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Jeffrey B Bindell

from Orlando, FL
Age ~83

Jeffrey Bindell Phones & Addresses

  • 9222 Wickham Way, Orlando, FL 32836 (407) 876-1403 (407) 876-7467
  • Allentown, PA
  • Port Charlotte, FL
  • Laton, CA
  • New York, NY
  • 9222 Wickham Way, Orlando, FL 32836 (407) 341-7067

Work

Company: Nanospective corp Sep 2018 Position: Nanospective fellow

Education

School / High School: Polytechnic Institure of Brooklyn (Bs, Ms, Phd) Now Nyu 1968

Emails

r***l@mindspring.com

Industries

Higher Education

Resumes

Resumes

Jeffrey Bindell Photo 1

Nanospective Fellow

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Location:
Orlando, FL
Industry:
Higher Education
Work:
Nanospective Corp
Nanospective Fellow

University of Central Florida
Lecturer
Education:
Polytechnic Institure of Brooklyn (Bs, Ms, Phd) Now Nyu 1968

Publications

Us Patents

Scanning Electron Microscope/Energy Dispersive Spectroscopy Sample Preparation Method And Sample Produced Thereby

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US Patent:
6362475, Mar 26, 2002
Filed:
Jun 22, 1999
Appl. No.:
09/337966
Inventors:
Jeffrey B. Bindell - Orlando FL
Frederick A. Stevie - Orlando FL
Catherine Vartuli - Orlando FL
Assignee:
Agere Systems Guardian Corp. - Orlando FL
International Classification:
G01N 128
US Classification:
250307, 250309, 250310, 25049221, 2504922, 438690, 438691
Abstract:
A method of preparing a monolithic structure for scanning electron microscope/energy dispersive spectroscopy (SEM/EDS) and a sample produced by way of the method. In one embodiment, the method includes: (1) aiming a focused ion beam at a location behind or beneath an area of interest in the monolithic structure and (2) employing the focused ion beam to remove at least a portion of an interaction volume of material beneath the area of interest. The area of interest preferably remains substantially intact for the spectroscopy.

Probe For Scanning Probe Microscopy And Related Methods

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US Patent:
6405584, Jun 18, 2002
Filed:
Oct 5, 1999
Appl. No.:
09/412130
Inventors:
Jeffrey Bruce Bindell - Orlando FL
Erik Cho Houge - Orlando FL
Larry E. Plew - St. Cloud FL
Terri Lynn Shofner - Casselberry FL
Fred Anthony Stevie - Orlando FL
Assignee:
Agere Systems Guardian Corp. - Orlando FL
International Classification:
G01B 528
US Classification:
73105, 250306, 250307
Abstract:
A scanning probe microscope includes a sensor head adjacent a stage for holding a sample, a scanning actuator for positioning the sensor head relative to the sample, and a probe carried by the sensor head. The probe preferably includes a base connected to the sensor head, a shank extending from the base at an angle offset from perpendicular to the base, and a tip connected to a distal end of the shank for contacting the sample. The angle is preferably in a range of 5 to 20Â. The tip is preferably laterally offset from the base to permit viewing of the tip without interference from the shank and the base. Thus, the location of the probe tip relative to the sample may be more easily determined.

Probe Tip Locator Having Improved Marker Arrangement For Reduced Bit Encoding Error

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US Patent:
6425189, Jul 30, 2002
Filed:
Apr 20, 2000
Appl. No.:
09/552892
Inventors:
Jeffrey B. Bindell - Orlando FL
Erik C. Houge - Orlando FL
Larry E. Plew - St. Cloud FL
Frederick A. Stevie - Orlando FL
Assignee:
Agere Systems Guardian Corp. - Orlando FL
International Classification:
G01B 900
US Classification:
33555, 33502, 33706
Abstract:
A probe tip locator for, and method of, use in determining a location of a probe tip relative to the probe tip locator comprising sets of discrete location markers in which numbers and positions of the location markers in each of the sets are employable uniquely to identify corresponding specific locations on the probe tip locator, the sets being distributed about the probe tip locator to avoid unbalanced partial encroachments into both sides of a scanpath of the probe tip by location markers in sets normally adjacent the scanpath thereby to prevent an erroneous determination of location caused by unbalanced partial encroachments of the location markers into both sides of the scanpath as the probe tip traverses the scanpath.

Probe Having A Microstylet

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US Patent:
6727720, Apr 27, 2004
Filed:
Aug 28, 2001
Appl. No.:
09/941085
Inventors:
Erik C. Houge - Orlando FL
Ryan K. Maynard - Orlando FL
John M. McIntosh - Orlando FL
Larry E. Plew - St. Cloud FL
Jeffrey B. Bindell - Orlando FL
Assignee:
Agere Systems Inc. - Allentown PA
International Classification:
G01R 3102
US Classification:
324761, 324754, 257734
Abstract:
A probe comprising a probe body having a body longitudinal axis and a shoulder, and a microstylet mechanically coupled to the shoulder, and a method of manufacturing the same. The microstylet extends from the shoulder and has a microstylet longitudinal axis coincident the body longitudinal axis with the microstylet having a cross section substantially smaller than a cross section of the probe body.

