Miki Z Moyal

50476645, Sep 10, 1991

Jul 21, 1989

7/383918

Miki Moyal - Austin TX

Advanced Micro Devices, Inc. - Sunnyvale CA

H03K 326
H03K 3335

307303

There is disclosed a trimming circuit for use in integrated circuits for adjusting a circuit parameter to a desired level. The trimming circuit includes an input terminal and a fuse coupled between the input terminal and a supply voltage. The fuse is convertible from a low resistance condition to an open circuit condition in response to a first voltage potential applied to the input. The trimming circuit also includes circuit means coupled to the input for causing the circuit parameter to be permanently adjusted in response to the fuse being converted to the open circuit condition and is also responsive to a second voltage potential applied to the input for causing the circuit parameter to be temporarily adjusted without the fuse being converted to the open circuit condition. With the application of the second voltage potential, the appropriateness of the circuit parameter adjustment may be determined before the fuse is converted to the open circuit condition and hence, before the circuit parameter is permanently adjusted.

54228328, Jun 6, 1995

Dec 22, 1993

8/172038

Miki Moyal - Austin TX

Advanced Micro Devices - Sunnyvale CA

G01K 701
G01K 700

364557

A thermal sensor for use in integrated circuits includes a plurality of MOSFET diodes. The thermal sensor senses temperature within the integrated circuit and provides a control signal. The control signal may be utilized to control thermal management devices such as fans, clock dividers, or other thermal management devices. The thermal sensor is preferably integrated within the microprocessor adjacent clock driver circuitry. The thermal sensor generally includes current mirrors coupled to diodes. The diodes control the output of the current mirrors so that larger current is drawn from the current mirrors when the temperature is higher in the integrated circuit. The current mirrors supply current to a constant signal source and an impedance circuit. The control circuit compares the voltages from the impedance circuit and the constant signal source. The control circuit provides the control signal when the signal from the impedance circuit is above a predetermined threshold.

54500850, Sep 12, 1995

Oct 21, 1993

8/139007

Brett Stewart - Austin TX
Miki Moyal - Austin TX

Advanced Micro Devices, Inc. - Austin TX

H03M 136

341159

Analog to digital conversion of signals at rates higher than can be accomplished by a monolithic flash analog to digital converter is achieved using multiple flash analog to digital converters operated in a parallel architecture. Sample timing of the multiple converters is skewed by selecting subfrequencies of a control clock or different phases of a control clock as the source for the sample control signal. The multiple flash converter outputs are then digitally recombined to produce a single output identical to a flash converter operating at a higher speed than could be obtained for a given set of circuit parameters.

52968588, Mar 22, 1994

May 14, 1992

7/882666

Miki Z. Moyal - Austin TX

Advanced Micro Devices, Inc. - Austin TX

H03M 114

341156

An apparatus for generating a digital signal representing an analog signal comprising a reference array establishing reference values at hierarchically arranged reference nodes in response to a reference signal. The apparatus includes a first iteration comparing circuit comparing selected first reference values present at first nodes with the analog signal. The first reference values establish a plurality of ranges of reference values. The first comparing circuit generates a first output signal indicating a particular range in which the analog signal first compares with respect to a reference value in a predetermined relation. A logic circuit generates a control signal in response to the first output signal. A second comparing circuit effects second comparing of selected second reference values with the analog signal. The second reference values are present at selected nodes which are in intervals adjacent the first reference nodes and hierarchically segment those intervals.

54125944, May 2, 1995

Aug 8, 1994

8/287214

Miki Moyal - Austin TX
Thomas Brennan - Austin TX
Gene Vance - Austin TX

Advanced Micro Devices, Inc. - Sunnyvale CA

G11C 1300

365 96

A method and apparatus provide fuse trimming or analog integrated circuit parameters in plastic packages. The apparatus includes an electrically interruptible circuit element, such as a fuse; a level reading unit which reads the state of the electrically interruptible circuit element and generates a code in response to the state; a state altering unit, such as a current source for providing a blow current; and a control circuit. A test level reading device allows screening for marginally-blown fuses. A switchable element removes applied voltage from fuses when the fuse is not being blown or read to prevent fuse regrowth.

51361833, Aug 4, 1992

Jun 27, 1990

7/544737

Miki Moyal - Austin TX
Russ Apfel - Austin TX

Advanced Micro Devices, Inc. - Sunnyvale CA

H03K 524
H03K 5153

307355

There is disclosed a three-state buffer including a comparator circuit which comprises a plurality of bipolar transistors and which generates first and second control voltages which are dependent upon the forward biased base to emitter voltage drops of the transistors. The comparator circuit also includes a threshold circuit establishing a threshold voltage intermediate the first and second control voltages which is also dependent upon the forward biased base to emitter voltage drops of the transistors. As a result, the threshold voltage is always intermediate the first and second control voltages to assure reliable operation of the comparator circuit notwithstanding variations in integrated circuit processing parameters or integrated circuit operating temperatures.

53847270, Jan 24, 1995

Nov 8, 1993

8/149191

Miki Moyal - Austin TX
Thomas Brennan - Austin TX
Gene Vance - Austin TX

Advanced Micro Devices, Inc. - Sunnyvale CA

G11C 1716

365 96

A method and apparatus provide fuse trimming of analog integrated circuit parameters in plastic packages. The apparatus includes an electrically interruptible circuit element, such as a fuse; a level reading unit which reads the state of the electrically interruptible circuit element and generates a code in response to the state; a state altering unit, such as a current source for providing a blow current; and a control circuit. A test level reading device allows screening for marginally-blown fuses. A switchable element removes applied voltage from fuses when the fuse is not being blown or read to prevent fuse regrowth.

49721577, Nov 20, 1990

Jul 21, 1989

7/383914

Miki Moyal - Austin TX

Advanced Micro Devices, Inc. - Sunnyvale CA

H03K 1756

330 51

There is disclosed an operational amplifier which is arranged for sensing the voltages provided by a plurality of input voltage sources and which diminishes the level of noise at the operational amplifier output resulting from the selection of the input voltage sources. The operational amplifier includes a first amplification stage having first and second voltage sensing intputs, a common input, and an output, and a second amplification stage having an input and an output. Switch means are disposed between the first stage output and the second stage input for selectively coupling the amplified signal at the first stage output resulting from an input signal at the first input to the second stage input or the amplified signal at the first stage output resulting from an input signal at the second input to the second stage input. Because the switch means is disposed between the first and second amplification stages, the noise coupled into the operational amplifier is not amplified by the first amplification stage and hence, the noise at the output of the operational amplifier is deceased by a factor equal to the gain of the first amplification stage.