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Gary S Blanpied

from Lexington, SC
Age ~75
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Also known as:
Gary Blunpied, Gary Branpied, Gary D
Phone and address:
336 Southbrook Dr, Lexington, SC 29073
(803) 520-7092
Related to:
Jacquelyn DorrohIsabelle A Blanpied, 41Stella BlanpiedChristopher B Blanpied, 43Deborah R Blanpied, 70
Connected to:
Michael L Blanpied, 63William E Blanpied, 97Frank Blanquet, 74Carmelo Blanquicett, 49Paul A Blanquiz, 31Valerie Blanquiz, 39Nicole Blanscett, 36Ryan M Blanscett, 43Heather N Blansett, 29Joshua Blansett, 40

Gary Blanpied Phones & Addresses

  • 336 Southbrook Dr, Lexington, SC 29073 (803) 520-7092
  • 57 Circleview Dr, Lexington, SC 29072 (803) 356-8020
  • Los Alamos, NM
  • Ramona, CA
  • Columbia, SC
  • San Diego, CA
  • 22449 Casa De Carol, Ramona, CA 92065

Work

Company: Irmo high school - school district five of lexington & richland counties, south carolina Aug 2019 Position: Secondary mathematics teacher

Education

Degree: Doctorates, Doctor of Philosophy School / High School: The University of Texas at Austin 1975 to 1977 Specialities: Physics, Philosophy

Skills

Physics • Mathematical Modeling • Matlab • Science • Data Analysis • Research • Fortran • Monte Carlo Simulation • Scientific Computing • Machine Learning • Sensors • Numerical Analysis • C++ • Python • Simulations • Programming • Latex • Algorithms • Spectroscopy • Linux • C • Experimentation • Statistics • Teaching • Software Engineering

Emails

g***[email protected]

Industries

Research

Resumes

Resumes

Gary Blanpied Photo 1

Secondary Mathematics Teacher

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Location:
336 Southbrook Dr, Lexington, SC 29073
Industry:
Research
Work:
Irmo High School - School District Five of Lexington & Richland Counties, South Carolina
Secondary Mathematics Teacher
Dsicmm Group 2008 - 2015
Senior Nuclear Physicist
Department of Physics and Astronomy University of South Carolina Aug 1979 - May 2008
Professor
University of South Carolina Aug 1979 - May 2008
Professor Emeritus
Education:
The University of Texas at Austin 1975 - 1977
Doctorates, Doctor of Philosophy, Physics, Philosophy Georgia Institute of Technology 1973 - 1974
Masters, Physics Auburn University 1968 - 1973
Bachelors, Physics
Skills:
Physics
Mathematical Modeling
Matlab
Science
Data Analysis
Research
Fortran
Monte Carlo Simulation
Scientific Computing
Machine Learning
Sensors
Numerical Analysis
C++
Python
Simulations
Programming
Latex
Algorithms
Spectroscopy
Linux
C
Experimentation
Statistics
Teaching
Software Engineering

Publications

Us Patents

Imaging Based On Cosmic-Ray Produced Charged Particles

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US Patent:
8536527, Sep 17, 2013
Filed:
Aug 27, 2009
Appl. No.:
13/061491
Inventors:
Christopher L. Morris - Los Alamos NM, US
Larry Joe Schultz - Los Alamos NM, US
Jesse Andrew Green - Los Alamos NM, US
Michael James Sossong - Ramona CA, US
Konstantin N. Borozdin - Los Alamos NM, US
Alexei V. Klimenko - Santa Fe NM, US
Gary Blanpied - Lexington SC, US
Vladimir Tumakov - Aliso Viejo CA, US
Kolo Wamba - San Diego CA, US
Assignee:
Decision Sciences International Corporation - Poway CA
Los Alamos National Security, LLC - Los Alamos NM
International Classification:
G01N 23/08
G01N 23/00
US Classification:
250307, 250306, 2503581
Abstract:
Techniques, apparatus and systems for obtaining tomographic images of a volume of interest by using charged particle tomography detection systems.

Measuring Momentum For Charged Particle Tomography

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US Patent:
20080265156, Oct 30, 2008
Filed:
Oct 24, 2007
Appl. No.:
11/977410
Inventors:
Christopher Morris - Los Alamos NM, US
Andrew Mcleod Fraser - Los Alamos NM, US
Larry Joe Schultz - Los Alamos NM, US
Konstantin N. Borozdin - Los Alamos NM, US
Alexei Vasilievich Klimenko - Maynard MA, US
Michael James Sossong - Los Alamos NM, US
Gary Blanpied - Lexington SC, US
International Classification:
H01J 47/00
US Classification:
250305
Abstract:
Methods, apparatus and systems for detecting charged particles and obtaining tomography of a volume by measuring charged particles including measuring the momentum of a charged particle passing through a charged particle detector. Sets of position sensitive detectors measure scattering of the charged particle. The position sensitive detectors having sufficient mass to cause the charged particle passing through the position sensitive detectors to scatter in the position sensitive detectors. A controller can be adapted and arranged to receive scattering measurements of the charged particle from the charged particle detector, determine at least one trajectory of the charged particle from the measured scattering; and determine at least one momentum measurement of the charged particle from the at least one trajectory. The charged particle can be a cosmic ray-produced charged particle, such as a cosmic ray-produced muon. The position sensitive detectors can be drift cells, such as gas-filled drift tubes.

Inspection Of Objects Based On Primary And Secondary Scanning

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US Patent:
20160356913, Dec 8, 2016
Filed:
Aug 22, 2016
Appl. No.:
15/243819
Inventors:
- Poway CA, US
Shawn McKenney - Ramona CA, US
Robert Whalen - La Jolla CA, US
Gary Blanpied - Ramona CA, US
Andre Lehovich - San Diego CA, US
Priscilla Kurnadi - San Diego CA, US
International Classification:
G01V 5/00
G01N 23/04
Abstract:
Techniques and systems for two scanners to inspect objects based on an initial scanning of all objects and an additional scanning of objects that are determined by the initial scanning to potentially include one or more suspect regions. In one implementation, a system can include a primary scanner for performing the initial or primary scanning and a smaller secondary scanner for the additional or secondary scanning to provide efficient and accurate inspection of objects while maintaining a desired throughput of the inspection. In another implementation, a single scanner can be used to perform both the initial scanning and the additional scanning while maintaining a sufficient throughput of a line of objects under inspection.

Primary And Secondary Scanning In Muon Tomography Inspection

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US Patent:
20150212014, Jul 30, 2015
Filed:
Aug 21, 2013
Appl. No.:
14/423381
Inventors:
- Poway CA, US
Shawn McKenney - Ramona CA, US
Robert Whalen - La Jolla CA, US
Gary Blanpied - Ramona CA, US
Andre Lehovich - San Diego CA, US
Priscilla Kurnadi - San Diego CA, US
Assignee:
Decision Sciences International Corporation - Poway CA
International Classification:
G01N 23/04
G01N 23/20
G01T 1/167
Abstract:
Techniques and systems for using cosmic ray-produced muons to inspect objects based on an initial scanning of all objects and an additional scanning of objects that are determined by the initial scanning to potentially include one or more suspect regions. In one implementation, a system can include a primary scanner for performing the initial or primary scanning and a smaller secondary scanner for the additional or secondary scanning to provide efficient and accurate inspection of objects while maintaining a desired throughput of the inspection. In another implementation, a single scanner can be used to perform both the initial scanning and the additional scanning while maintaining a sufficient throughput of a line of objects under inspection.
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Gary S Blanpied from Lexington, SC, age ~75 Get Report