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Fred Hubble Phones & Addresses

  • 2465 Northside Dr APT 206, Clearwater, FL 33761
  • Saint Petersburg, FL
  • 133 N Friendswood Dr #104, Friendswood, TX 77546
  • 180 Beaconview Ct, Rochester, NY 14617
  • 108 Harcourt Rd, Rochester, NY 14606

Resumes

Resumes

Fred Hubble Photo 1

Workforce Graduate

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Location:
Houston, TX
Industry:
Information Technology And Services
Work:

Workforce Graduate

Xerox Feb 1974 - Jan 2003
Principal Scientist

Cornell University Dept of Chemistry Jan 1972 - Dec 1973
Research Associate

Nasa Langley Research Center Apr 1, 1964 - Sep 1, 1968
Aerospace Technologist
Education:
Cornell Johnson Graduate School of Management 1972 - 1974
Master of Business Administration, Masters, Finance
Cornell University 1972 - 1974
Master of Business Administration, Masters, Finance
Florida State University 1968 - 1971
Doctorates, Doctor of Philosophy, Physics
Northeastern University 1962 - 1967
Bachelors, Bachelor of Arts, Mathematics, German Language, Liberal Arts, Physics
Randolph High School
Fred Hubble Photo 2

Fred Hubble

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Publications

Us Patents

Angular, Azimuthal And Displacement Insensitive Spectrophotometer For Color Printer Color Control Systems

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US Patent:
20020191188, Dec 19, 2002
Filed:
May 22, 2001
Appl. No.:
09/862945
Inventors:
Fred Hubble - Rochester NY, US
Tonya Love - Rochester NY, US
Daniel Robbins - Williamson NY, US
Assignee:
Xerox Corporation
International Classification:
G01J003/50
US Classification:
356/402000, 356/406000
Abstract:
An improved and lower cost color spectrophotometer, especially suitable for an on-line color printer color control system, in which plural different spectra LEDs sequentially perpendicularly illuminate a common and substantially circularly illuminated color test area, which may be variably spaced and variably oriented relative to the spectrophotometer, through a common central lens system, and also the reflected illumination therefrom may be measured at 45 degrees thereto by averaging the outputs of photodetectors spaced around that circularly illuminated color test area, to provide reduced sensitivity to the variable angular or azimuthal orientation of the color test area relative to the spectrophotometer, and which photodetectors may be so illuminated by 1:1 optics for spatial insensitivity.

Color Measurement Of Angularly Color Variant Textiles

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US Patent:
20020191189, Dec 19, 2002
Filed:
Nov 28, 2001
Appl. No.:
09/994666
Inventors:
Lalit Mestha - Fairport NY, US
Fred Hubble - Rochester NY, US
Tonya Love - Rochester NY, US
Daniel Robbins - Williamson NY, US
Gary Skinner - Rochester NY, US
Assignee:
Xerox Corporation
International Classification:
G01J003/46
US Classification:
356/402000
Abstract:
A method is provided for measuring the color of irregular surface materials, including textiles which may provide dissimilar color measurements from different viewing angles, by illuminating a sampling area of the irregular surface material approximately perpendicularly thereto and measuring the color reflected from that area at a substantial angle, preferably about 45 degrees, with a plurality of separate photodetectors arrayed circularly around the illuminated sampling area of irregular surface material to receive the reflected illumination from substantially opposing directions and at a substantial angle to the illuminated area, for providing a more accurate yet lower cost color measurement system for textiles that can be used easily, quickly, and uncritically in terms of the handling, positioning and orientation of the textile material being tested.

Color Imager Bar Based Spectrophotometer Photodetector Optical Orientation

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US Patent:
20020196437, Dec 26, 2002
Filed:
May 22, 2001
Appl. No.:
09/863042
Inventors:
Jagdish Tandon - Fairport NY, US
Lingappa Mestha - Fairport NY, US
Fred Hubble - Rochester NY, US
Assignee:
Xerox Corporation
International Classification:
G01J003/42
US Classification:
356/320000
Abstract:
A color spectrophotometer incorporating a low cost commercial imaging chip, which normally forms part of a document imaging bar used for imaging documents in scanners, etc., having multiple photo-sites with three different rows of color filters. Each chip is mounted on the optical axis of an imaging lens system, in the image plane of that lens system, to image the reflected illumination from an illuminated color test target area on the chip. The optical axis of the imaging lens system is oriented at 45 to the illuminated color test patches, and the photodetector chip is physically mounted perpendicular to the plane of the illuminated color test patches. Respective photo-sensor chips and associated 1:1 optics may be mounted on opposing sides of the spectrophotometer physically oriented at 90 to the test target area plane receiving the reflected light from the test target optically oriented at 45 to the illuminated test target.

Spacing Compensating Electrostatic Voltmeter

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US Patent:
20030057977, Mar 27, 2003
Filed:
Aug 21, 2002
Appl. No.:
10/225555
Inventors:
Alan Werner - Rochester NY, US
Fred Hubble - Rochester NY, US
Stanley Wallace - Victor NY, US
R. Viturro - Rochester NY, US
Eric Peeters - Fremont CA, US
Joel Kubby - Rochester NY, US
Assignee:
Xerox Corporation
International Classification:
G01R029/12
G01R031/02
US Classification:
324/754000
Abstract:
An electrostatic type voltmeter for measuring the potential on a surface, the voltmeter including a probe; a support for supporting the probe in spaced relationship with the surface, the probe having a plurality of spacing element sites thereon for measuring a distance between each of the plurality of spacing element sites and a corresponding area on the surface opposite of each of the plurality of spacing element sites; a plurality of electrostatic element sites, intermixed and adjacent to the plurality of spacing element sites on the probe, for measuring a voltage between each of the plurality of spacing element sites and an area on the surface adjacent to the corresponding area opposite of each of the plurality of spacing element sites. A processor for compensating an output signal of the probe in response to the measurements received from the plurality of spacing element sites and the plurality of electrostatic element sites.

