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Chin Wei Lin

from San Jose, CA
Age ~49
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Also known as:
Chinwei Lin, Chin-Wei Lin
Related to:
Lin Geng, 60Miju Chang, 52Eddie Huanching Lin, 49W P Lin, 49Wing K Lin, 46Allen H Lin, 47Kam C Lin, 75Bo Ying Wong, 75
Connected to:
Abby C Lin, 43Ai H Lin, 74Aidi Lin, 31Alisa Y Lin, 47Alyssa Lin, 38Amy LinAndrea Lin, 51Angelia Lin, 29Angelica B Lin, 51Anhua A Lin, 51

Chin Lin Phones & Addresses

  • San Jose, CA
  • Cupertino, CA

Resumes

Resumes

Chin Lin Photo 1

Chin Lin

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Chin Lin Photo 2

Chin Lin

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Chin Lin Photo 3

Chin Lin

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Location:
United States
Chin Lin Photo 4

Chin Lin

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Location:
United States
Chin Lin Photo 5

Postdoc Fellow At University Of Maryland, College Park

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Location:
United States
Industry:
Research
Chin Lin Photo 6

Chin Lin

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Work:
Phison Electronic Corp.

Feb 2008 to 2000
Firmware Engineer
SumplusMm

Jul 2006 to Feb 2008
Software Engineer
BenQ

Mar 2005 to Jul 2006
Software Engineer
Education:
National Chiao Tung University
Sep 2001 to Jun 2003
M.S. in Environmental Engineering
Feng Chia University
Sep 1997 to Jun 2001
B.S. in Environmental Engineering and Science

Business Records

Name / Title
Company / Classification
Phones & Addresses
Chin Lin
President
CPUNC
Nonclassifiable Establishments
10294 S Stelling Rd, Cupertino, CA 95014
10118 Bandley Dr, Cupertino, CA 95014
Chin Yu Lin
Koi Restaurant of Dothan, LLC
Restaurant/cafe'
Chin Yuan Lin
SUNRISE MANAGEMENT II, INC
Chin Chi Lin
President
ORCHIDLAND, INC
7171 Bark Ln STE 1, San Jose, CA 95129
Chin Lin
President
C. L. MULTI MARKETING, INC
110 Pioneer Way, Mountain View, CA 94041

Publications

Us Patents

Method For Smart Defect Screen And Sample

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US Patent:
8312401, Nov 13, 2012
Filed:
Jan 13, 2011
Appl. No.:
13/005932
Inventors:
Iyun Leu - Hsinchu, TW
Chin Hsen Lin - Fremont CA, US
Assignee:
Elitetech Technology Co., Ltd. - Zhudong Town
International Classification:
G06F 17/50
US Classification:
716112
Abstract:
A method for smart defect review is disclosed. The method includes pre-processing a design layout into a plurality of layout based pattern groups, dividing the design layout into a plurality of cells, overlapping the cells belong to the same layout based pattern groups, extracting a plurality of defect data of all defects on a wafer, constructing a plurality of layout based defect composite pattern groups, executing layout pattern match to obtain each individual layout based defect composite pattern group, performing some defect sample selection rules to each layout based defect composite pattern group, sorting the layout based defect composite pattern groups into different defect types, obtaining a defect image file by reviewing different sample number of defect image from each layout based defect composite pattern group, and generating a defect pattern library or a defect yield prediction by performing a defect yield diagnosis to the defect image file.

