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Cary Steven Kiest

from Albany, OR
Age ~60
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Also known as:
Cary S Kiest
Phone and address:
2556 NW Skyline Ter, Albany, OR 97321
(541) 926-0876
Related to:
Larry KiestKenneth Michael Hart, 64Sydney Kiest, 30John E Lundeen, 44Steven F KiestKellie S Kiest, 66Christopher R Seus, 37Winnifred R KiestLoraine W Kiest, 59
Connected to:
Janie L Kiester, 48Sean Kiester, 60Charles B Kiestler, 66Kevin T Kiestler, 32Kent D Kieswetter, 75Joseph Kieszek, 76James A Kieta, 68Tina M Kieta, 51Terry D Kieth, 72Arthur L Kietlinski, 64

Cary Kiest Phones & Addresses

  • 2556 NW Skyline Ter, Albany, OR 97321 (541) 926-0876
  • 2556 Skyline Dr, Albany, OR 97321 (541) 926-0876
  • 6139 Nelson Loop, Albany, OR 97321 (541) 926-0876 (541) 928-8990
  • Corvallis, OR
  • Portland, OR
  • Bandon, OR

Resumes

Resumes

Cary Kiest Photo 1

Engineering And Product Development Executive

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Position:
R&D Enginering Director at Trimble Navigation
Location:
Corvallis, Oregon Area
Industry:
Computer Hardware
Work:
Trimble Navigation - Corvallis, Oregon Area since Dec 2011
R&D Enginering Director
nLight Sep 2009 - Dec 2011
Director of Laser Systems Integration
Deep Photonics Corporation Jan 2006 - Sep 2009
Vice President of Engineering
ATS Automation Tooling Systems Oct 2003 - Jan 2006
Operations Manager
Electroglas Inspection Products Dec 1997 - Jun 2003
Vice President of Engineering
Skills:
Semiconductors
Automation
Product Development
Embedded Systems
Engineering Management
Manufacturing
Electronics
R&D
Certifications:
Instrument Rated Private Pilot, Federal Aviation Administration (FAA)
Cary Kiest Photo 2

Engineering And Project Management Director

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Location:
2556 northwest Skyline Ter, Albany, OR 97321
Industry:
Wireless
Work:
Trimble
Engineering and Project Management Director
Nlight Sep 2009 - Dec 2011
Director of Laser Systems Integration
Deep Photonics Corporation Jan 2006 - Sep 2009
Vice President of Engineering
Ats Automation Oct 2003 - Jan 2006
Operations Manager
Electroglas Dec 1997 - Jun 2003
Vice President of Engineering
Education:
University of the Pacific 1983 - 1988
Bachelors, Bachelor of Science In Electrical Engineering, Electrical Engineering, Physics
Skills:
Engineering Management
Product Development
Electronics
Semiconductors
Automation
Manufacturing
Embedded Systems
Testing
Engineering
Cross Functional Team Leadership
R&D
Integration
Product Management
Start Ups
Management
Robotics
Process Improvement
Software Documentation
Programming
Lean Manufacturing
Software Development
Software Engineering
Systems Engineering
System Architecture
Continuous Improvement
Troubleshooting
Optics
Quality Assurance
Product Design
Interests:
Science and Technology
Children
Arts and Culture
Certifications:
Instrument Rated Private Pilot

Publications

Us Patents

Method And Apparatus For Illuminating Projecting Features On The Surface Of A Semiconductor Wafer

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US Patent:
6547409, Apr 15, 2003
Filed:
Jan 12, 2001
Appl. No.:
09/759792
Inventors:
Cary S. Kiest - Albany OR
Assignee:
Electroglas, Inc. - Corvallis OR
International Classification:
F21V 1300
US Classification:
362 33, 362252, 382145, 382149
Abstract:
Plural light sources are provided for directing ring patterns of light toward at least one reflective bump formed on and projecting from a first wafer surface of a semiconductor wafer. The intensity of light from the light sources may be varied and may be varied independently of one another.

Method And Apparatus For Increasing Fiber Laser Output Power

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US Patent:
7782911, Aug 24, 2010
Filed:
Feb 19, 2008
Appl. No.:
12/033759
Inventors:
Michael J. Munroe - Eugene OR, US
David H. Foster - Corvallis OR, US
Joseph G. LaChapelle - Philomath OR, US
Cary S. Kiest - Albany OR, US
Assignee:
Deep Photonics Corporation - Corvallis OR
International Classification:
H01S 3/30
US Classification:
372 6, 385 4, 385123
Abstract:
A fiber laser with reduced stimulated Brillouin scattering includes a spool having a height and characterized by an induced temperature gradient with the height. The fiber laser also includes a fiber wrapped on the spool and characterized by a signal power increasing along the length of the fiber. The induced temperature gradient is a function of the signal power along the fiber.

Method And Apparatus For Determining The Location Of An Alignment Mark On A Wafer

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US Patent:
20030025517, Feb 6, 2003
Filed:
Jul 11, 2002
Appl. No.:
10/194951
Inventors:
Cary Kiest - Albany OR, US
Leda Villalobos - Corvallis OR, US
Assignee:
Electrogas, Inc.
International Classification:
G01R031/02
US Classification:
324/758000
Abstract:
An alignment technique can be used to align a semiconductor wafer during wafer testing. During a gross alignment process, a bump pattern on the wafer surface is located. Based on a known relative location relationship between the bump pattern and a fiducial on the wafer surface, the fiducial can be located. The wafer can then be initially aligned. During a fine alignment process, the bump pattern technique can again be used and additional alignment performed. Blurring can be used so that features other than bumps become less discernable.

