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Nancy Thomas Tharakan

from Walpole, MA
Age ~52
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Also known as:
Nancy T Tharakan, Nancy P Tharakan, Nancy N
Phone and address:
34 Rainbow Pond Dr APT C2, Walpole, MA 02081
(508) 921-3482
Related to:
Marsha T Tharakan, 54Thomas TharakanJohathan TharakanCheriyan T Tharakan, 89
Connected to:
Annalisa Tharakan, 44Priya Tharakan, 34Mitchell L Tharaldson, 66Tracy Tharaldson, 49Krista E Tharan, 41Sarfaraz Tharani, 32Serena Tharani, 35Linny F Tharappel, 56Maryann Tharappel, 40Scott E Tharau, 59

Nancy Tharakan Phones & Addresses

  • 34 Rainbow Pond Dr APT C2, Walpole, MA 02081 (508) 921-3482
  • 301 Buckminster Dr APT 102, Norwood, MA 02062 (781) 269-5237
  • 301 Buckminster Dr, Norwood, MA 02062
  • Burlington, MA
  • Waltham, MA
  • Quincy, MA
  • Cambridge, MA
  • Princeton, NJ
  • Malden, MA
  • Lowell, MA

Work

Company: Analog devices

Education

Degree: Masters, Master of Science In Electrical Engineering School / High School: University of Massachusetts Lowell 1995 to 1999 Specialities: Electronics Engineering, Electronics

Skills

Mixed Signal Testing • Electrical Troubleshooting • Problem Solving • Electronics • Circuit Design • Mixed Signal • Test Equipment • Ic • Analog • Test Engineering • Cmos • Spectrum Analyzer • Oscilloscope • Automation • Asic

Industries

Semiconductors

Resumes

Resumes

Nancy Tharakan Photo 1

Nancy Tharakan

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Location:
Walpole, MA
Industry:
Semiconductors
Work:
Analog Devices
Education:
University of Massachusetts Lowell 1995 - 1999
Masters, Master of Science In Electrical Engineering, Electronics Engineering, Electronics Cleveland State University 1989 - 1994
Bachelors, Bachelor of Science In Electrical Engineering, Electronics Engineering, Electronics University of Massachusetts
Masters, Master of Science In Electrical Engineering, Electronics Engineering
Skills:
Mixed Signal Testing
Electrical Troubleshooting
Problem Solving
Electronics
Circuit Design
Mixed Signal
Test Equipment
Ic
Analog
Test Engineering
Cmos
Spectrum Analyzer
Oscilloscope
Automation
Asic

Publications

Us Patents

Methods And Apparatus For Generating A Test Signal For Xdsl Devices

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US Patent:
6798830, Sep 28, 2004
Filed:
Sep 29, 2000
Appl. No.:
09/677028
Inventors:
Nancy T. Tharakan - Cambridge MA
Assignee:
Teradyne, Inc. - Boston MA
International Classification:
H04B 1700
US Classification:
375224, 375260, 714714
Abstract:
A system, method and apparatus are disclosed for generating a test signal by selecting a set of frequencies for the test signal and selecting frequency sub-groups from the set of frequencies. The system generates a respective sub-group composite signal for each frequency sub-group selected from the set of frequencies and time shifts each respective sub-group composite signal in relation to other sub-group composite signals. The system then generates the test signal by summing each respective time shifted sub-group composite signal to produce the test signal. The system of the invention can be used to develop test signals for input into xDSL devices under test, and in particular, is highly beneficial when performing missing tone testing of xDSL devices.
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Nancy Thomas Tharakan from Walpole, MA, age ~52 Get Report