Self-Mixing Interference Device For Sensing Applications

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US Patent:
20210003385, Jan 7, 2021
Filed:
Jun 26, 2020
Appl. No.:
16/913645
Inventors:
- Cupertino CA, US
Arnaud Laflaquiere - Greenoble, FR
Chin Han Lin - Cupertino CA, US
Keith Lyon - Cupertino CA, US
Marc A. Drader - Waterloo CA, US
Weiping Li - Pleasanton CA, US
International Classification:
G01B 9/02
H01S 5/026
H01S 5/30
H01S 5/183
H01S 5/343
Abstract:
Disclosed herein are self-mixing interferometry (SMI) sensors, such as may include vertical cavity surface emitting laser (VCSEL) diodes and resonance cavity photodetectors (RCPDs). Structures for the VCSEL diodes and RCPDs are disclosed. In some embodiments, a VCSEL diode and an RCPD are laterally adjacent and formed from a common set of semiconductor layers epitaxially formed on a common substrate. In some embodiments, a first and a second VCSEL diode are laterally adjacent and formed from a common set of semiconductor layers epitaxially formed on a common substrate, and an RCPD is formed on the second VCSEL diode. In some embodiments, a VCSEL diode may include two quantum well layers, with a tunnel junction layer between them. In some embodiments, an RCPD may be vertically integrated with a VCSEL diode.

Device And Method For Panel Conditioning

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US Patent:
20200005716, Jan 2, 2020
Filed:
Sep 11, 2019
Appl. No.:
16/567972
Inventors:
- Cupertino CA, US
Kingsuk Brahma - Mountain View CA, US
Jie Won Ryu - Santa Clara CA, US
Shengkui Gao - San Jose CA, US
Shiping Shen - Cupertino CA, US
Majid Gharghi - San Carlos CA, US
Hyunwoo Nho - Palo Alto CA, US
Injae Hwang - Cupertino CA, US
Kavinaath Murugan - Scarborough, CA
Sun-Il Chang - San Jose CA, US
Chin Wei Lin - San Jose CA, US
Hyunsoo Kim - Mountain View CA, US
Rui Zhang - Sunnyvale CA, US
Jesse Aaron Richmond - San Francisco CA, US
Yun Wang - Cupertino CA, US
Hung Sheng Lin - San Jose CA, US
Alex H. Pai - Milpitas CA, US
Chaohao Wang - Sunnyvale CA, US
Wei H. Yao - Palo Alto CA, US
International Classification:
G09G 3/3283
G09G 3/3291
G09G 3/3241
G09G 3/3258
Abstract:
The present disclosure relates generally to systems and methods that may reduce a reduction in visual artifacts related to hysteresis of a light emitting diode (LED) electronic display. In one example, an electronic device may include a controller. The controller is may provide a signal to a pixel of a display of the electronic device while at least a portion of the display is turned off. The signal may include a first current and a second current. The first current may be designed to increase an ambient temperature corresponding to the pixel. The second current may be generated as part of an active panel conditioning operation. By applying the first current and the second current, hysteresis settling times from the pixel may improve, therefore improving speeds of sensing and compensation operations of the electronic device.

Interrogating Doe Integrity By Reverse Illumination

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US Patent:
20180283984, Oct 4, 2018
Filed:
Apr 9, 2018
Appl. No.:
15/947882
Inventors:
- Cupertino CA, US
Brian S. Medower - San Jose CA, US
Chin Han Lin - Cupertino CA, US
International Classification:
G01M 11/02
G01J 3/02
Abstract:
Optical apparatus includes a primary radiation source, which emits first optical radiation along a first optical axis. A DOE includes at least an entrance surface, upon which the first optical radiation from the primary radiation source is incident, and an exit surface, through which one or more primary diffraction orders of the first optical radiation are emitted from the DOE. At least one secondary radiation source is configured to direct second optical radiation to impinge on the DOE along a second optical axis, which is non-parallel to the first optical axis, causing at least a part of the second optical radiation to be diffracted by the DOE such that one or more secondary diffraction orders of the second optical radiation are emitted through the entrance face of the DOE. At least one detector is configured to sense at least one of the secondary diffraction orders of the second optical radiation.

