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Hermann Wollnik Phones & Addresses

  • Santa Fe, NM
  • Seattle, WA
  • Los Alamos, NM

Work

Company: New mexico state university 2004 to 2016 Position: Professor

Education

Degree: Doctorates, Doctor of Philosophy School / High School: Technical University of Munich 1954 to 1964 Specialities: Physics, Philosophy

Languages

English • German

Industries

Research

Resumes

Resumes

Hermann Wollnik Photo 1

Professor

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Location:
Santa Fe, NM
Industry:
Research
Work:
New Mexico State University 2004 - 2016
Professor

University Giessen, Germany 1964 - 2001
Professor

Iontec 1964 - 2001
Professor

Gulf Oil 1957 - 1957
Scientific Collaborator
Education:
Technical University of Munich 1954 - 1964
Doctorates, Doctor of Philosophy, Physics, Philosophy
University of Oklahoma 1956 - 1957
Bachelors, Bachelor of Science, Physics
Languages:
English
German

Publications

Us Patents

Parallel Plate Electrode Arrangement Apparatus And Method

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US Patent:
8067747, Nov 29, 2011
Filed:
May 22, 2006
Appl. No.:
12/301728
Inventors:
Hermann Wollnik - Santa Fe NM, US
Assignee:
Shimadzu Corporation - Kyoto-fu
International Classification:
H01J 3/14
US Classification:
250396R, 250281, 250282, 250290, 250292
Abstract:
A system for guiding an ion beam along an axis (Z), comprises at least one section having upper flat plate strip electrodes (Iu, and ) and lower flat plate strip electrodes (Id, and ) for producing at least one electric field of substantially symmetric in a parallel direction and substantially antisymmetric in a perpendicular direction with respect to a plane including a beam axis and a fringe-field boundary that is located at the end of the at least one section.

Time-Of-Flight Mass Spectrometer And A Method Of Analysing Ions In A Time-Of-Flight Mass Spectrometer

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US Patent:
20100072362, Mar 25, 2010
Filed:
Dec 7, 2007
Appl. No.:
12/518236
Inventors:
Roger Giles - Holmfirth, GB
Michael Sudakov - St. Petersburg, RU
Hermann Wollnik - Santa Fe NM, US
International Classification:
H01J 49/40
H01J 3/40
US Classification:
250287, 250489
Abstract:
A time-of-flight mass spectrometer () comprises an ion source a segmented linear ion device () for receiving sample ions supplied by the ion source and a time-of-flight mass analyser for analysing ions ejected from the segmented device. A trapping voltage is applied to the segmented device to trap ions initially into a group of two or more adjacent segments and subsequently to trap them in a region of the segmented device shorter than the group of segments. The trapping voltage may also be effective to provide a uniform trapping field along the length of the device ().

Co-Axial Time-Of-Flight Mass Spectrometer

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US Patent:
20100072363, Mar 25, 2010
Filed:
Dec 7, 2007
Appl. No.:
12/518240
Inventors:
Roger Giles - Holmfirth, GB
Michael Sudakov - St. Petersburg, RU
Hermann Wollnik - Santa Fe NM, US
International Classification:
B01D 59/44
US Classification:
250287
Abstract:
A co-axial time-of-flight mass spectrometer having a longitudinal axis and first and second ion mirrors at opposite ends of the longitudinal axis. Ions enter the spectrometer along an input trajectory offset from the longitudinal axis and after one or more passes between the mirrors ions leave along an output trajectory offset from the longitudinal axis for detection by an ion detector. The input and output trajectories are offset from the longitudinal axis by an angle no greater than formula (I): where Dis the or the minimum transverse dimension of the ion mirror and L is the distance between the entrances of the ion mirrors.

Curtain Gas Filter For Mass- And Mobility-Analyzers That Excludes Ion-Source Gases And Ions Of High Mobility

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US Patent:
20110174966, Jul 21, 2011
Filed:
Sep 17, 2009
Appl. No.:
13/121065
Inventors:
Hermann Wollnik - Santa Fe NM, US
Alexander Tarassov - Mars PA, US
Gary A. Eiceman - Las Cruces NM, US
Assignee:
SHIMADZU CORPORATION - Kyoto-shi, Kyoto-fu
International Classification:
H01J 49/40
H01J 49/26
US Classification:
250286, 250288
Abstract:
A filter for a mass- or mobility-spectrometer that bars gases or vapors of a high-pressure ion source, as well as ions of high mobility and charged droplets, from entering an evacuated mass spectrometer or a mobility spectrometer at a lower pressure than the filter. The buffer gas of the high pressure ion source is blown into the volume of this filter directly or through tubes from where buffer gas and embedded ions are sucked through the aperture of a diaphragm or through an aperture of a capillary mainly from an “extraction volume” filled with a separately supplied clean gas, into which ions of interest are pushed by electric fields formed by electrodes that are substantially rotational symmetric around the “extraction volume” and a substantially flat electrode with respect to an axis of ion extraction and the end of the capillary and the end of a coaxial tube surrounding the capillary.

Ion Source For An Ion Mobility Spectrometer

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US Patent:
20200312646, Oct 1, 2020
Filed:
Mar 25, 2019
Appl. No.:
16/363703
Inventors:
- Charlotte NC, US
Gary A. Eiceman - Las Cruces NM, US
Hermann Wollnik - Santa Fe NM, US
International Classification:
H01J 49/04
H01J 49/10
G01N 27/62
Abstract:
An ion mobility spectrometer for analyzing a vapor sample including a multi-ring ion source for receiving a vapor sample, wherein the multi-ring ion source includes a series of rings, wherein each ring of the multi-ring ion source includes an ionizing layer on an inner surface thereof, for charging at least a portion of the vapor sample and creating an ionized vapor sample.

Ion-Mobility Spectrometer Including A Decelerating Ion Gate

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US Patent:
20150221489, Aug 6, 2015
Filed:
Mar 15, 2012
Appl. No.:
14/384039
Inventors:
Hermann Wollnik - Santa Fe NM, US
Gary A. Eiceman - Las Cruces NM, US
International Classification:
H01J 49/00
G01N 27/62
H01J 49/04
Abstract:
An ion mobility spectrometer having an ion source for generating ions; an ion detector for recording ions, and a number of substantially flat diaphragm electrodes arranged substantially perpendicular to a straight system axis that passes through the apertures in said diaphragms, with the diaphragms being arranged in a series of cells with each cell including an entrances and an exit diaphragm and a short region in between. The exit diaphragm of one cell is identical to the entrance diaphragm of the next cell, and the cells of said ion mobility spectrometer are grouped into three parts: an ion-beam forming region, an ion analyzing region, and a decelerating ion gate.
Hermann Annette Wollnik from Santa Fe, NM, age ~89 Get Report