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David M Kaz

from Oakland, CA
Age ~43
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Related to:
Joseph J Kazmierowicz, 47Vadim L Kazarmshchikov, 39Michael H Kaz, 76
Connected to:
Amy J Kaz, 52Anita M Kaz, 81Ari J Kaz, 54Connie I Kaz, 62Daniel S Kaz, 32John Kaz, 58Laura A Kaz, 108Uyo N Kaz, 53Avinash Kaza, 43James A Kaza, 41

David Kaz Phones & Addresses

  • 3824 Park Blvd, Oakland, CA 94602
  • Berkeley, CA
  • Somerville, MA
  • Phoenix, AZ
  • Florence, AZ
  • Cambridge, MA
  • Alameda, CA
  • Austin, TX
  • Tucson, AZ

Resumes

Resumes

David Kaz Photo 1

R And D Scientist

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Location:
Santa Clara, CA
Industry:
Research
Work:
Kla-Tencor Feb 1, 2014 - Oct 31, 2015
Senior System Engineer
Agilent Technologies Feb 1, 2014 - Oct 31, 2015
R and D Scientist
Uc Berkeley Aug 2011 - Feb 2014
Postdoctoral Scholar
Harvard University Jun 2007 - Aug 2011
Graduate Researcher With Professor Vinothan N Manoharan
Harvard University May 2005 - Jun 2007
Graduate Researcher With Professor Lene V Hau
Education:
Harvard University 2005 - 2011
Doctorates, Doctor of Philosophy, Physics University of Arizona 1999 - 2003
Bachelors, Bachelor of Science, Physics, Engineering Canyon Del Oro High School 1999
Skills:
Optics
Experimentation
Matlab
Physics
Scanning Electron Microscopy
Afm
Thin Films
Python
Experimental Design
Simulations
Laser
Science
Nanotechnology
Latex
Data Analysis
Spectroscopy
Optical Microscopy
Microscopy
Electron Microscopy
Research and Development
Interests:
Bike Trailers
Computer Cases
Cooking
Etc
Rock Climbing
Backpacks
Education
Furniture
Baking
Environment
Bikes
Science and Technology
Coffee Roasting
Coffee Mugs
David Kaz Photo 2

David Kaz

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David Kaz Photo 3

David Kaz

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Location:
United States

Publications

Us Patents

Foams, Including Microcellular Foams, Containing Colloidal Particulates

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US Patent:
20130209520, Aug 15, 2013
Filed:
May 20, 2011
Appl. No.:
13/697706
Inventors:
Kosta Ladavac - Somerville MA, US
Rodrigo Guerra - Cambridge MA, US
David Kaz - Somerville MA, US
Vinothan N. Manoharan - Cambridge MA, US
Jens B. Rieger - Ludwigshafen, DE
Roland S. Koltzenburg - Dannstadt, DE
David A. Weitz - Bolton MA, US
Assignee:
BASF SE - Ludwigshafen
International Classification:
A61K 9/12
US Classification:
424400
Abstract:
The present invention generally relates to foams and particles made from such foams, for applications such as drug delivery. The foams or particles may comprise a pharmaceutically acceptable polymeric carrier. In some cases, the foams may include colloidal particulates. A first aspect of the present invention is generally related to polymer-based foams or particles containing pharmaceutically active agents. In some cases, the foam or particle may contain smaller colloidal particulates therein. Such colloidal particulates may be used, for example, to limit the amount of material within certain regions of the foam, or exclude pharmaceutically active agents from being located within certain portions of the foam, which may useful for enhancing release of pharmaceutically active agents from the foam. In some cases, the colloidal particulates may cause the foam or particle to have an unexpectedly high specific surface area. The foam, in certain embodiments, can exhibit a relatively high loading of the pharmaceutically active agent. The foam may be microcellular in certain instances. The foam may also be created using a supercritical fluid, for example, supercritical C0. For instance, a precursor to the foam, containing a pharmaceutically active agent, a pharmaceutically acceptable polymeric carrier, and colloidal particulates, can be mixed with a foaming agent. The pressure may then be decreased, thereby causing the foaming agent to expand and causing a foam to form. The foam may also be ground or milled, or otherwise processed, to form particles such as nanoparticles.