Diagnostics For Color Printer On-Line Spectrophotometer Control System

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US Patent:
20030063275, Apr 3, 2003
Filed:
Sep 10, 2001
Appl. No.:
09/949475
Inventors:
Fred Hubble - Rochester NY, US
Tanya Love - Rochester NY, US
Lalit Mestha - Fairfort NY, US
Gary Skinner - Rochester NY, US
Dennis Diehl - Penfield NY, US
Robert Grace - Fairport NY, US
Eric Jackson - Penfield NY, US
Yao Wang - Webster NY, US
Assignee:
Xerox Corporation
International Classification:
G01J003/46
US Classification:
356/319000, 356/402000
Abstract:
In a color analysis system in which sheets with multiple different color printed test patches are moved relative to a color analyzing spectrophotometer, and in which fiducial marks are printed adjacent to respective test patches and optically detected by a fiducial mark detector to provide a triggering system for the respective test patch analysis, there is provided automatic diagnostic testing of the spectrophotometer and the fiducial mark triggering system, including automatically generating special test sheets, some of which may include test areas of varying density black.

Color Imager Bar Based Spectrophotometer Photodetector Optical Orientation

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US Patent:
20030086090, May 8, 2003
Filed:
Dec 4, 2002
Appl. No.:
10/309703
Inventors:
Jagdish Tandon - Fairport NY, US
Lingappa Mestha - Fairport NY, US
Fred Hubble - Rochester NY, US
Assignee:
Xerox Corporation
International Classification:
G01N021/25
US Classification:
356/419000, 347/019000
Abstract:
A color spectrophotometer incorporating a low cost commercial imaging chip, which normally forms part of a document imaging bar used for imaging documents in scanners, etc., having multiple photo-sites with three different rows of color filters. Each chip is mounted on the optical axis of an imaging lens system, in the image plane of that lens system, to image the reflected illumination from an illuminated color test target area on the chip. The optical axis of the imaging lens system is oriented at 45 to the illuminated color test patches, and the photodetector chip is physically mounted perpendicular to the plane of the illuminated color test patches. Respective photo-sensor chips and associated 1:1 optics may be mounted on opposing sides of the spectrophotometer physically oriented at 90 to the test target area plane receiving the reflected light from the test target optically oriented at 45 to the illuminated test target.

Systems And Method For Measuring Or Reducing Spacing Errors In Multiple Beam Ros Systems

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US Patent:
20030132372, Jul 17, 2003
Filed:
Jan 16, 2002
Appl. No.:
10/046234
Inventors:
Robert Lofthus - Webster NY, US
Patrick Maeda - Mountain View CA, US
Daniel Costanza - Webster NY, US
Kristine German - Webster NY, US
Fred Hubble - Rochester NY, US
Robert Loce - Webster NY, US
Assignee:
XEROX COPORATION - Stamford CT
International Classification:
H01L027/00
G02B021/00
US Classification:
250/234000, 250/208100
Abstract:
An apparatus for correcting beam-to-beam spacing error on an image plane of a photoreceptor includes a controller which generates beam-to-beam spacing error correction signals, a plurality of optical elements, each of which is adjustable and responsive to beam-to-beam spacing error correction signal and a gray level measurement device. The controller performs the beam-to-beam spacing error correction analysis, determining whether or not a correction is necessary, and if so, which optical element to adjust and the magnitude of adjustment. Enhanced toner area coverage sensors are used to detect the gray level of a toned area of raster scan line patterns at various locations across the photoreceptor image plane. By repeatedly evaluating the beam-to-beam spacing error during operation, the apparatus of the invention is able to correct beam-to-beam spacing errors that may develop during operation and does not permit residual errors to persist even after an initial correction has been implemented.

Angular, Azimuthal And Displacement Insensitive Spectrophotometer For Color Printer Color Control Systems

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US Patent:
20030142314, Jul 31, 2003
Filed:
Mar 7, 2003
Appl. No.:
10/385408
Inventors:
Fred Hubble - Rochester NY, US
Tonya Love - Rochester NY, US
Daniel Robbins - Williamson NY, US
Assignee:
Xerox Corporation
International Classification:
G01J003/46
US Classification:
356/402000
Abstract:
An improved and lower cost color spectrophotometer, especially suitable for an on-line color printer color control system, in which plural different spectra LEDs sequentially perpendicularly illuminate a common and substantially circularly illuminated color test area, which may be variably spaced and variably oriented relative to the spectrophotometer, through a common central lens system, and also the reflected illumination therefrom may be measured at 45 degrees thereto by averaging the outputs of photodetectors spaced around that circularly illuminated color test area, to provide reduced sensitivity to the variable angular or azimuthal orientation of the color test area relative to the spectrophotometer, and which photodetectors may be so illuminated by 1:1 optics for spatial insensitivity.
Fred F Hubble from Clearwater, FL, age ~80 Get Report