Dean C. Wormell - Westford MA Fred R. Huettig - Boston MA Andrew J. Jankevics - Acton MA Michael Winter - New Haven CT James L. Sopchak - Arlington MA
Assignee:
United Technologies Corporation - Hartford CT
International Classification:
G01P 518
US Classification:
364509
Abstract:
A PIV system provides a bias velocity component to each flow field speckle pattern recorded on a video array by rastering each corresponding recorded electrical image pattern by a select number of raster lines in the time interval prior to recording a succeeding speckle pattern image, thereby providing a calibrated spatial offset between recorded images.