Resolving Three Dimensional Spatial Information Using Time-Shared Structured Lighting That Embeds Digital Communication

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US Patent:
20170324949, Nov 9, 2017
Filed:
May 4, 2016
Appl. No.:
15/146454
Inventors:
- Cupertino CA, US
Chin Han Lin - Santa Clara CA, US
International Classification:
H04N 13/02
H04N 13/02
H04N 13/02
H04N 13/02
Abstract:
Systems, methods, and computer readable media to resolve three dimensional spatial information of cameras used to construct 3D images. Various embodiments perform communication synchronization between a first image capture system and one or more other image capture systems and generate a first flash pulse that projects a light pattern into an environment. An image is captured that includes the light pattern and a modulated optical signal encoded with an identifier of one of the first image capture system and related-camera information. A second flash from another image capture systems may flash at a second time based on the communication synchronization. During the second flash, the first image capture system captures a second image of the environment. Based on the first and second images, the first image capture system determines the orientation of the second image capture system relative to the first image capture system.

Interrogating Doe Integrity By Reverse Illumination

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US Patent:
20170227416, Aug 10, 2017
Filed:
Feb 10, 2016
Appl. No.:
15/019978
Inventors:
- Cupertino CA, US
Brian S. Medower - Cupertino CA, US
Chin Han Lin - Cupertino CA, US
International Classification:
G01M 11/02
G01J 3/18
Abstract:
Optical apparatus includes a primary radiation source, which emits first optical radiation along a first optical axis. A DOE includes at least an entrance surface, upon which the first optical radiation from the primary radiation source is incident, and an exit surface, through which one or more primary diffraction orders of the first optical radiation are emitted from the DOE. At least one secondary radiation source is configured to direct second optical radiation to impinge on the DOE along a second optical axis, which is non-parallel to the first optical axis, causing at least a part of the second optical radiation to be diffracted by the DOE such that one or more secondary diffraction orders of the second optical radiation are emitted through the entrance face of the DOE. At least one detector is configured to sense at least one of the secondary diffraction orders of the second optical radiation.

Amazon

Chin Lin Sou: Chinese-American Leader (Great Lives In Colorado History)

Chin Lin Sou: Chinese-American Leader (Great Lives in Colorado History)

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Chin Lin Sou was 22 years old when he came to the United States in 1859 from China. He worked on the transcontinental railroad and the gold fields of Colorado. Chin Lin Sou was a natural leader who eventually became a wealthy businessman. He was often referred to as the mayor of Denver’s Chinatown.G...
Author

Janet Taggart

Binding

Paperback

Pages

75

Publisher

Filter Press, LLC

ISBN #

0865411557

EAN Code

9780865411555

ISBN #

5

Chinese Subculture And Criminality: Non-Traditional Crime Groups In America (Contributions In Criminology And Penology)

Chinese Subculture and Criminality: Non-traditional Crime Groups in America (Contributions in Criminology and Penology)

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The President's Commission on Organized Crime predicted that Asian crime groups would be the United States' foremost organized crime problem by the 1990s. There are few comprehensive studies on the nature and scope of these groups. Ko-lin Chin warns that our limited law enforcement resources will be...
Author

Ko Lin Chin

Binding

Hardcover

Pages

208

Publisher

Praeger

ISBN #

031327262X

EAN Code

9780313272622

ISBN #

8

The Golden Triangle: Inside Southeast Asia's Drug Trade

The Golden Triangle: Inside Southeast Asia's Drug Trade

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The Golden Triangle region that joins Burma, Thailand, and Laos is one of the global centers of opiate and methamphetamine production. Opportunistic Chinese businessmen and leaders of various armed groups are largely responsible for the manufacture of these drugs. The region is defined by the appare...
Author

Ko-Lin Chin

Binding

Paperback

Pages

296

Publisher

Cornell University Press

ISBN #

080147521X

EAN Code

9780801475214

ISBN #

6

Smuggled Chinese (Asian American History & Cultu)

Smuggled Chinese (Asian American History & Cultu)

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This examination of the intractable international problem of human smuggling shows how flaws in national policies and lax law enforcement perpetuate the problem. The author argues that it will continue as long as China's citizens are deprived of fundamental human rights and economic security.
Author

Ko-Lin Chin

Binding

Paperback

Pages

221

Publisher

Temple University Press

ISBN #

1566397332

EAN Code

9781566397339

ISBN #

7

Control profile
Chin Wei Lin from San Jose, CA, age ~49 Get Report