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Oleg Kolosov Phones & Addresses

  • 81 S 17Th St, San Jose, CA 95112
  • 1045 Arlington Ln, San Jose, CA 95129
  • 1111 Weyburn Ln, San Jose, CA 95129
  • 1204 Henderson Ave, Sunnyvale, CA 94086
  • Cupertino, CA

Work

Company: Facebook Feb 2017 Position: Manager, infrastructure operations

Education

Degree: Master of Business Administration, Masters School / High School: Wisconsin School of Business 2004 to 2006 Specialities: Management

Industries

Internet

Resumes

Resumes

Oleg Kolosov Photo 1

Manager, Infrastructure Operations

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Location:
San Francisco, CA
Industry:
Internet
Work:
Facebook
Manager, Infrastructure Operations

Facebook Jul 2015 - Feb 2017
Lead, Data Center Service Management

Facebook Aug 2014 - Jul 2015
Program Manager, Logistics

Cisco Jul 2013 - Aug 2014
Manager, Supply Chain

Cisco Mar 2008 - Jul 2013
Manager, Manufacturing Operations
Education:
Wisconsin School of Business 2004 - 2006
Master of Business Administration, Masters, Management
University of Washington 1997 - 2000
Bachelor of Science In Mechanical Engineering, Bachelors, Engineering

Publications

Us Patents

High Throughput Mechanical Property Testing Of Materials Libraries Using Capacitance

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US Patent:
6690179, Feb 10, 2004
Filed:
Aug 24, 2001
Appl. No.:
09/939263
Inventors:
Damian A. Hajduk - San Jose CA
Eric D. Carlson - Cupertino CA
J. Christopher Freitag - Santa Clara CA
Oleg Kolosov - San Jose CA
James R. Engstrom - Ithaca NY
Adam Safir - Berkeley CA
Ravi Srinivasan - Mountain View CA
Leonid Matsiev - San Jose CA
Assignee:
Symyx Technologies, Inc. - Santa Clara CA
International Classification:
G01R 2726
US Classification:
324663, 324452, 324661, 73862626
Abstract:
One aspect of the present invention provides instruments for measuring mechanical properties of a combinatorial library of materials. The instruments include at least one capacitor to which a member of a library of material samples is removably secured for testing; at least one voltage source for delivering one or more forces to each library member; and at least one sensing device for monitoring the response each library member to the one or more forces. Another aspect of the present invention provides methods of screening a combinatorial library of materials where the method monitors the responses of a plurality of samples on a substrate to a force induced by a capacitor.

High Throughput Mechanical Property And Bulge Testing Of Materials Libraries

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US Patent:
6772642, Aug 10, 2004
Filed:
Aug 24, 2001
Appl. No.:
09/939404
Inventors:
Damian A. Hajduk - San Jose CA, 95125
Eric D. Carlson - Cupertino CA, 95014
J. Christopher Freitag - Santa Clara CA, 95050
Oleg Kolosov - San Jose CA, 95129
James R. Engstrom - Ithaca NY, 14850
Adam Safir - Berkeley CA, 94703
Ravi Srinivasan - Mountain View CA, 94039
Leonid Matsiev - San Jose CA, 95129
International Classification:
G01N 308
US Classification:
73819
Abstract:
A method for high throughput mechanical property and bulge testing of materials libraries. A plurality of samples on a substrate are monitored for their response to a force from a fluid.

Application Specific Integrated Circuitry For Controlling Analysis Of A Fluid

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US Patent:
6873916, Mar 29, 2005
Filed:
Mar 21, 2003
Appl. No.:
10/394543
Inventors:
Oleg V. Kolosov - San Jose CA, US
Leonid Matsiev - San Jose CA, US
Mikhail B. Spitkovsky - Sunnyvale CA, US
Vladimir Gammer - San Francisco CA, US
Assignee:
Symyx Technologies, Inc. - Santa Clara CA
International Classification:
G01N031/00
US Classification:
702 25
Abstract:
A circuit for determining characteristics of a fluid under-test is provided. The circuit includes analog-to-digital processing circuitry for interfacing with a sensor and host electronics. The analog-to-digital processing circuitry includes a frequency generator for providing stimulus to the sensor and receiving a response signal from the sensor. Conditioning circuitry for reducing analog signal offsets in the response signal and signal detection circuitry for identifying amplitude data of the response signal are provided. Further provided is analog-to-digital conversion circuitry for converting the detected amplitude data into digital form. Memory for holding calibration data and approximated fluid characteristics of the fluid under-test is included in the circuitry. The digital form of the response signal is processed in conjunction with the calibration data and approximated fluid characteristics to generate fluid characteristics of the actual fluid under-test.

High Throughput Microbalance And Methods Of Using Same

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US Patent:
6928877, Aug 16, 2005
Filed:
May 24, 2002
Appl. No.:
10/155207
Inventors:
Eric D. Carlson - Cupertino CA, US
Oleg Kolosov - San Jose CA, US
Leonid Matsiev - San Jose CA, US
Laura T. Mazzola - Redwood City CA, US
Mikhail Spitkovsky - Sunnyvale CA, US
John Gallipeo - Morgan Hill CA, US
Assignee:
Symyx Technologies, Inc. - Santa Clara CA
International Classification:
G01N029/16
US Classification:
73579, 73 32 A, 738656, 73866
Abstract:
A method and apparatus for measurement of mass of small sample sizes. The method and apparatus is particularly adapted for providing microbalance measurement of solid materials as part of a combinatorial research program. The method and apparatus contemplate monitoring the response of a resonator holding a sample and correlating the response with mass change in the samples.

