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Bart D Selby

from Walworth, NY
Age ~66
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Also known as:
Bart Selly
Phone and address:
3950 Hall Center Rd, Walworth, NY 14568
(315) 926-0614
Related to:
Amy M Pike, 41Christine Pike, 39Hannah E Butler, 37
Connected to:
Adriana Selby, 50Benita Selby, 38Beth M Selby, 59Betsy S Selby, 61Beverly D Selby, 68Caitlin S Selby, 36Cassie N Selby, 32Chase E Selby, 33Dane M Selby, 49Daniel Selby, 60

Bart Selby Phones & Addresses

  • 3950 Hall Center Rd, Walworth, NY 14568 (315) 926-0614
  • 3970 Hall Center Rd, Walworth, NY 14568 (315) 926-0614
  • Marion, NY
  • Ontario, NY
  • Webster, NY

Work

Company: Kirtas

Education

School / High School: Western Governors University 2007

Emails

b***[email protected]

Industries

Information Technology And Services

Resumes

Resumes

Bart Selby Photo 1

Service Technician

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Location:
749 Phillips Rd, Victor, NY 14564
Industry:
Information Technology And Services
Work:
Kirtas Technologies
Service Technician
Xerox 2006 - 2008
Test Engineer
Education:
Vincennes University 1976 - 1979
Associates, Associate of Arts, Computer Programming
Bart Selby Photo 2

Bart Selby Walworth, NY

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Work:
KIRTAS

2006 to 2000
KIRTAS

2006 to 2000
Documentation Writer & Service Technician
Xerox Corporation

2002 to 2006
Test Engineer
Xerox Corporation

1979 to 2006
Xerox Corporation

1984 to 2002
Technician I
Xerox Corporation

1981 to 1984
Technician II
Xerox Corporation

1979 to 1981
Technician III

Business Records

Name / Title
Company / Classification
Phones & Addresses
Bart Selby
Principal
Bart D Selby
Business Services at Non-Commercial Site
3950 Hall Ctr Rd, Walworth, NY 14568

Publications

Us Patents

Method For Determining Offset And Gain Correction For A Light Sensitive Sensor

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US Patent:
60380381, Mar 14, 2000
Filed:
Aug 24, 1994
Appl. No.:
8/295122
Inventors:
Bart D. Selby - Walworth NY
Thomas R. Beikirch - Webster NY
Assignee:
Xerox Corporation - Stamford CT
International Classification:
H04N 1028
H04N 119
H04N 140
US Classification:
358446
Abstract:
The present invention is a method of compensating for the offset present in image signals produced by an image processing apparatus, and more particularly to accurately characterizing the offset, gain and higher order responses of image sensing elements to enable correction thereof in an image sensing device or scanner. The method utilizes intermediate (grey) reflectance targets to measure the response of each sensor element and then, using the measured responses, fits a characteristic curve to the responses to calculate the response of the sensor element, including a zero reflectance situation, to characterize an accurate offset level, gain, and higher order response for the sensor. Moreover, additional reflectance targets and response may be employed so as to enable the characterization of image sensing elements exhibiting non-linear responses to linearly increasing light intensities.

Calibration System For A Raster Input Scanner

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US Patent:
54042321, Apr 4, 1995
Filed:
Oct 4, 1993
Appl. No.:
8/131161
Inventors:
Bart D. Selby - Walworth NY
Assignee:
Xerox Corporation - Stamford CT
International Classification:
H04N 146
US Classification:
358406
Abstract:
A photosensor for measuring the reflectivity of a surface is calibrated for consistent gain and offset. The reflectivities of a plurality of regions of a test surface are measured. An average of the measured reflectivities is calculated, and a threshold value related to the average is derived therefrom. A revised average of the measured reflectivities is then calculated, the revised average being an average of measured reflectivities only of regions having reflectivities of a predetermined relationship to the threshold value. Subsequent signals from the photosensor are then revised according to a function related to the revised average.
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Bart D Selby from Walworth, NY, age ~66 Get Report