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Patrick Y Maeda

from San Jose, CA
Age ~67
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Also known as:
Patrick Yasuo Maeda
Related to:
Misako HaMarlene Maeda, 28Doreen Price HoppeJane E Maeda, 67Oscar D Hoppe
Connected to:
Anna Maeda, 41Haruko Maeda, 93Hideki Maeda, 57Hirotaka Maeda, 62Isaac M Maeda, 68Jaleen K Maeda, 35Judy E Maeda, 67Julie A Maeda, 52Kazunori Maeda, 35Keiko Maeda, 61

Patrick Maeda Phones & Addresses

  • San Jose, CA
  • 1200 Dale Ave, Mountain View, CA 94040 (650) 967-2574
  • Palo Alto, CA
  • Redondo Beach, CA
  • Torrance, CA
  • San Dimas, CA
  • 15075 Charmeran Ave, San Jose, CA 95124

Work

Company: Xerox Jul 1987 to Oct 1994 Position: Senior member of engineering staff

Education

Degree: Master of Science, Masters School / High School: Stanford University Specialities: Electrical Engineering

Skills

Optics • Optical Engineering • Simulations • Physics • R&D • Image Processing • Laser • Matlab • Patents • Product Development • Optical Imaging • Mems • Technology Transfer • Six Sigma • Modeling • Thin Films • Design For Manufacturing • Zemax • Research and Development • Fiber Optics • Optical Design • Micro Optics • Lens Design • Lighttools • Photonics • Codev • Optical System Tolerancing • Illumination Optical System Design • Projection Optical System Design • Laser Scanning System Design • High Power Laser System Design

Industries

Research

Resumes

Resumes

Patrick Maeda Photo 1

Principal Engineer

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Location:
San Francisco, CA
Industry:
Research
Work:
Xerox Jul 1987 - Oct 1994
Senior Member of Engineering Staff
Parc Jul 1987 - Oct 1994
Principal Engineer
General Dynamics Oct 1984 - Jul 1987
Research Engineer
Education:
Stanford University
Master of Science, Masters, Electrical Engineering University of Hawaii at Manoa
Bachelors, Bachelor of Science, Mathematics, Physics Roosevelt High School
Skills:
Optics
Optical Engineering
Simulations
Physics
R&D
Image Processing
Laser
Matlab
Patents
Product Development
Optical Imaging
Mems
Technology Transfer
Six Sigma
Modeling
Thin Films
Design For Manufacturing
Zemax
Research and Development
Fiber Optics
Optical Design
Micro Optics
Lens Design
Lighttools
Photonics
Codev
Optical System Tolerancing
Illumination Optical System Design
Projection Optical System Design
Laser Scanning System Design
High Power Laser System Design

Publications

Us Patents

Systems And Method For Measuring Or Reducing Spacing Errors In Multiple Beam Ros Systems

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US Patent:
6608643, Aug 19, 2003
Filed:
Jan 16, 2002
Appl. No.:
10/046234
Inventors:
Robert M. Lofthus - Webster NY
Patrick Y. Maeda - Mountain View CA
Daniel W. Costanza - Webster NY
Kristine A. German - Webster NY
Robert P. Loce - Webster NY
Assignee:
Xerox Corporation - Stamford CT
International Classification:
B41J 247
US Classification:
347240, 347251
Abstract:
An apparatus for correcting beam-to-beam spacing error on an image plane of a photoreceptor includes a controller which generates beam-to-beam spacing error corrections signals, a plurality of optical elements, each of which is adjustable and responsive to beam-to-beam spacing error correction signal and a gray level measurement device. The controller performs the beam-to-beam spacing error correction analysis, determining whether or not a correction is necessary, and if so, which optical element to adjust and the magnitude of adjustment. Enhanced toner area coverage sensors are used to detect the gray level of a toned area of raster scan line patterns at various locations across the photoreceptor image plane. By repeatedly evaluating the beam-to-beam spacing error during operation, the apparatus of the invention is able to correct beam-to-beam spacing errors that may develop during operation and does not permit residual errors to persist even after an initial correction has been implemented.

Method For Shaped Optical Mems Components With Stressed Thin Films

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US Patent:
6706202, Mar 16, 2004
Filed:
Sep 28, 2000
Appl. No.:
09/672386
Inventors:
Decai Sun - Los Altos CA
Michel A. Rosa - San Jose CA
Eric Peeters - Fremont CA
Francesco Lemmi - Rome, IT
Patrick Y. Maeda - Mountain View CA
Christopher L. Chua - San Jose CA
Assignee:
Xerox Corporation - Stamford CT
International Classification:
B81B 702
US Classification:
216 24, 216 26, 216 40
Abstract:
A method is disclosed for making shaped optical moems components with stressed thin films. In particular, stressed thin films are used to make mirror structures.

Illumination Detection Method For Led Printbars

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US Patent:
6828538, Dec 7, 2004
Filed:
Dec 26, 2001
Appl. No.:
10/025484
Inventors:
Patrick Y. Maeda - Mountain View CA
Assignee:
Xerox Corporation - Stamford CT
International Classification:
G01J 132
US Classification:
250205, 2505591
Abstract:
A system to monitor light emitting diodes (LEDs) in a printbar is described. The system integrates photodetectors into a printer or into the printbar itself such that as the printbar ages, the photodetectors can detect the decrease in intensity of the LEDs in the printbar and recalibrate driver circuits providing power to each LED. The recalibrated power output of each driver circuit compensates for nonuniformities in the LEDS that result from uneven aging of the LEDs.