Instrument For High Throughput Measurement Of Material Physical Properties And Method Of Using Same

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US Patent:
6936471, Aug 30, 2005
Filed:
Feb 8, 2001
Appl. No.:
09/779149
Inventors:
Damian Hajduk - San Jose CA, US
Eric Carlson - Palo Alto CA, US
J. Christopher Freitag - Santa Clara CA, US
Oleg Kolosov - Cupertino CA, US
James R. Engstrom - Ithaca NY, US
Adam Safir - Berkeley CA, US
Ravi Srinivasan - Mountain View CA, US
Leonid Matsiev - San Jose CA, US
Assignee:
Symyx Technologies, Inc. - Santa Clara CA
International Classification:
G01N031/00
G01N003/00
G01N003/08
US Classification:
436 2, 436 55, 435DIG 1, 435DIG 2, 435DIG 9, 73760, 73788, 73789, 73826, 73841, 73847
Abstract:
An apparatus and method for screening combinatorial libraries of materials by measuring the response of individual library members to mechanical perturbations is described. The apparatus generally includes a sample holder for containing the library members, an array of probes for mechanically perturbing individual library members, and an array of sensors for measuring the response of each of the library members to the mechanical perturbations. Library members undergoing screening make up a sample array, and individual library members constitute elements of the sample array that are confined to specific locations on the sample holder. During screening, the apparatus mechanically perturbs individual library members by displacing the sample array (sample holder) and the array of probes. Typically, all of the elements of the sample array are perturbed simultaneously, but the apparatus also can also perturb individual or groups of sample array elements sequentially. The flexible apparatus and method can screen libraries of materials based on many different bulk physical properties, including Young's modulus (flexure, uniaxial extension, biaxial compression, and shear); hardness (indentation), failure (stress and strain at failure, toughness), adhesion (tack, loop tack), and flow (viscosity, melt flow indexing, and rheology), among others.

High Throughput Preparation And Analysis Of Plastically Shaped Material Samples

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US Patent:
7013709, Mar 21, 2006
Filed:
Dec 6, 2002
Appl. No.:
10/313477
Inventors:
Damian A. Hajduk - San Jose CA, US
Oleg Kolosov - San Jose CA, US
Assignee:
Symyx Technologies, Inc. - Santa Clara CA
International Classification:
G01N 3/10
US Classification:
73 37, 73760, 73788, 7386401
Abstract:
A rapid throughput method for the preparation, analysis or both of libraries of material samples is provided. According to the method, a plurality of samples is provided. The plurality of samples is then formed into a plurality of films. Thereafter, the plurality of films is plastically deformed. Preferably, the plurality of films is deformed into a configuration appropriate for testing of properties or characteristics of the samples.

Machine Fluid Sensor And Method

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US Patent:
7043969, May 16, 2006
Filed:
Jun 2, 2003
Appl. No.:
10/452264
Inventors:
Leonid Matsiev - San Jose CA, US
James Bennett - Santa Clara CA, US
Daniel M. Pinkas - Menlo Park CA, US
Mikhail Spitkovsky - Sunnyvale CA, US
Oleg Kolosov - San Jose CA, US
Shenheng Guan - Palo Alto CA, US
Mark Uhrich - Redwood City CA, US
G. Cameron Dales - Saratoga CA, US
John F. Varni - Los Gatos CA, US
Blake Walker - Eugene OR, US
Vladimir Gammer - San Francisco CA, US
Dave Padowitz - Mountain View CA, US
Eric Low - Berkeley CA, US
Assignee:
Symyx Technologies, Inc. - Santa Clara CA
International Classification:
G01N 11/16
US Classification:
73 5441, 73 5305, 73 6442
Abstract:
A method for analyzing a fluid contained within a machine, comprising the steps of providing a machine including a passage for containing a fluid; placing a sensor including a mechanical resonator in the passage; operating the resonator to have a portion thereof translate through the fluid; and monitoring the response of the resonator to the fluid in the passage. A preferred sensor includes a tuning fork resonator.

High Throughput Permeability Testing Of Materials Libraries

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US Patent:
7112443, Sep 26, 2006
Filed:
Oct 18, 2002
Appl. No.:
10/274184
Inventors:
Damian A. Hajduk - San Jose CA, US
Oleg Kolosov - San Jose CA, US
Assignee:
Symyx Technologies, Inc. - Santa Clara CA
International Classification:
G01N 31/00
G01N 15/08
G01N 33/44
US Classification:
436 5, 73 38, 422 99, 422104, 436 3, 436 39, 436127, 436136, 436138, 436181
Abstract:
A library of material samples is screened for properties such as permeability. A library of material samples is provided. A stimulus such as an exposure to a permeate fluid is provided to each member of the library. A response of each of the material samples due to the stimulus is measured and the response, the stimulus or both are recorded and related to provide data. Thereafter, the data is analyzed to reach conclusions regarding the properties of the material samples.
Oleg V Kolosov from San Jose, CA, age ~64 Get Report