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Amit Surana

from Newington, CT
Age ~47
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Also known as:
Amit Surrana, Amit Furana, Amit Suranaph Surana
Phone and address:
113 Sterling Dr, Hartford, CT 06111
Connected to:
Alok Surana, 42Arun K Surana, 68Kavita Surana, 50Khushboo Surana, 43Lata R Surana, 72Nidhi S Surana, 38Rajni P Surana, 67Rishab Y Surana, 45Vikas Surana, 51Colleen M Surane, 44

Amit Surana Phones & Addresses

  • 113 Sterling Dr, Newington, CT 06111
  • West Hartford, CT
  • Manchester, CT
  • Cambridge, MA
  • 445 Waupelani Dr, State College, PA 16801 (814) 237-7042
  • Wheeling, IL
  • 200 Woodrow St APT D, West Hartford, CT 06107

Resumes

Resumes

Amit Surana Photo 1

Technical Fellow

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Location:
2855 Telegraph Ave, Berkeley, CA 94705
Industry:
Research
Work:
United Technologies Research Center
Technical Fellow
United Technologies Research Center Apr 2015 - Mar 2018
Associate Director
United Technologies Research Center Apr 2011 - Mar 2015
Staff Research Scientist
United Technologies Research Center Aug 2007 - Mar 2011
Senior Research Scientist
Education:
Massachusetts Institute of Technology 2003 - 2007
Doctorates, Doctor of Philosophy, Philosophy, Mechanical Engineering Penn State University 2002 - 2003
Masters, Applied Mathematics Penn State University 2000 - 2002
Masters, Mechanical Engineering Indian Institute of Technology, Bombay 1996 - 2000
Bachelors, Mechanical Engineering
Skills:
Matlab
Applied Mathematics
Machine Learning
Numerical Analysis
Mathematical Modeling
Algorithms
Latex
Optimization
Simulations
R&D
Signal Processing
Dynamical Systems and Controls
Autonomous Vehicles
Human Machine Interaction
Research and Development
Languages:
Hindi
English
Amit Surana Photo 2

Senior Research Scientist

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Location:
Hartford, CT
Industry:
Defense & Space
Work:
United Technologies Research Center
Senior Research Scientist
Education:
Massachusetts Institute of Technology 2003 - 2007
Doctorates, Doctor of Philosophy, Mechanical Engineering Penn State University 2002 - 2003
Masters, Master of Arts, Mathematics Penn State University 2000 - 2002
Master of Science, Masters, Mechanical Engineering Indian Institute of Technology, Bombay 1996 - 2000
Amit Surana Photo 3

Amit Surana

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Publications

Us Patents

System And Method For Occupancy Estimation And Monitoring

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US Patent:
20110213588, Sep 1, 2011
Filed:
Nov 7, 2008
Appl. No.:
13/126519
Inventors:
Yiqing Lin - Glastonbury CT, US
Stella M. Oggianu - Manchester CT, US
Amit Surana - East Hartford CT, US
Sean Meyn - Farmington CT, US
Igor I. Fedchenia - West Hartford CT, US
Assignee:
UTC FIRE & SECURITY - Farmington CT
International Classification:
G06F 17/18
G06F 15/00
US Classification:
702181, 702179, 702189
Abstract:
A system computes occupancy estimates based on one or more inputs, including sensor data from one or more sensor devices, constraints on allowable occupancy levels, and one or more utility functions. An occupancy estimator organizes the sensor data, the utility functions and an occupancy estimate into an objective function and executes a constrained optimization algorithm that computes the occupancy estimate, subject to the constraints, such that the objective function is minimized. The computed occupancy estimate is provided as an output by the system to one or more control and/or monitoring systems.

System And Method For Automated Indication Confirmation In Ultrasonic Testing

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US Patent:
20220404314, Dec 22, 2022
Filed:
Jun 21, 2021
Appl. No.:
17/352963
Inventors:
- Farmington CT, US
Greg C. Ojard - Vernon CT, US
Amit Surana - Newington CT, US
Ozgur Erdinc - Mansfield CT, US
Assignee:
Raytheon Technologies Corporation - Farmington CT
International Classification:
G01N 29/04
B25J 9/16
B25J 15/00
G01N 29/44
G01N 29/22
G01N 29/28
G01N 29/265
Abstract:
A system comprising a computer readable storage device readable by the system, tangibly embodying a program having a set of instructions executable by the system to perform the following steps for indication confirmation for detecting a sub-surface defect, the set of instructions comprising: an instruction to initialize a transducer starting location and a transducer orientation responsive to a prior determination of a potential flaw location; an instruction to optimize an observation point of the transducer responsive to the transducer starting location and the transducer orientation responsive to a flaw response model; an instruction to move the transducer to the observation point location and orientation; an instruction to collect the scan data at the observation point location and orientation; and an instruction to analyze the scan data to extract a measure of the flaw response model; and an instruction to update the flaw response model.

