Resumes
Resumes
Michael Ayukawa Phones & Addresses
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4846 Harvest Ln, Zionsville, PA 18092 (610) 966-1181
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Ridgewood, NJ
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4846 Harvest Ln, Zionsville, PA 18092
Work
Position:
Executive, Administrative, and Managerial Occupations
Education
Degree:
Graduate or professional degree
Publications
Us Patents
Aluminum Pad Power Bus And Signal Routing For Integrated Circuit Devices Utilizing Copper Technology Interconnect Structures
View pageUS Patent:
20040201101, Oct 14, 2004
Filed:
Sep 30, 2003
Appl. No.:
10/675258
Inventors:
Seung Kang - Macungie PA, US
Roland Krebs - Allentown PA, US
Kurt Steiner - Fogelsville PA, US
Michael Ayukawa - Zionsville PA, US
Sailesh Merchant - Breinigsville PA, US
Roland Krebs - Allentown PA, US
Kurt Steiner - Fogelsville PA, US
Michael Ayukawa - Zionsville PA, US
Sailesh Merchant - Breinigsville PA, US
International Classification:
H01L023/48
US Classification:
257/758000
Abstract:
An integrated circuit device structure and a process for fabricating the structure wherein the power bus interconnect structure is formed in the aluminum pad or contact layer. An interconnect structure for interconnecting underlying levels of interconnect can also be formed in the aluminum pad layer.
On-Chip Apparatus And Method For Determining Integrated Circuit Stress Conditions
View pageUS Patent:
20060267621, Nov 30, 2006
Filed:
May 27, 2005
Appl. No.:
11/140605
Inventors:
Edward Harris - Fogelsville PA, US
Michael Ayukawa - Zionsville PA, US
Philip Mason - Allentown PA, US
Frank Hui - Macungie PA, US
Michael Ayukawa - Zionsville PA, US
Philip Mason - Allentown PA, US
Frank Hui - Macungie PA, US
International Classification:
G01R 31/26
US Classification:
324765000
Abstract:
A method and apparatus for determining whether an integrated circuit has been subjected to stress conditions during operation. The integrated circuit comprises a test device that is exposed to the same power supply voltage and temperature as other devices in the integrated circuit. Certain expected operating parameters, as a function of the operating life of the integrated circuit, are predetermined. If a measured value of the operating parameter exceeds the expected value then the integrated circuit has been subjected to stress conditions.