Method Of Determining The Shape Of A Probe For A Stylus Profilometer

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US Patent:
20020062572, May 30, 2002
Filed:
Nov 30, 2000
Appl. No.:
09/727380
Inventors:
Jeffrey Bindell - Orlando FL, US
Erik Houge - Orlando FL, US
Larry Plew - St. Cloud FL, US
Terri Shofner - Casselberry FL, US
Fred Stevie - Orlando FL, US
International Classification:
G01B005/20
US Classification:
033/546000, 033/559000
Abstract:
A method of characterizing the shape of a probe element for a scanning probe microscope including using two test pattern surfaces of known configuration, the first surface having a pointed wedge-shaped tip and the second surface having an hour-glass type cross-section, wherein the surfaces are scanned to generate scan lines having curved transition zones that are geometrically matched in order to generate a probe characteristic representation curve, wherein the probe characteristic representation curve is a graphic representation of the shape of the tip of the probe.

Fabrication Of Semiconductive Devices

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US Patent:
41078357, Aug 22, 1978
Filed:
Feb 11, 1977
Appl. No.:
5/767681
Inventors:
Jeffrey Bruce Bindell - Allentown PA
Edward Franklin Labuda - Allentown PA
William Michael Moller - Allentown PA
Assignee:
Bell Telephone Laboratories, Incorporated - Murray Hill NJ
International Classification:
B01J 1700
US Classification:
29590
Abstract:
An improved Schottky barrier connection is made to a desired region of a silicon wafer by implanting the region with ions to peak at a particular depth; depositing a suitable contact material, such as platinum, over such region; and then heating the wafer to react the platinum and the silicon such that the interface between the platinum-silicide and the silicon penetrates beyond the peak depth of the implant, some of the encountered dopant ions being accumulated at the advancing interface in snowplow fashion. There results a narrowed and concentrated layer of implanted ions localized just below the interface of the silicide and the silicon. The presence of this layer permits conduction in the forward direction at lower applied voltages without substantially degrading the reverse blocking characteristics.

Probe Tip Locator

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US Patent:
61786535, Jan 30, 2001
Filed:
Nov 20, 1998
Appl. No.:
9/196827
Inventors:
Joseph Edward Griffith - Berkeley Heights NJ
Charles E. Bryson - Sunnyvale CA
Jeffrey Bruce Bindell - Orlando FL
Assignee:
Lucent Technologies Inc. - Murray Hill NJ
International Classification:
G01B 900
G01B 500
US Classification:
33555
Abstract:
A probe tip locator for use in determining the x-axis location and y-axis location of a probe tip of a microscope relative to the locator, the locator comprising a plurality of first reference lines parallel in a first direction, each of the first reference lines representing a predetermined x-axis location of the probe tip; a plurality of sets of parallel encoded bit fields, each one of the sets corresponding to one of the first reference lines; and a plurality of second reference lines parallel in a second direction, each one of the second reference lines intersecting at least one of the first reference lines at an acute angle, such that a scan of a portion of the locator is used to determine the x-axis location and y-axis location of the probe tip relative to the probe tip locator by movement of the probe tip relative to the probe tip locator.

Method Of Mapping A Surface Using A Probe For Stylus Nanoprofilometry Having A Non-Circular Cross-Section

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US Patent:
62501437, Jun 26, 2001
Filed:
Aug 31, 1999
Appl. No.:
9/386711
Inventors:
Jeffrey B. Bindell - Orlando FL
Erik C. Houge - Orlando FL
Larry E. Plew - St. Cloud FL
Terri L. Shofner - Casselberry FL
Frederick A. Stevie - Orlando FL
Assignee:
Agere Systems Guardian Corp. - Orlando FL
International Classification:
G01H 2300
US Classification:
73105
Abstract:
The present invention provides an apparatus and a method of manufacturing that apparatus. More specifically, to a method of manufacturing probes for a stylus nanoprofilometer having a non-circular probe tip geometry and a method of measurement of semiconductor wafer features using the same. In one embodiment, the probe comprises an upper portion couplable to the stylus nanoprofilometer and a probative portion coupled to the upper portion. The probative portion has a cross section that is substantially thinner than a cross section of the upper portion. The probative portion further has a terminus distal the upper portion and a reentrant angle from the terminus to the upper portion.
Jeffrey B Bindell from Orlando, FL, age ~83 Get Report