Kan Tan Phones & Addresses
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13805 NW Trevino St, Portland, OR 97229 (503) 704-8939
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16165 Loon Dr, Beaverton, OR 97007 (503) 579-3166
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2384 Schmidt Way, Beaverton, OR 97006 (503) 466-0801 (503) 649-1711
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4135 Spratt Way, Beaverton, OR 97007 (503) 649-1711
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Houston, TX
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13805 NW Trevino St, Portland, OR 97229
Work
Position:
Professional/Technical
Education
Degree:
Graduate or professional degree
Publications
Us Patents
Apparatus And Method For Spectrum Analysis-Based Serial Data Jitter Measurement
View pageUS Patent:
6832172, Dec 14, 2004
Filed:
May 16, 2002
Appl. No.:
10/150558
Inventors:
Benjamin A. Ward - Portland OR
Kan Tan - Beaverton OR
Mark L. Guenther - Portland OR
Kan Tan - Beaverton OR
Mark L. Guenther - Portland OR
Assignee:
Tektronix, Inc. - Beaverton OR
International Classification:
G01R 1300
US Classification:
702 69
Abstract:
A jitter separation apparatus and method, based on spectrum analysis, separates deterministic jitter and random jitter using their spectral properties. Deterministic jitter is periodic and nature and exhibits a spectrum of impulses, whereas random jitter exhibits a broad, flat spectrum. A time domain histogram and a frequency domain histogram of the signal are investigated to obtain jitter components.
Method Of Identifying Spectral Impulses For Rj Dj Separation
View pageUS Patent:
6853933, Feb 8, 2005
Filed:
Feb 26, 2003
Appl. No.:
10/376107
Inventors:
Kan Tan - Beaverton OR, US
Mark L. Guenther - Portland OR, US
Mark L. Guenther - Portland OR, US
Assignee:
Tektronix, Inc. - Beaverton OR
International Classification:
G01R023/16
G01R013/00
H04B017/00
G01R013/00
H04B017/00
US Classification:
702 76, 702 69, 702 77, 375226
Abstract:
A method for identifying spectral impulses applies a window filter to an acquired waveform to produce a filtered waveform, and performs an FFT function on the filtered waveform to produce a spectrum of bins. An estimating window is located on the spectrum and centered on a target bin. Bins adjacent to the target bin are excluded and the remaining bins are used to form a noise estimate. The estimate is compared to the target bin and if the result exceeds a threshold value, a spectral impulse is identified.
Oscilloscope Having An Enhancement Filter
View pageUS Patent:
7206722, Apr 17, 2007
Filed:
Apr 1, 2005
Appl. No.:
11/097568
Inventors:
John J. Pickerd - Beaverton OR, US
Kan Tan - Beaverton OR, US
Kan Tan - Beaverton OR, US
Assignee:
Tektronix, Inc. - Beaverton OR
International Classification:
G06F 3/02
US Classification:
702190, 702189, 702194, 702197
Abstract:
An enhancement filter for an oscilloscope is disclosed wherein the enhancement filter may be initially calibrated for one or more channels and/or for one or more attenuation settings such as 50 mV per division, 100 mV per division, and/or 200 mV per division, for example. In one embodiment, a desired filter response is selected to have a modified Gaussian type filter function having an at least approximately linear phase response, wherein the transfer function of the desired filter response comprises a step response that is be stored in the oscilloscope to be used as a part of calibration system of the oscilloscope.
Transition-Density Based Time Measurement Method
View pageUS Patent:
7376524, May 20, 2008
Filed:
Mar 17, 2005
Appl. No.:
11/083612
Inventors:
Kan Tan - Beaverton OR, US
Assignee:
Tektronix, Inc. - Beaverton OR
International Classification:
G01R 13/00
H03D 1/06
H03D 1/06
US Classification:
702 69, 375348
Abstract:
A transition-density based data timing measurement method uses an estimated transition density (TD) value for an acquired data signal together with edge crossing times to estimate a data period for the acquired data signal. The estimated data period is used for symbol classification to determine a number of bits between adjacent edge crossings, which results are used to adjust the TD value. The adjusted TD value is then used to re-compute the data period.
