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Ken Liu Phones & Addresses

  • Fremont, CA
  • San Leandro, CA
  • 5243 Post House Ln, Birmingham, AL 35242 (205) 995-1281
  • Davis, CA
  • Washington, DC
  • San Jose, CA
  • Mountain View, CA
  • San Rafael, CA

Professional Records

Medicine Doctors

Ken Liu Photo 1

Dr. Ken H Liu, Mountain View CA - MD (Doctor of Medicine)

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Specialties:
Obstetrics & Gynecology
Address:
Liu & Liu Mds
2485 Hospital Dr Suite 260, Mountain View, CA 94040
(650) 988-7588 (Phone)
Certifications:
Obstetrics & Gynecology, 1988
Awards:
Healthgrades Honor Roll
Languages:
English
Chinese, Cantonese
Hospitals:
Liu & Liu Mds
2485 Hospital Dr Suite 260, Mountain View, CA 94040

El Camino Hospital
2500 Grant Road, Mountain View, CA 94040
Education:
Medical School
National Chung Shan University (Sun Yat Sen) Medical College
Medical School
Detroit-Macomb Hosp Corp
Medical School
Hsus Surg Hosp
Ken Liu Photo 2

Ken H. Liu

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Specialties:
Obstetrics & Gynecology
Work:
Liu MD
2485 Hospital Dr STE 260, Mountain View, CA 94040
(650) 988-7588 (phone)
Education:
Medical School
Chung Shan Med And Dental Coll, Taiching, Taiwan
Graduated: 1971
Procedures:
Cesarean Section (C-Section)
Hysterectomy
Myomectomy
Ovarian Surgery
Tubal Surgery
Vaccine Administration
Vaginal Delivery
Vaginal Repair
Conditions:
Abnormal Vaginal Bleeding
Breast Disorders
Conditions of Pregnancy and Delivery
Female Infertility
Genital HPV
Languages:
Chinese
English
Description:
Dr. Liu graduated from the Chung Shan Med And Dental Coll, Taiching, Taiwan in 1971. He works in Mountain View, CA and specializes in Obstetrics & Gynecology. Dr. Liu is affiliated with El Camino Hospital.
Ken Liu Photo 3

Ken H Liu, Mountain View CA

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Specialties:
OB-GYN
Address:
2485 Hospital Dr, Mountain View, CA 94040
Education:
Chung Shan Medical University - Doctor of Medicine
St. John Macomb-Oakland Hospital-Macomb Campus - Residency - Obstetrics and Gynecology
St. John Macomb-Oakland Hospital-Macomb Campus - Internship - Flex
Board certifications:
American Board of Obstetrics and Gynecology Certification in Obstetrics & Gynecology

Business Records

Name / Title
Company / Classification
Phones & Addresses
Ken H. Liu
Owner, Obstetrician, Medical Doctor
Ken H Liu MD
Medical Doctor's Office
2485 Hospital Dr, Mountain View, CA 94040
(650) 988-7588
Ken Hong Liu
Ken Liu MD
Obgyn
2485 Hospital Dr, Mountain View, CA 94040
(650) 988-7588
Ken Liu
President
FAMETEK, INC
300 Montgomery St STE 535, San Francisco, CA 94104
Ken Liu
President
LIU & SHIAU FAMILY FOUNDATION INC
26751 Almaden Ct, Los Altos, CA 94022
Ken Liu
Principal
Unimicron Technology
Trust Management
19816 Braemar Dr, Saratoga, CA 95070
Ken Liu
Principal
Ken Liu
Business Services at Non-Commercial Site · Nonclassifiable Establishments
26751 Almaden Ct, Los Altos, CA 94022

Publications

Us Patents

Exchangeable Membrane Probe Testing Of Circuits

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US Patent:
58412913, Nov 24, 1998
Filed:
Dec 12, 1996
Appl. No.:
8/764511
Inventors:
Ken Kuang-Fu Liu - Saratoga CA
Robert John Moti - San Jose CA
Syed A. Husain - Milpitas CA
Assignee:
MicroModule Systems - Cupertino CA
International Classification:
G01R 3102
US Classification:
324755
Abstract:
First and second bumps electrically connected at first and second positions along a conductive run borne by a flexible substrate are respectively oriented for contact with a pad of a die under test and a pad of a tester structure. Second and third conductive regions are electrically connected respectively to the power and ground terminals of a power source and an electrical device. The second and third regions are spaced from a first conductive region to filter high-frequency noise components from power and ground potentials provided by the power source.

Membrane Probing Of Circuits

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US Patent:
58475710, Dec 8, 1998
Filed:
Jul 3, 1996
Appl. No.:
8/675416
Inventors:
Ken Kuang-Fu Liu - Saratoga CA
Kunio Sano - Yamanashi, JP
Takashi Sato - Nirasaki, JP
Assignee:
MicroModule Systems - Cupertino CA
International Classification:
G01R 1073
US Classification:
324754
Abstract:
First and second bumps electrically connected at first and second positions along a conductive run borne by a flexible substrate are respectively oriented for contact with a pad of a die under test and a pad of a tester. A probe frame is bonded to the substrate between connector frames bonded at opposite ends of the substrate. Alternatively, a pair of bumps exposed on the same surface of a flexible substrate are electrically connected at different positions along a conductive run. One of the bumps is oriented for contact with a pad of a die under test, and the other is in contact with a pad on a surface of a printed circuit board directed away from the die. The pad of the printed circuit board is provided for electrical connection to a tester.
Ken W Liu from Fremont, CA, age ~49 Get Report