Lionel E. Kattner - Saratoga CA Albert P. Youmans - Cupertino CA Patrick J. Shasby - San Jose CA
Assignee:
Signetics Corporation - Synnyvale CA
International Classification:
G01R 106 G01R 3126
US Classification:
324158P
Abstract:
A multi-point probe for contacting closely spaced pads of a semiconductor device, having a flexible sheet-like member which carries the probes that make contact with the semiconductor device.