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Krithivasan Suryanarayanan

from Chandler, AZ
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Also known as:
Krithivas Suryanarayanan, Krithi Suryanarayan, N N
Phone and address:
871 S Apache Dr, Chandler, AZ 85224
Connected to:
Emmandi Suryanarayana, 63Hariharan Suryanarayanan, 44Jimmy Suryana, 43Joseph P Suryanata, 58Pradeep Suryanarayana, 48Rei Suryana, 48Shannon Suryan, 52Smitha Suryanarayana, 39Retno R Suryandari, 72Evi Suryani, 46

Krithivasan Suryanarayanan Phones & Addresses

  • 871 S Apache Dr, Chandler, AZ 85224
  • Tempe, AZ
  • Detroit, MI

Work

Company: Freescale semiconductor 2008 Position: Systems engineer

Education

School / High School: Wayne State University 2005 to 2007

Industries

Semiconductors

Resumes

Resumes

Krithivasan Suryanarayanan Photo 1

Systems Verification Engineer

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Position:
Systems Engineer at Freescale Semiconductor
Location:
Phoenix, Arizona Area
Industry:
Semiconductors
Work:
Freescale Semiconductor since 2008
Systems Engineer
Freescale Semiconductor May 2007 - Dec 2007
Verification Intern
Education:
Wayne State University 2005 - 2007

Publications

Us Patents

Compensation And Calibration For Mems Devices

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US Patent:
20140260508, Sep 18, 2014
Filed:
Jan 22, 2014
Appl. No.:
14/161260
Inventors:
Tehmoor M. Dar - Mesa AZ, US
Bruno J. Debeurre - Phoenix AZ, US
Raimondo P. Sessego - Chandler AZ, US
Richard A. Deken - Madison MS, US
Aaron A. Geisberger - Austin TX, US
Krithivasan Suryanarayanan - Chandler AZ, US
Assignee:
FREESCALE SEMICONDUCTOR, INC. - Austin TX
International Classification:
B81C 99/00
US Classification:
73 101
Abstract:
A sensor system includes a microelectromechanical systems (MEMS) sensor, processing circuitry, measurement circuitry, stimulus circuitry and memory. The system is configured to provide an output responsive to physical displacement within the MEMS sensor to the measurement circuitry. The stimulus circuitry is configured to provide a stimulus signal to the MEMS sensor to cause a physical displacement within the MEMS sensor. The measurement circuitry is configured to process the output from the MEMS sensor and provide it to the processing circuitry, which is configured to generate stimulus signals and provide them to the stimulus circuitry for provision to the MEMS sensor. Output from the measurement circuitry corresponding to the physical displacement occurring in the MEMS sensor is monitored and used to calculate MEMS sensor characteristics. Methods for monitoring and calibrating MEMS sensors are also provided.
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Krithivasan Suryanarayanan from Chandler, AZ Get Report