Foams Or Particles For Applications Such As Drug Delivery

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US Patent:
20130202657, Aug 8, 2013
Filed:
May 20, 2011
Appl. No.:
13/697692
Inventors:
Kosta Ladavac - Somerville MA, US
Rodrigo E. Guerra - Cambridge MA, US
David Kaz - Somerville MA, US
Vinothan Manoharan - Cambridge MA, US
Jens B. Rieger - Ludwigshafen, DE
Roland S. Koltzenburg - Dannstadt, DE
David A. Weitz - Bolton MA, US
Assignee:
BASF SE - Ludwigshafen
President and Fellows of Harvard College - Cambridge MA
International Classification:
A61K 9/12
US Classification:
424400, 514396, 51425407, 514543, 514217, 514182
Abstract:
The present invention generally relates to foams and, in particular, to foams for applications such as drug delivery, and particles that are made from such foams. One aspect relates to foams or particles containing pharmaceutically active agents. The foam may comprise a pharmaceutically acceptable polymeric carrier. In some cases, the foam or particle has an unexpectedly high specific surface area. A high specific surface area may, in some cases, facilitate delivery or release of the pharmaceutically active agent when the foam or particles made from the foam (e.g., by milling) are administered to a subject. The foam may also exhibit a relatively high loading of the pharmaceutically active agent. In some cases, the foam may be a microcellular foam. In one set of embodiments, the foam is created using a supercritical fluid, such as supercritical C02. For example, a precursor to the foam, containing a pharmaceutically active agent, may be mixed with a foaming agent, then the pressure decreased to cause the foaming agent to expand, thereby causing a foam to form. The foam may then be subsequently ground or milled, or otherwise processed to form particles.

Method And System For Edge-Of-Wafer Inspection And Review

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US Patent:
20190006143, Jan 3, 2019
Filed:
Aug 20, 2018
Appl. No.:
16/105632
Inventors:
- Milpitas CA, US
Christopher Sears - Fremont CA, US
Harsh Sinha - Santa Clara CA, US
David Trease - Milpitas CA, US
David Kaz - Oakland CA, US
Wei Ye - Milpitas CA, US
International Classification:
H01J 37/153
Abstract:
An electron-optical system for inspecting or reviewing an edge portion of a sample includes an electron beam source configured to generate one or more electron beams, a sample stage configured to secure the sample and an electron-optical column including a set of electron-optical elements configured to direct at least a portion of the one or more electron beams onto an edge portion of the sample. The system also includes a sample position reference device disposed about the sample and a guard ring device disposed between the edge of the sample and the sample position reference device to compensate for one or more fringe fields. One or more characteristics of the guard ring device are adjustable. The system also includes a detector assembly configured to detect electrons emanating from the surface of the sample.

Cathodoluminescence-Activated Nanoscale Imaging

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US Patent:
20180080885, Mar 22, 2018
Filed:
Apr 8, 2016
Appl. No.:
15/564542
Inventors:
- Oakland CA, US
Connor Gregory BISCHAK - Berkeley CA, US
Craig L. HETHERINGTON - Berkeley CA, US
David M. KAZ - Oakland CA, US
Assignee:
The Regents of the University of California - Oakland CA
International Classification:
G01N 23/225
Abstract:
Provided herein are non-invasive methods of nanoscale imaging of a sample using an illumination layer and an electron beam. For example, the electron may activate the illumination layer without activating the sample, and the illumination layer may emit cathodoluminescence to produce a nanoscale image of the sample.

Method And System For Edge-Of-Wafer Inspection And Review

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US Patent:
20170047193, Feb 16, 2017
Filed:
Aug 8, 2016
Appl. No.:
15/231728
Inventors:
- Milpitas CA, US
Christopher Sears - Fremont CA, US
Harsh Sinha - Santa Clara CA, US
David Trease - Milpitas CA, US
David Kaz - Oakland CA, US
Wei Ye - Milpitas CA, US
International Classification:
H01J 37/153
H01J 37/147
H01J 37/20
H01J 37/244
Abstract:
An electron-optical system for inspecting or reviewing an edge portion of a sample includes an electron beam source configured to generate one or more electron beams, a sample stage configured to secure the sample and an electron-optical column including a set of electron-optical elements configured to direct at least a portion of the one or more electron beams onto an edge portion of the sample. The system also includes a sample position reference device disposed about the sample and a guard ring device disposed between the edge of the sample and the sample position reference device to compensate for one or more fringe fields. One or more characteristics of the guard ring device are adjustable. The system also includes a detector assembly configured to detect electrons emanating from the surface of the sample.
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David M Kaz from Oakland, CA, age ~43 Get Report