Inventors:
Marc R. Mydill - Garland TX
Sam R. Pile - Dallas TX
Sheila O'Keefe - Garland TX
Neal F. Okerblom - Dallas TX
W. Russ Keenan - Dallas TX
Assignee:
Texas Instruments Incorporated - Dallas TX
International Classification:
G01R 3128
G01R 3102
Abstract:
A reconfigurable resource architecture enhances a test system's utilization by allowing product-mix dependent allocation of test system resources. The test system resources can be configured to test several device types with different pin counts simultaneously. The configuration can be changed to accommodate various product mixes based on pin count.