Signal Analysis System And Calibration Method For Measuring The Impedance Of A Device Under Test
View pageUS Patent:
7405575, Jul 29, 2008
Filed:
Aug 23, 2006
Appl. No.:
11/508394
Inventors:
Kan Tan - Beaverton OR, US
John J. Pickerd - Hillsboro OR, US
Ping Qiu - Beaverton OR, US
John J. Pickerd - Hillsboro OR, US
Ping Qiu - Beaverton OR, US
Assignee:
Tektronix, Inc. - Beaverton OR
International Classification:
G01R 35/00
G01R 27/06
G01D 18/00
G01R 27/06
G01D 18/00
US Classification:
324638, 324601, 702 85, 702109
Abstract:
A method and apparatus adapted to calibrate a signal path of a signal analysis system such that digital samples of a signal under test acquired by the system are processed for representing the impedance of a device under test. The method and apparatus calibrates the signal path to characterize transfer parameters of the device under test within a spectral domain. A reference impedance (Z) is retrieved that is associated with the signal analysis system. The transfer parameters of the device under test and the reference impedance (Z) are processed to effect thereby a representation of the device under test impedance (Z) as a function of frequency.
Signal Analysis System And Calibration Method For Processing Acquires Signal Samples With An Arbitrary Load
View pageUS Patent:
7408363, Aug 5, 2008
Filed:
Aug 23, 2006
Appl. No.:
11/508697
Inventors:
Kan Tan - Beaverton OR, US
John J. Pickerd - Hillsboro OR, US
John J. Pickerd - Hillsboro OR, US
Assignee:
Tektronix, Inc. - Beaverton OR
International Classification:
G01R 35/00
G01R 27/06
G01D 18/00
G01R 27/06
G01D 18/00
US Classification:
324638, 324601, 702 85, 702109
Abstract:
A method and apparatus adapted to calibrate a signal path of a signal analysis system such that digital samples acquired by the system are processed for representing an arbitrary impedance loading of the device under test. The method and apparatus calibrates the signal path to characterize transfer parameters of the device under test within a spectral domain. A reflection coefficient (Γ) is defined representative of an arbitrary impedance load coupled to the device under test and an equalization filter is computed to represent the loading of the device under test by the arbitrary impedance. Additional digital samples are acquired using the equalization filter to effect thereby a representation of the arbitrary impedance loading of the device under test.
Signal Analysis System And Calibration Method For Multiple Signal Probes
View pageUS Patent:
7414411, Aug 19, 2008
Filed:
Aug 23, 2006
Appl. No.:
11/508637
Inventors:
Kan Tan - Beaverton OR, US
John J. Pickerd - Hillsboro OR, US
John J. Pickerd - Hillsboro OR, US
Assignee:
Tektronix, Inc. - Beaverton OR
International Classification:
G01R 35/00
G01R 27/06
G01D 18/00
G01R 27/06
G01D 18/00
US Classification:
324601, 324638, 324 7622, 702 85, 702109
Abstract:
A method and apparatus adapted to calibrate signal path of a signal analysis system such that loading effects of additional probes are substantially removed from the measurement. A signal under test from a device under test is coupled to a test probe and used with selectable impedance loads in the test probe to acquires sets of samples for characterizing transfer parameters of the device under test and compute open circuit voltages at the test probe. Other probes are coupled to the device under test and a set of measurement samples are acquired via the test probe. An equalization filter in either the frequency or time domain is computed from the open circuit voltage and measurement samples for reducing signal errors attributable to the measurement loading of the device under test by the test probe and other probes.
Signal Analysis System And Calibration Method
View pageUS Patent:
7460983, Dec 2, 2008
Filed:
Aug 23, 2006
Appl. No.:
11/508460
Inventors:
John J. Pickerd - Hillsboro OR, US
Kan Tan - Beaverton OR, US
William A. Hagerup - Portland OR, US
Rolf P. Anderson - Portland OR, US
Sharon M. Mc Masters - Sherwood OR, US
Kan Tan - Beaverton OR, US
William A. Hagerup - Portland OR, US
Rolf P. Anderson - Portland OR, US
Sharon M. Mc Masters - Sherwood OR, US
Assignee:
Tektronix, Inc. - Beaverton OR
International Classification:
G06F 19/00
G06F 17/40
G06F 17/40
US Classification:
702190, 702 85, 702 86, 702 90, 702104, 702108, 702109, 702116, 702189, 708300, 708314, 708321
Abstract:
A method and apparatus adapted to calibrate a signal path of a signal analysis system such that loading effects of the system are substantially removed from measurements of a device under test. A signal under test from the device under test is coupled to a test probe in the signal path and used with selectable impedance loads in the test probe to characterize transfer parameters of the device under test. An equalization filter in either the frequency or time domain is computed from the device under test transfer parameters for reducing in signal error attributable to the measurement loading of the device under test.