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Bryan D Ackland

from Old Bridge, NJ
Age ~73

Bryan Ackland Phones & Addresses

  • 6 Eagle Ct, Old Bridge, NJ 08857 (732) 679-6851
  • 9 Hawthorne Ln, Hightstown, NJ 08520
  • 1 Huber Ct, Hightstown, NJ 08520
  • East Windsor, NJ

Work

Company: Stevens institute of technology Jan 2012 to May 2018 Position: Distinguished service professor

Education

Degree: Doctorates, Doctor of Philosophy School / High School: University of Adelaide 1975 to 1978 Specialities: Engineering

Languages

English

Industries

Semiconductors

Resumes

Resumes

Bryan Ackland Photo 1

Bryan Ackland

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Location:
6 Eagle Ct, Old Bridge, NJ 08857
Industry:
Semiconductors
Work:
Stevens Institute of Technology Jan 2012 - May 2018
Distinguished Service Professor

Stevens Institute of Technology Jul 2011 - Jan 2012
Adjunct Professor

Noblepeak Vision Corp Jul 2004 - Oct 2010
Vice President Engineering

Lsi Corporation 2001 - 2003
Circuits and Systems Research Vice President

Nokia 1996 - 2001
Director, Vlsi Systems Research
Education:
University of Adelaide 1975 - 1978
Doctorates, Doctor of Philosophy, Engineering
University of Adelaide 1973 - 1974
Flinders University 1969 - 1971
Bachelors, Bachelor of Science, Physics
Languages:
English

Publications

Isbn (Books And Publications)

Physical Design Automation of Electronic Systems

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Author

Bryan D. Ackland

ISBN #

0805304126

Us Patents

Mixed Analog And Digital Pixel For High Dynamic Range Readout

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US Patent:
7326903, Feb 5, 2008
Filed:
Jun 29, 2006
Appl. No.:
11/427483
Inventors:
Bryan Ackland - Old Bridge NJ, US
Assignee:
Noble Peak Vision Corp. - Wakefield MA
International Classification:
H01L 27/00
G01J 1/44
H03K 17/78
H04N 3/14
H03M 1/12
US Classification:
2502081, 250214 R, 250214 DC, 348294, 348297, 341155
Abstract:
An improved CMOS pixel with a combination of analog and digital readouts to provide a large pixel dynamic range without compromising low-light performance using a comparator to test the value of an accumulated charge at a series of exponentially increasing exposure times. The test is used to stop the integration of photocurrent once the accumulated analog voltage has reached a predetermined threshold. A one-bit output value of the test is read out of the pixel (digitally) at each of the exponentially increasing exposure periods. At the end of the integration period, the analog value stored on the integration capacitor is read out using conventional CMOS active pixel readout circuits.

Pulse Detector Which Employs A Self-Resetting Pulse Amplifier

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US Patent:
7528357, May 5, 2009
Filed:
Apr 19, 2006
Appl. No.:
11/407376
Inventors:
Behzad Razavi - Los Angeles CA, US
Lawrence C. West - San Jose CA, US
Bryan D. Ackland - Old Bridge NJ, US
Assignee:
Applied Materials, Inc. - Santa Clara CA
International Classification:
H03G 3/20
US Classification:
250214A, 250214 AG, 250214 R
Abstract:
A circuit including: an optical detector for detecting an optical pulse and generating therefrom a current pulse on an output; a pulse detector circuit having an input electrically connected to the optical detector and having an output for outputting a detection pulse in response to detecting the current pulse on its input, said pulse detector circuit including: a resettable amplifier including an input for receiving the current pulse from the optical detector, a reset terminal for resetting the amplifier after the amplifier detects the current pulse on its input, and an output for outputting a signal from which the detection pulse is derived; and a reset delay chain feeding back to the reset terminal of the resettable amplifier a feedback signal derived from the output signal of the resettable amplifier.

Imaging Pixel Comprising A Comparator To Compare Integrated Photocurrent To A Reference Value And Digital Output Circuitry

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US Patent:
8022350, Sep 20, 2011
Filed:
Feb 4, 2008
Appl. No.:
12/012542
Inventors:
Bryan D. Ackland - Old Bridge NJ, US
Assignee:
Infrared Newco, Inc. - Tucson AZ
International Classification:
H03K 17/78
H01L 27/00
US Classification:
250214SW, 2502081
Abstract:
An improved CMOS pixel with a combination of analog and digital readouts to provide a large pixel dynamic range without compromising low-light performance using a comparator to test the value of an accumulated charge at a series of exponentially increasing exposure times. The test is used to stop the integration of photocurrent once the accumulated analog voltage has reached a predetermined threshold. A one-bit output value of the test is read out of the pixel (digitally) at each of the exponentially increasing exposure periods. At the end of the integration period, the analog value stored on the integration capacitor is read out using conventional CMOS active pixel readout circuits.

