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Frederick Waltz Phones & Addresses

  • Minneapolis, MN
  • Perris, CA
  • Covina, CA
  • San Bernardino, CA
  • Upland, CA
  • San Dimas, CA
  • Rancho Cucamonga, CA
  • Temecula, CA
  • Springfield, MA
  • Ontario, CA
  • Newport Coast, CA

Resumes

Resumes

Frederick Waltz Photo 1

Frederick Waltz

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Frederick Waltz Photo 2

Faculty Member At University Of Phoenix Certified Correctional Professional At Ramsey County Doc

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Location:
Greater Minneapolis-St. Paul Area
Industry:
Higher Education
Experience:
University of Phoenix (Government Administration industry): Faculty Member,  (2009-Present) Facilitate the teachings of various Criminal Justice courses by combining academic and scientific therories with real world practical experience to students of higher learning, in a substa...

Publications

Us Patents

Technique To Count Objects In A Scanned Image

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US Patent:
54037220, Apr 4, 1995
Filed:
Jul 14, 1994
Appl. No.:
8/272996
Inventors:
Steven P. Floeder - Arden Hills MN
Josef A. Graessle - Northine-Westphalia, DE
John C. Schultz - Afton MN
Werner R. Schwarz - Northine-Westphalia, DE
Frederick M. Waltz - Mendota Heights MN
Assignee:
Minnesota Mining and Manufacturing Company - Saint Paul MN
International Classification:
C12Q 100
US Classification:
435 39
Abstract:
The present invention relates to a method and apparatus for counting the number of microorganism colonies present on a disposable microorganism culturing device having a substantially planar substrate. The preferred apparatus of the present invention includes an LED bar illuminating the surface of the substrate and a linear array of SELFOC lenses which focus the light reflected off of the substrate onto a linear CCD sensor array. The CCD sensor array is connected to a microprocessor which analyzes the raster-scanned data using the preferred algorithm. The preferred algorithm uses the sigma-shaped neighborhood for image processing. The preferred algorithm passes the sigma region across the image in a raster-scanned order to detect object starts and merges which yield a colony count for a scanned microorganism culturing device.

Isbn (Books And Publications)

Machine Vision Systems Integration in Industry: Proceedings

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Author

Frederick M. Waltz

ISBN #

0819404535

Machine Vision Systems Integration: Critical Reviews

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Author

Frederick M. Waltz

ISBN #

0819404713

Machine Vision Systems Integration: Proceedings of a Conference Held 6-7 November 1990, Boston, Massachusetts

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Author

Frederick M. Waltz

ISBN #

0819404705

Machine Vision Architectures, Integration, and Applications: 12-15 November 1991 Boston, Massachusetts

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Author

Frederick M. Waltz

ISBN #

0819407526

Machine Vision Applications, Architectures, and Systems Integration

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Author

Frederick M. Waltz

ISBN #

0819410241

Machine Vision Applications, Architectures, and Systems Integration II

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Author

Frederick M. Waltz

ISBN #

0819413291

Machine Vision Applications, Architectures and Systems Integration III: 31 October-2 November, 1994, Boston, Massachusetts

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Author

Frederick M. Waltz

ISBN #

0819416827

Machine Vision Applications, Architectures, and Systems Integration IV: 23-24 October, 1995, Philadelphia, Pennsylvania

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Author

Frederick M. Waltz

ISBN #

0819419613

Frederick J Waltz from Minneapolis, MN, age ~45 Get Report