Light Detection And Imaging System And Method Including An Array Of Sensors

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US Patent:
6987274, Jan 17, 2006
Filed:
Aug 31, 2004
Appl. No.:
10/929579
Inventors:
Robert A. Street - Palo Alto CA, US
Patrick Y. Maeda - Mountain View CA, US
Assignee:
Palo Alto Research Center Incorporated - Palo Alto CA
International Classification:
G01N 21/64
US Classification:
2504581
Abstract:
A light detection system for imaging an object including a light source, an object, a first substrate with a sensor arranged on a side of the first substrate opposite from the light source, the sensor having an opening through which the light from the light source passes. A distance from the sensor to the object corresponds approximately to the size of the sensor. The light illuminates the object and the sensor detects the light emanating from the object. The object is scanned relative to the sensor to create the image. A method includes arranging the sensor to face the object, illuminating the object with a light source so that the light passes through the opening in the sensor, and detecting the light emanating from the object, the object being scanned relative to the sensor to create the image.

Semi-Transparent Power Monitor Integrated With A Light Producing Module

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US Patent:
7042015, May 9, 2006
Filed:
Aug 8, 2001
Appl. No.:
09/924840
Inventors:
Decai Sun - Los Altos CA, US
Eric Peeters - Fremont CA, US
Christopher L. Chua - San Jose CA, US
Francesco Lemmi - Roha, IT
Patrick Y. Maeda - Mountain View CA, US
Scott Solberg - Mountain View CA, US
Assignee:
Xerox Corporation - Stamford CT
International Classification:
H01L 31/12
US Classification:
257 81, 257 80
Abstract:
A light-producing device integrated with a power monitoring system include a light-producing device from which light is emitted in wavelengths that can range from approximately 700 nm to approximately 3 microns. A semi-transparent sensor is located such that at least a portion of the light emitted passes through the semi-transparent sensor and at least a portion of light is absorbed by the semi-transparent sensor. The semi-transparent sensor is configured to be semi-transparent at wavelengths that can range from 700 nm to 3 microns. The semi-transparent sensor may also be used with an external light source, for example with fiber-optic cables.

Structure And Method For A Microelectromechanic Cylindrical Reflective Diffraction Grating Spectrophotometer

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US Patent:
7106441, Sep 12, 2006
Filed:
Sep 26, 2003
Appl. No.:
10/672207
Inventors:
Decai Sun - Los Altos CA, US
Joel A. Kubby - Rochester NY, US
Jingkuang Chen - Rochester NY, US
Alex T. Tran - Madison NJ, US
Patrick Y. Maeda - Mountain View CA, US
Assignee:
Xerox Corporation - Stamford CT
International Classification:
G01J 3/20
US Classification:
356328
Abstract:
A tunable microelectromechanical (MEMS) spectrophotometer with a rotating cylindrical reflective diffraction grating is integrated with a photodetector and an optical fiber light source on a Rowland circle on a monolithic silicon substrate.

Semiconductor Lasers

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US Patent:
7310358, Dec 18, 2007
Filed:
Dec 17, 2004
Appl. No.:
11/015990
Inventors:
Christopher L. Chua - San Jose CA, US
Michael A. Kneissl - Mountain View CA, US
Patrick Y. Maeda - Mountain View CA, US
Noble M. Johnson - Menlo Park CA, US
Ross D. Bringans - Cupertino CA, US
John E. Northrup - Palo Alto CA, US
David K. Biegelsen - Portola Valley CA, US
Assignee:
Palo Alto Research Center Incorporated - Palo Alto CA
International Classification:
H01S 3/10
H01S 5/00
H01S 3/14
US Classification:
372 23, 372 4501, 372 50124, 372 501, 372 68
Abstract:
Lasers, such as in laser structures, can include two or more semiconductor structures that are substantially identical or that include the same semiconductor material and have substantially the same geometry, such as in closely spaced dual-spot two-beam or quad-spot four-beam lasers. The lasers can also include differently structured current flow or contact structures or different wavelength control structures. For example, current flow or contact structures can be differently structured to prevent or otherwise affect phase locking, such as by causing different threshold currents and different operating temperatures. Exemplary differences include that one laser's semiconductor structure can have an isolated area that does not receive electrical current from a covering conductive layer; conductive layers of two layers can have different thicknesses or lengths; one laser can have a patterned layer with high electrical resistance between its semiconductor structure and a conductive layer; or one laser's semiconductor structure can include regions of high electrical resistance adjacent its contact structure.

Propagating Light To Be Sensed

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US Patent:
7315667, Jan 1, 2008
Filed:
Dec 22, 2005
Appl. No.:
11/315387
Inventors:
Oliver Schmidt - Palo Alto CA, US
Peter Kiesel - Palo Alto CA, US
Patrick Y. Maeda - Mountain View CA, US
Assignee:
Palo Alto Research Center Incorporated - Palo Alto CA
International Classification:
G02B 6/00
G02B 5/28
G02B 6/32
G01J 1/04
US Classification:
385 12, 385 31, 385 38, 385 33, 385 34, 385 88, 385 92, 385 93, 385122, 25022711, 25022714, 25022718, 359589, 359362, 359433, 359577, 359580, 359586
Abstract:
Light to be sensed is spreaded across an entry surface of a transmission structure with a laterally varying energy transmission function. For example, the light could be output from a stimulus-wavelength converter, provided through an optical fiber, or it could come from a point-like source or broad area source. Output photons from the transmission structure can be photosensed by photosensing components such as an array, position sensor, or array of position sensors. Wavelength information from the light can be obtained in response to the photosensing component. Spreading can be performed by air, gas, transparent material, or vacuum in a gap, by a region or other part of a lens, or by an optical fiber end surface. If the light comes from more than one source, a propagation component can both spread the light and also keep light from the sources separate.
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Patrick Y Maeda from San Jose, CA, age ~67 Get Report