004, 257E23019
Abstract:
The present invention relates to a method of aligning stacked chips wherein the apparatus and method utilize bumps in the form of exposed metal lines on a first chip. The present invention further relates to taking a resistance measurement to determine a quality of alignment wherein the resistance measurement indicates a direction in which the first chip and the second chip are misaligned.

Electrically Programmable Fuse Sense Circuit

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US Patent:
7528646, May 5, 2009
Filed:
Oct 19, 2006
Appl. No.:
11/550960
Inventors:
Anthony Gus Aipperspach - Rochester MN, US
David Howard Allen - Rochester MN, US
Phil Paone - Rochester MN, US
David Edward Schmitt - Rochester MN, US
Gregory John Uhlmann - Rochester MN, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
H01H 37/76
H01H 85/00
US Classification:
327525
Abstract:
A electrically programmable fuse sense circuit having an electrically programmable fuse and a reference resistance. A first current source is coupled, through a first switch, to the electrically programmable fuse. A second current source is coupled, through a second switch, to the reference resistance. A precharge signal enables the first current source, the second current source and closes the first switch and the second switch, creating voltage drops across the electrically programmable fuse and the reference resistance. When the precharge signal goes inactive, the first current source and the second current source are shut off, and, at the same time the first switch and the second switch are opened. A latching circuit uses a difference in the voltage drops when the precharge signal goes inactive to store a state of the electrically programmable fuse, indicative of whether the electrically programmable fuse is blown or unblown.

Electrically Programmable Fuse Sense Circuit

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US Patent:
7532057, May 12, 2009
Filed:
Oct 16, 2007
Appl. No.:
11/872873
Inventors:
Anthony Gus Aipperspach - Rochester MN, US
David Howard Allen - Rochester MN, US
Phil C. Paone - Rochester MN, US
David Edward Schmitt - Rochester MN, US
Gregory John Uhlmann - Rochester MN, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
H01H 37/76
H01H 85/00
US Classification:
327525
Abstract:
A design structure for electrically programmable fuse sense circuit having an electrically programmable fuse and a reference resistance. A first current source is coupled, through a first switch, to the electrically programmable fuse. A second current source is coupled, through a second switch, to the reference resistance. A precharge signal enables the first current source, the second current source and closes the first switch and the second switch, creating voltage drops across the electrically programmable fuse and the reference resistance. When the precharge signal goes inactive, the first current source and the second current source are shut off, and, at the same time the first switch and the second switch are opened. A latching circuit uses a difference in the voltage drops when the precharge signal goes inactive to store a state of the electrically programmable fuse, indicative of whether the electrically programmable fuse is blown or unblown.

Using Electrically Programmable Fuses To Hide Architecture, Prevent Reverse Engineering, And Make A Device Inoperable

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US Patent:
7550789, Jun 23, 2009
Filed:
Feb 29, 2008
Appl. No.:
12/039829
Inventors:
Anthony R. Bonaccio - Shelburne VT, US
Karl R. Erickson - Rochester MN, US
John A. Fifield - Underhill VT, US
Chandrasekharan Kothandaraman - Hopewell Junction NY, US
Phil C. Paone - Rochester MN, US
William R. Tonti - Essex Junction VT, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
H01L 29/80
US Classification:
257209, 257529, 438130
Abstract:
Techniques and systems whereby operation of and/or access to particular features of an electronic device may be controlled after the device has left the control of the manufacturer are provided. The operation and/or access may be provided based on values stored in non-volatile storage elements, such as electrically programmable fused (eFUSES).

Non Volatile Memory Rad-Hard (Nvm-Rh) System

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US Patent:
7551470, Jun 23, 2009
Filed:
Oct 19, 2006
Appl. No.:
11/550918
Inventors:
Karl R. Erickson - Rochester MN, US
John A. Fifield - Underhill VT, US
Chandrasekara Kothandaraman - Hopewell Junction NY, US
Phil C. Paone - Rochester MN, US
William R. Tonti - Essex Junction VT, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G11C 17/00
US Classification:
365 96, 3652257
Abstract:
The embodiments of the invention provide an apparatus, method, etc. for a non volatile memory RAD-hard (NVM-rh) system. More specifically, an IC permanent non-volatile storage element comprises an integrated semiconductor stable reference component, wherein the component is resistant to external radiation. The storage element further comprises e-fuse structures in the component and a sensing circuit coupled to the e-fuse structures. The sensing circuit is adapted to update an external device at a specified time interval to reduce incidence of soft errors and errors due to power failure. Moreover, the sensing circuit is adapted to cease updating the external device to program the e-fuse structures; and, continue updating the external device after programming the e-fuse structures.
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Phil Ray Paone from Bettendorf, IA, age ~80 Get Report