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Howard B Druckerman

from Essex Junction, VT
Age ~66
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Also known as:
Henry Druckerman, Howard N
Phone and address:
19 Hawthorn Cir, Essex Junction, VT 05452
(802) 878-1407
Related to:
Jorge A Delvalle, 57
Connected to:
Ben Drucker, 112Carl Drucker, 79Cheryl L Drucker, 43Claire F Drucker, 88Cynthia K Drucker, 62David Drucker, 53Debra A Drucker, 57Emily D Drucker, 40Holly E Drucker, 70Joan L Drucker, 71

Howard Druckerman Phones & Addresses

  • 19 Hawthorn Cir, Essex Jct, VT 05452 (802) 878-1407 (802) 878-2721
  • 9 Hawthorn Cir, Essex Junction, VT 05452
  • Essex, VT
  • North River, NY
  • Red Hook, NY
  • Poughkeepsie, NY
  • Fishkill, NY
  • Port Ewen, NY
  • 19 Hawthorn Cir, Essex Jct, VT 05452 (802) 878-2721

Work

Company: Globalfoundries Nov 2019 Position: Principal member of technical staff

Education

Degree: Bachelors, Bachelor of Science School / High School: Syracuse University Specialities: Electrical Engineering

Skills

Testing • Debugging • Vlsi • Unix • Cmos • Tcl • Perl • Integration • Software Engineering • Linux • Analog • Software Development • Dft • Verilog • Embedded Systems • C++ • Programming • Test Automation • Java • Shell Scripting • C • System Architecture • Test Development • Design For Test • Databases • Javascript • Mysql • Solution Architecture • Clearcase • Visual Basic • Explosives

Languages

English • German

Interests

Backpacking • Civil Rights and Social Action • High Power Model Rocketry • Snow Skiing • Hiking • Science and Technology • Astronomy • Woodworking • Ice Hockey

Industries

Computer Hardware

Resumes

Resumes

Howard Druckerman Photo 1

Principal Member Of Technical Staff

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Location:
19 Hawthorn Cir, Essex Junction, VT 05452
Industry:
Computer Hardware
Work:
Globalfoundries
Principal Member of Technical Staff
Averasemi
Principal Member of Technical Staff
Asic North
Test Pe
Ibm 2004 - 2013
Asic Test Development Engineer
Northstar Fireworks 2004 - 2013
Fireworks Technician
Education:
Syracuse University
Bachelors, Bachelor of Science, Electrical Engineering Ketcham Hs
Syracuse University
Master of Science, Masters, Computer Engineering
Skills:
Testing
Debugging
Vlsi
Unix
Cmos
Tcl
Perl
Integration
Software Engineering
Linux
Analog
Software Development
Dft
Verilog
Embedded Systems
C++
Programming
Test Automation
Java
Shell Scripting
C
System Architecture
Test Development
Design For Test
Databases
Javascript
Mysql
Solution Architecture
Clearcase
Visual Basic
Explosives
Interests:
Backpacking
Civil Rights and Social Action
High Power Model Rocketry
Snow Skiing
Hiking
Science and Technology
Astronomy
Woodworking
Ice Hockey
Languages:
English
German

Publications

Us Patents

Ac Scan Diagnostic Method

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US Patent:
6516432, Feb 4, 2003
Filed:
Dec 22, 1999
Appl. No.:
09/469699
Inventors:
Franco Motika - Hopewell Junction NY
Phillip J. Nigh - Williston VT
Peilin Song - Wappingers Falls NY
Howard B. Druckerman - Essex Junction VT
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G01R 3128
US Classification:
714732, 714728, 714729, 714735, 714733, 714726
Abstract:
Disclosed is an alternating current (AC) scan diagnostic system in which one or a plurality of scan chains are tested by serially propagating predetermined bit patterns through the scan chain and comparing the output against an expected result. The system comprises identification phase, verifications and localization, and a characterization phases. The system is adaptable for use with on-board diagnostics and is adaptable for use with on-product clock generation systems.

Semiconductor Timing Improvement

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US Patent:
20140143748, May 22, 2014
Filed:
Nov 21, 2012
Appl. No.:
13/683228
Inventors:
- Armonk NY, US
Howard B. DRUCKERMAN - Essex Junction VT, US
Erik L. HEDBERG - Essex Junction VT, US
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION - Armonk NY
International Classification:
G06F 17/50
US Classification:
716134
Abstract:
Approaches are provided for improving timing of new and existing semiconductor products. Specifically, a method is provided implemented in a computer infrastructure having computer executable code tangibly embodied on a computer readable storage medium having programming instructions operable to set starting across chip variation assumptions using design rules. The programming instructions are further operable to design a test chip and/or product chip using the starting across chip variation assumptions to close timing of the design. The programming instructions are further operable to place devices in the test chip and/or product chip. The programming instructions are further operable to compare performance of the devices within the test chip and/or the product chip to the starting across chip variation assumptions. The programming instructions are further operable to adjust the starting across chip variation assumptions based on the measured performance of the test chip and/or the product chip.
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Howard B Druckerman from Essex Junction, VT, age ~66 Get Report