Non-Destructive Fill Volume Measurement System

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US Patent:
55682626, Oct 22, 1996
Filed:
May 31, 1994
Appl. No.:
8/251332
Inventors:
Joseph G. LaChapelle - Philomath OR
Cary S. Kiest - Albany OR
International Classification:
G01B 1100
US Classification:
356379
Abstract:
Fill volume of a liquid in a sealed, transparent container is determined by rotating the container about a transverse axis so as to confine the air to a generally cylindrical air pocket about the transverse axis of rotation. Machine vision methods and apparatus are used to capture an image of the container, including the air pocket, for measuring the size of the air pocket. A common volume of the container is defined as a generally cylindrical region intermediate upright and inverted liquid levels. The common volume and the air pocket volume are used to determine the liquid fill volume so that all measurements are acquired in a central portion of the container having a regular geometric shape.

Method And Apparatus For Feature Detection In A Workpiece

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US Patent:
58928081, Apr 6, 1999
Filed:
Jan 30, 1997
Appl. No.:
8/789955
Inventors:
John R. Goulding - Albany OR
Cary S. Kiest - Albany OR
Joseph G. LaChapelle - Philomath OR
Assignee:
Techne Systems, Inc. - Albany OR
International Classification:
G01N 2304
US Classification:
378 63
Abstract:
A feature detection apparatus includes a reflective imaging system, a transmissive imaging system, and memory for generating an image of a workpiece. The reflective imaging system generates a first bit image of a surface of the workpiece. The transmissive imaging system generates a second, different bit image of the density of the workpiece. The two images are then combined in memory into a more complete image that contains data describing the surface and interior of the workpiece. The apparatus also includes a filter for enhancing the combined bit image so that physical features of the workpiece are accurately detected. The filter is constructed to perform the following steps. For detecting a feature of interest, the filter determines a mean, standard deviation, and normal distribution of the image's pixel intensities. The filter then uses the normal distribution to map the pixel intensities above the mean to one set of enhanced pixel intensities and to map pixel intensities below the mean to another set of enhanced pixel intensities. Pixels of the enhanced image are sampled to determine if a pixel meets a threshold intensity for the feature being sought.

System For Insertion Of Location Data Into A Source Device's Storage Location

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US Patent:
20180063672, Mar 1, 2018
Filed:
Aug 26, 2016
Appl. No.:
15/249105
Inventors:
- SUNNYVALE CA, US
CARY STEVEN KIEST - ALBANY OR, US
International Classification:
H04W 4/02
H04W 4/00
H04L 29/06
Abstract:
A system for providing locations for each of a plurality of non-Global Positioning System (GPS) enabled devices (e.g., locations of “things” or objects in the IoT, for sensors in a WSN, and so on). The system includes a source device or “thing” including memory (e.g., a long-range sensor in a WSN or the like). The system also includes a portable computing device (e.g., a handheld GPS-enabled device), and the portable computing device includes: (a) a processor; (b) a location-determining assembly operating to determine location information for the portable computing device; and (c) a location-transferring module run by the processor to provide the location information in the memory of the source device (e.g., to copy the information to a predefined storage location for later retrieval and inclusion in predefined parts of a message or data packet).

Active Monitoring Of Multi-Laser Systems

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US Patent:
20160209267, Jul 21, 2016
Filed:
Mar 24, 2016
Appl. No.:
15/079664
Inventors:
- Vancouver WA, US
Jay Small - Vancouver WA, US
Mitch Stanek - Vancouver WA, US
Vito P. Errico - Vancouver WA, US
Cary S. Kiest - Albany OR, US
Assignee:
nLIGHT, Inc. - Vancouver WA
International Classification:
G01J 1/42
H01S 5/042
H01S 5/40
H01S 5/00
Abstract:
A monitoring system for a multi-laser module includes detectors corresponding to each laser and situated to receive a portion of the associated laser beam uncombined with other beams. Laser characteristics are measured and stored, and in operation are used to identify device failures. A comparator receives a reference value and compares the reference value with a current operational value. If the current value is less that the reference value, a possible failure is indicated. Signal cross-coupling among the detectors is also used to identify undesirable scattering that can be associated with surface contamination or device failure.

Active Monitoring Of Multi-Laser Systems

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US Patent:
20140263971, Sep 18, 2014
Filed:
Mar 14, 2013
Appl. No.:
13/828336
Inventors:
- Vancouver WA, US
Jay Small - Vancouver WA, US
Mitch Stanek - Vancouver WA, US
Vito Errico - Vancouver WA, US
Cary Kiest - Albany OR, US
Assignee:
nLight Photonics Corporation - Vancouver WA
International Classification:
G01J 1/42
US Classification:
2502082, 250206
Abstract:
A monitoring system for a multi-laser module includes detectors corresponding to each laser and situated to receive a portion of the associated laser beam uncombined with other beams. Laser characteristics are measured and stored, and in operation are used to identify device failures. A comparator receives a reference value and compares the reference value with a current operational value. If the current value is less that the reference value, a possible failure is indicated. Signal cross-coupling among the detectors is also used to identify undesirable scattering that can be associated with surface contamination or device failure.
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Cary Steven Kiest from Albany, OR, age ~60 Get Report