Image Detection Apparatus And Methods

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US Patent:
8063422, Nov 22, 2011
Filed:
Apr 25, 2008
Appl. No.:
12/109846
Inventors:
Bryan D. Ackland - Old Bridge NJ, US
Conor S. Rafferty - Newton MA, US
Assignee:
Infrared Newco, Inc. - Tucson AZ
International Classification:
H01L 31/062
US Classification:
257291, 257E27133, 2502081
Abstract:
MOS imaging pixels are described. The MOS imaging pixels may comprise bootstrapped source followers, having their bodies connected to their sources. The source followers of the MOS imaging pixels may be used to buffer a signal indicative of an amount of radiation incident on the pixel. MOS imagers are also described, which may comprise one or more MOS imaging pixels of the type described.

Imaging Signal Processing Methods And Apparatus

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US Patent:
8072525, Dec 6, 2011
Filed:
Jun 18, 2008
Appl. No.:
12/141542
Inventors:
Bryan D. Ackland - Old Bridge NJ, US
Joshua C. Park - Billerica MA, US
Assignee:
Infrared Newco, Inc. - Tucson AZ
International Classification:
H04N 5/335
US Classification:
348308, 348294, 348302
Abstract:
Methods and apparatus are provided for performing multiple correlated double sampling (CDS) operations on an imaging pixel, and in some cases on an array of imaging pixels, during a single integration cycle of the pixel(s). The multiple CDS operations may produce multiple CDS values, which may be processed in combination to produce a resulting value substantially free of various types of noise. The CDS operations may be performed using a CDS circuit including a single-ended charge amplifier having an input capacitor. The charge amplifier may also include a variable capacitance providing a variable gain. The variable capacitance may be provided by a feedback capacitor.

Imaging Apparatus And Methods

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US Patent:
8084739, Dec 27, 2011
Filed:
Jul 16, 2009
Appl. No.:
12/504005
Inventors:
Conor S. Rafferty - Newton MA, US
Anders Ingvar Aberg - Winchester MA, US
Tirunelveli Subramaniam Sriram - Acton MA, US
Bryan D. Ackland - Old Bridge NJ, US
Clifford A. King - Gloucester MA, US
Assignee:
Infrared Newco., Inc. - Tucson AZ
International Classification:
H01L 25/00
US Classification:
250332, 359359, 25033902
Abstract:
Imagers, pixels, and methods of using the same are disclosed for imaging in various spectra, such as visible, near infrared (IR), and short wavelength IR (SWIR). The imager may have an imaging array having pixels of different types. The different types of pixels may detect different ranges of wavelengths in the IR, or the SWIR, spectra. The pixels may include a filter which blocks some wavelengths of radiation in the IR spectrum while passing other wavelengths. The filter may be formed of a semiconductor material, and therefore may be easily integrated with a CMOS pixel using conventional CMOS processing techniques.

Imaging Apparatus And Methods

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US Patent:
8294100, Oct 23, 2012
Filed:
Nov 18, 2011
Appl. No.:
13/299712
Inventors:
Conor S. Rafferty - Newton MA, US
Anders Ingvar Aberg - Winchester MA, US
Tirunelveli Subramaniam Sriram - Acton MA, US
Bryan D. Ackland - Old Bridge NJ, US
Clifford A. King - Gloucester MA, US
Assignee:
Infrared Newco, Inc. - Tucson AZ
International Classification:
H01L 25/00
US Classification:
250332
Abstract:
Imagers, pixels, and methods of using the same are disclosed for imaging in various spectra, such as visible, near infrared (IR), and short wavelength IR (SWIR). The imager may have an imaging array having pixels of different types. The different types of pixels may detect different ranges of wavelengths in the IR, or the SWIR, spectra. The pixels may include a filter which blocks some wavelengths of radiation in the IR spectrum while passing other wavelengths. The filter may be formed of a semiconductor material, and therefore may be easily integrated with a CMOS pixel using conventional CMOS processing techniques.

Methods Of Operating An Imaging Pixel To Accumulate Charge From A Photocurrent

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US Patent:
8586907, Nov 19, 2013
Filed:
Aug 18, 2011
Appl. No.:
13/212271
Inventors:
Bryan D. Ackland - Old Bridge NJ, US
Assignee:
Infrared Newco, Inc. - Tucson AZ
International Classification:
H03K 17/78
H01L 27/00
US Classification:
250214DC, 2502081
Abstract:
An improved CMOS pixel with a combination of analog and digital readouts to provide a large pixel dynamic range without compromising low-light performance using a comparator to test the value of an accumulated charge at a series of exponentially increasing exposure times. The test is used to stop the integration of photocurrent once the accumulated analog voltage has reached a predetermined threshold. A one-bit output value of the test is read out of the pixel (digitally) at each of the exponentially increasing exposure periods. At the end of the integration period, the analog value stored on the integration capacitor is read out using conventional CMOS active pixel readout circuits.
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