Hans Sippach Phones & Addresses
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New Fairfield, CT
Publications
Us Patents
Off-Chip Time-Delayed Integration Area Array Fraunhofer Line Discriminator
View pageUS Patent:
47243260, Feb 9, 1988
Filed:
Jun 5, 1986
Appl. No.:
6/871057
Inventors:
Sherman K. Poultney - Wilton CT
Hans G. Sippach - New Fairfield CT
Joseph H. Oberheuser - Trumbull CT
Hans G. Sippach - New Fairfield CT
Joseph H. Oberheuser - Trumbull CT
Assignee:
The Perkin-Elmer Corporation - Norwalk CT
International Classification:
G01N 2164
US Classification:
2504581
Abstract:
An apparatus for determining the fluorescence of materials in a scene which includes optical means to collect radiation from the scene. Means are provided to divide the collected radiation into first and second beam paths. The first beam path traverses a first filter centered on a Fraunhofer line and having a passband which extends into the solar continuum on either side of the Fraunhofer line. The second beam path traverses the first filter and a second filter, also centered on the Fraunhofer line, with a passband on the order of half the bandwidth, at half-depth, of the Fraunhofer line. Means are provided to image the first and second beams onto first and second detector arrays, respectively. The image on the first detector array is registered with the image on the second detector array. Co-adding means are provided whereby successive detector pixels at successive time intervals corresponding to a single point on the ground are added and averaged.