US Patent:
20130101090, Apr 25, 2013
Inventors:
Jeffrey R. Schubert - Somerville MA, US
John P. Handy - Nashua NH, US
Richard L. Schueller - Chelmsford MA, US
David C. Walazek - Billerica MA, US
William J. Baukus - Nashua NH, US
Assignee:
AMERICAN SCIENCE AND ENGINEERING, INC. - Billerica MA
International Classification:
G01N 23/203
Abstract:
Embodiments of backscatter inspection systems include features to enable inspection of irregular surfaces, tight spacer, and other hard-to-reach places. Some embodiments include arms that maneuver a scan head with at least three degrees of freedom, and some embodiments include arms that maneuver a scan head with at least seven degrees of freedom. Some embodiments include proximity detectors on a scan head or base, detect contact with an object being inspected, and to slow or stop the motion of the system accordingly. Some compact embodiments scan the interior of an object from within, and include a rotating, low-energy source of penetrating radiation, and at least one backscatter detector, which may be stationary, or may rotate with the source.