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Farid Sabounchi

from Dallas, TX
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Related to:
Rebecca Sabounchi, 73Mojgan J Sabounchi, 58F SabounchiSogand S Sabounchi, 41Fatemeh Sabounchi
Connected to:
Arthur T Sabounjian, 65Fatima N Sabouni, 78George H Sabounjian, 61Richard V Sabounjian, 76Sara Sabour, 35Vahid Sabour, 66Amanda M Sabourin, 38Arsalan Sabouri, 44Brianna D Sabourin, 33Carrie D Sabourin, 98

Farid Sabounchi Phones & Addresses

  • Dallas, TX
  • 2 Champagnolle Ct, Little Rock, AR 72223 (501) 821-2531 (501) 888-5035

Resumes

Resumes

Farid Sabounchi Photo 1

Technology Executive, Start-Up Leadership,Commercial Real Estate Acquisition And Management,Film And Theater

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Position:
President at Caspian International Group
Location:
Dallas/Fort Worth Area
Industry:
Industrial Automation
Work:
Caspian International Group - Dallas Metroplex, Texas since Jan 2010
President
Pierot Lunaire 2001 - 2006
Vice President & Co- producer
AETRIUM FSA 1997 - 2000
President
Forward Systems Automation Sep 1991 - Mar 1997
President/CEO
Education:
The University of Texas at Arlington 1977 - 1980
Mechanical Engineering Kennedy Western University 1988 - 1990
Farid Sabounchi Photo 2

Farid Sabounchi

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Business Records

Name / Title
Company / Classification
Phones & Addresses
Farid Sabounchi
Director, President
FUTURISTIX, INC
Health/Allied Services
PO Box 794003, Dallas, TX 75379
PO Box 201205, Arlington, TX 76006
PO Box 2013, Frisco, TX 75034
Farid Sabounchi
Director, Manager
PLUTUS EQUITIES, LLC
5404 Wescott Ln, Dallas, TX 75287
3813 Andover Dr, Frisco, TX 75034
Farid Sabounchi
Director
CASPIAN INTERNATIONAL GROUP INC
Nonclassifiable Establishments
185 S Watson Rd STE 105, Arlington, TX 76010
1005 Edgewater Ct, Colleyville, TX 76034

Publications

Us Patents

Kelvin Contact-Type Testing Device

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US Patent:
60694807, May 30, 2000
Filed:
Dec 31, 1997
Appl. No.:
9/001299
Inventors:
Farid J. Sabounchi - Arlington TX
Martin Rowan - Roanoke TX
Kurt Schultz - Arlington TX
Assignee:
Aetrium-FSA, LP - Grand Prairie TX
International Classification:
G01R 3128
US Classification:
324754
Abstract:
A device (10) for testing miniature electronic components (104) includes a pair of contacts (88, 90), each of which is adapted to engage a common side (121) of a lead (110) of the electronic component (104) to be tested at longitudinally spaced locations. In particular, each contact (88, 90) includes an end portion (95, 99) that is arranged at an angle to both the lead (110) and the other contact (88, 90), while extending in a common vertical plane with the other contact (88, 90). In a preferred form of the invention, the device (10) includes a base (46) to which the first and second contacts (88, 90) are mounted. Each of the contacts (88, 90) include first and second end portions (94, 95 and 98, 99), with the first end portion (94, 98) of each contact (88, 90) being fixed relative to the base (46) and the second end portion (95, 99) extending at an angle to a plane of the base (46). In the most preferred form, the first end portion (94) of the first contact (88) is mounted atop the base (46) and the second end portion (95) thereof slopes downward from the base (46). On the other hand, the second end portion (99) of the second contact (90) is mounted below the first contact (88), such as on the bottom of the base (46), and the second end portion (99) thereof projects upwardly, at an acute angle to the vertical, to a point located above the second end portion (95) of the first contact (88).
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Farid Sabounchi from Dallas, TX Get Report