James Kuveikis from East Northport, NY, age 64

Resumes

Senior Electrical Engineer

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Location:

459 Richardsville Rd, Carmel, NY 10512

Industry:

Electrical/Electronic Manufacturing

Work:

Advanced Testing Technologies, Inc.
Senior Electrical Engineer

Education:

Polytechnic Institute of New York University
Masters, Bachelors, Bachelor of Science In Electrical Engineering, Master of Science In Electrical Engineering, Electrical Engineering

Skills:

Electronics
Electrical Engineering
Testing
Engineering
Project Engineering
Instrumentation
Engineering Management
Scada
Power Distribution
Automation
Power Systems
Electricians
Pcb Design
Microcontrollers
Embedded Systems
Manufacturing

Publications

Us Patents

Method And System For Simulating Test Instruments And Instrument Functions

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US Patent:

8489381, Jul 16, 2013

Filed:

Mar 5, 2012

Appl. No.:

13/411697

Inventors:

Robert Spinner - East Northport NY, US
Eli Levi - Dix Hills NY, US
William Harold Leippe - Coram NY, US
Emery Korpi - Syosset NY, US
Michael Lai - Smithtown NY, US
James Kuveikis - Bohemia NY, US
Richard E. Chalmers - Northport NY, US
Richard Engel - Ridge NY, US
Peter F. Britch - Miller Place NY, US
William Biagiotti - St. James NY, US
David Howell - Smithfield VA, US

Assignee:

Advanced Testing Technologies, Inc. - Hauppauge NY

International Classification:

G06F 9/44
G06F 13/10
G06F 13/12

US Classification:

703 20, 702121

Abstract:

Method and system to configure a common set of electronic components using software in order to simulate different electronic, mechanical and/or electro-mechanical instruments or instrument functions. For each instrument function or traditional mode of operation to be simulated, software models are created which when directed to the electronic components, cause the electronic components to respond to input in the same manner that the actual, traditional physical instrument would respond to satisfy the same test requirement input. The software models are preferably stored in a model repository which is searchable to enable a user to select the instrument function or traditional mode of operation to be simulated with the corresponding model being provided to the electronic components. Once the model, i. e. , a function for each synthetic element, is downloaded and the electronic components configured according to the model functions, testing of the assemblies or other UUTs can begin.

Method And System For Simulating Test Instruments And Instrument Functions

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US Patent:

20070050166, Mar 1, 2007

Filed:

Sep 1, 2006

Appl. No.:

11/514717

Inventors:

Robert Spinner - East Northport NY, US
Eli Levi - Dix Hills NY, US
William Leippe - Coram NY, US
Emery Korpi - Syosset NY, US
Michael Lai - Smithtown NY, US
James Kuveikis - Bohemia NY, US
Richard Chalmers - Northport NY, US
Richard Engel - Ridge NY, US
Peter Britch - Miller Place NY, US
William Biagiotti - St. James NY, US
David Howell - Smithfield VA, US

International Classification:

G06F 19/00
G01D 3/00
G01M 19/00
G01P 21/00
G01R 35/00

US Classification:

702108000

Abstract:

Method and system to configure a common set of electronic components using software in order to simulate different electronic, mechanical and/or electro-mechanical instruments or instrument functions. For each instrument function or traditional mode of operation to be simulated, software models are created which when directed to the electronic components, cause the electronic components to respond to input in the same manner that the actual, traditional physical instrument would respond to satisfy the same test requirement input. The software models are preferably stored in a model repository which is searchable to enable a user to select the instrument function or traditional mode of operation to be simulated with the corresponding model being provided to the electronic components. Once the model, i.e., a function for each synthetic element, is downloaded and the electronic components configured according to the model functions, testing of the assemblies or other UUTs can begin.

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