US Patent:
20210334677, Oct 28, 2021
Inventors:
- ARMONK NY, US
Braulio Gabriel Dumba - Elmsford NY, US
Jun Duan - Yorktown Heights NY, US
Matthew Staffelbach - White Plains NY, US
Emrah Zarifoglu - San Mateo CA, US
Umar Mohamed Iyoob - Pflugerville TX, US
Manish Mahesh Modh - Cedar Park TX, US
International Classification:
G06N 5/04
G06N 20/00
Abstract:
A machine learning assessment system is provided. The system identifies multiple datasets and multiple machine learning (ML) modeling algorithms based on the client profile. The system assesses a cost of data collection for each dataset of the multiple datasets. The system assesses a performance metric for each ML modeling algorithm of the multiple modeling algorithms. The system recommends a dataset from the multiple datasets and an ML modeling algorithm from the multiple ML modeling algorithm based on the assessed costs of data collection for the multiple datasets and the assessed performance metrics for the multiple ML modeling algorithms.