Holt P Bui

358 Kylemore Ct, San Jose, CA 95136

Semiconductors

Ibm
Surface Scientist
Western Digital Jul 2016 - Jun 2018
Principal Engineer
Western Digital Jul 2014 - Jul 2016
Senior Staff Engineer
Ion-Tof Usa Jul 2012 - Jun 2014
Field Service Engineer
Independent Scientist Jan 2010 - Dec 2012
Consulting Scientist

University of Delaware 2005 - 2012
Doctorates, Doctor of Philosophy, Philosophy, Chemistry Lebanon Valley College 2000 - 2004
Bachelors, Bachelor of Science, Chemistry

Characterization
Afm
Xps
Surface Chemistry
Thin Films
Surface Analysis
Tof Sims
Sputtering
Analytical Chemistry
Materials Science
Cvd
Scanning Electron Microscopy
Nir Spectroscopy
Sims
Aes
Xrd
Multivariate Analysis
Thin Film Characterization
Ion Milling
Matlab
Uv/Vis Spectroscopy
Stm
Sem
Edx
Contact Angle
Uv Vis
Scanning Probe Microscopy
Nir
Ir Spectroscopy
Chemistry
Chemometrics
Self Assembled Monolayers
Fib
Pvd
Thermal Evaporation
Sputter Deposition
Vacuum Deposition
Pls
Process Analytical Technology
Raman
Hplc Ms
Image Analysis
Data Analysis
Python
Research
Microsoft Office
Spectroscopy
Research and Development
Ftir
Atr Ftir

Process Analytical Technology
Multivariate Data Analysis
Surface Chemistry
Surface and Interfacial Analysis
Scientific Consulting

English
Vietnamese

Independent Scientist
Newark, DE
Jan 2010 to Dec 2012
Scientific Consultant
University of Delaware Surface Analysis Facility

Aug 2007 to Jul 2012
Research Associate
University of Delaware

Aug 2005 to Jul 2012
Research Assistant
Brimrose Corporation of America

May 2004 to Aug 2005
Applications Engineer
Bayer HealthCare

Sep 2003 to May 2004
Method Development Intern
Dean Foods

May 2003 to May 2004
Quality Assurance Intern
Mars Incorporated

May 2002 to Jan 2003
Research and Development Intern

University of Delaware
Jan 2005 to Jan 2011
Ph.D. in Surface and Interface Analysis
Lebanon Valley College
Jan 2000 to Jan 2004
BSc in Chemistry

Chemistry, Surface Chemistry, Surface Analysis, Material Science, Analytical Chemistry, Chemometrics, Multivariate Analysis, Thin Films, Deposition, Spin Coating, PVD, CVD, Sputtering, Auger Electron Spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), Time-of-Flight Secondary Ion Mass spectrometry, Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Secondary Electron Microscopy (SEM), Energy Dispersive X-ray Spectroscopy (EDS/EDAX), FT-IR, ATR, Contact Angle, NIR, UV-Vis, Raman, NMR, HPLC, GC-MS, LC-MS, FAAS, ISE, XRD, Chemometrics, Image analysis, PLS, PCA, PCR,