Jason Saw Phones & Addresses
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1691 Mountaire Ln, San Jose, CA 95138
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Los Angeles, CA
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Fremont, CA
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Albany, CA
Business Records
Name / Title
Company / Classification
Phones & Addresses
President
INVANTEST, INC
Business Services · Financial Advisor
Business Services · Financial Advisor
2860 Zanker Rd SUITE 101, San Jose, CA 95134
(408) 456-0400
(408) 456-0400
Publications
Isbn (Books And Publications)
Sant Jordi: Estendard DEuropa
View page
Author
Jason Saw
ISBN #
8482562142
Us Patents
System, Method, And Computer Program Product For Testing And Re-Testing Integrated Circuits
View pageUS Patent:
8185337, May 22, 2012
Filed:
Oct 11, 2010
Appl. No.:
12/902090
Inventors:
Paul Brandariz - San Jose CA, US
Robert Easton - San Jose CA, US
Jason Saw - San Jose CA, US
Robert Easton - San Jose CA, US
Jason Saw - San Jose CA, US
Assignee:
Invantest, Inc. - San Jose CA
International Classification:
G01R 31/00
G01R 31/14
G01R 31/26
G01R 31/14
G01R 31/26
US Classification:
702118, 702117, 438 14
Abstract:
A system, method, and computer program product are provided for testing and re-testing integrated circuits. In use, a group of integrated circuits is tested. In use, before finishing the test, at least one of the integrated circuits of the group is re-tested.
System, Method, And Computer Program Product For Testing And Re-Testing Integrated Circuits
View pageUS Patent:
7835881, Nov 16, 2010
Filed:
Apr 24, 2007
Appl. No.:
11/739610
Inventors:
Maxim Zverev - Sunnyvale CA, US
Paul Brandariz - San Jose CA, US
Robert Easton - San Jose CA, US
Jason Saw - San Jose CA, US
Paul Brandariz - San Jose CA, US
Robert Easton - San Jose CA, US
Jason Saw - San Jose CA, US
Assignee:
Invantest, Inc. - San Jose CA
International Classification:
G01R 31/00
G01R 31/14
G01R 31/26
G01R 31/14
G01R 31/26
US Classification:
702118, 702117, 438 14
Abstract:
A system, method, and computer program product are provided for testing and re-testing integrated circuits. In use, a group of integrated circuits is tested. In use, before finishing the test, at least one of the integrated circuits of the group is re-tested.