Automated Scan Data Quality Assessment In Ultrasonic Testing

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US Patent:
20220404317, Dec 22, 2022
Filed:
Jun 21, 2021
Appl. No.:
17/352957
Inventors:
- Farmington CT, US
Mahmoud El Chamie - Rocky Hill CT, US
Amit Surana - Newington CT, US
Ozgur Erdinc - Mansfield CT, US
Assignee:
Raytheon Technologies Corporation - Farmington CT
International Classification:
G01N 29/04
G01N 29/44
G01N 29/34
Abstract:
A system comprising a computer readable storage device readable by the system, tangibly embodying a program having a set of instructions executable by the system to perform the following steps for detecting a sub-surface defect, the set of instructions comprising an instruction to receive scan data for a part from a transducer; an instruction to collect the scan data; an instruction to determine an indication in the scan data that indicates a distractor, wherein the indication is based on a learning phase module and an inference phase module that the processor uses to self-assess the indication; and an instruction to create a defect indication report.

System And Method For Dual Pulse-Echo Sub-Surface Detection

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US Patent:
20220404319, Dec 22, 2022
Filed:
Jun 21, 2021
Appl. No.:
17/352964
Inventors:
- Farmington CT, US
Amit Surana - Newington CT, US
Christoph Schulze - Albany CA, US
Ayman Elkfrawy - Oakland CA, US
Ozgur Erdinc - Mansfield CT, US
Assignee:
Raytheon Technologies Corporation - Farmington CT
International Classification:
G01N 29/44
G01N 29/04
G01N 29/265
G01N 29/28
G06N 20/00
Abstract:
A system for detecting a sub-surface defect comprising a transducer fluidly coupled to a part located in a tank containing a liquid configured to transmit ultrasonic energy, the transducer configured to scan the part to create scan data of the scanned part; a pulser/receiver coupled to the transducer configured to receive and transmit the scan data; a processor coupled to the pulser/receiver, the processor configured to communicate with the pulser/receiver and collect the scan data; and the processor configured to detect the sub-surface defect and the processor configured to have a sub-surface defect confidence assessment and a prioritization for further human evaluation.

Methods And Systems For Assessing Compliance Of Aircraft Engines

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US Patent:
20220300682, Sep 22, 2022
Filed:
Mar 18, 2021
Appl. No.:
17/205335
Inventors:
- Longueuil, CA
Avisekh BANERJEE - Oakville, CA
Hongyu ZHU - West Hartford CT, US
Andrea DE ANTONI - Roma, IT
Amit SURANA - Newington CT, US
International Classification:
G06F 30/27
B64F 5/60
G06K 9/62
Abstract:
Methods and systems for assessing compliance of aircraft engines are described. The method comprises selecting a test population from a set of deployed aircraft engines based on one or more selection criteria, each of the deployed aircraft engines having associated thereto design requirements and field data; selecting at least one parameter that is present in both the design requirements and the field data of the test population, the design requirements comprising design time-series profiles, the field data comprising field time-series profiles; comparing the field time-series profiles to the design time-series profiles for the at least one parameter using a similarity metric to obtain field statistics; comparing the field statistics to expected statistics from the design requirements; and generating a compliance assessment output of the test population based on a difference between the field statistics and the expected statistics.

Methods And Systems For Defining Mission Profiles For A New Engine

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US Patent:
20220198089, Jun 23, 2022
Filed:
Dec 18, 2020
Appl. No.:
17/126147
Inventors:
- Longueuil, CA
Andrea DE ANTONI - Roma, IT
Avisekh BANERJEE - Oakville, CA
Matteo RUCCO - Trento, IT
Amit SURANA - West Hartford CT, US
Hongyu ZHU - West Hartford CT, US
International Classification:
G06F 30/15
G06F 16/2457
Abstract:
Systems and methods for defining mission profiles for a new engine are described. The method comprises selecting deployed engines from a set of existing engines based on components of the new engine using a first similarity metric; collecting field data associated with the deployed engines, the field data comprising usage and operating conditions for the deployed engines creating representative mission profiles from the field data using a second similarity metric; and defining the mission profiles for the new engine using the representative mission profiles.

Powder Bed Fusion Monitoring

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US Patent:
20200384693, Dec 10, 2020
Filed:
Jun 5, 2020
Appl. No.:
16/893790
Inventors:
- Farmington CT, US
Eklou R. Hiheglo - Manchester CT, US
Rebecca L. Runkle - Manchester CT, US
Amit Surana - West Hartford CT, US
David W. Morganson - Marlborough CT, US
International Classification:
B29C 64/393
B29C 64/153
B22F 3/105
B33Y 10/00
B33Y 50/02
Abstract:
A method of monitoring an additive manufacturing build process includes first and second phases. The first phase includes depositing a powder layer onto a powder bed. A topographical profile of the powder bed is captured with a profilometer. An image of the powder bed is captured with a camera. The image and topographical profile are combined to create a data set that is transferred to a machine learning algorithm. A set of training data is generated and includes a set of deviations from a nominal model. The second phase includes depositing a powder layer onto the powder bed. An image of the powder bed is captured and compared to the set of training data. Deviations from the nominal model of the first powder bed are determined. Any deviations that are greater than a numerical threshold are labelled and identified as a defect which includes its type and severity.

Nondestructive Inspection Using Dual Pulse-Echo Ultrasonics And Method Therefor

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US Patent:
20190339234, Nov 7, 2019
Filed:
May 4, 2018
Appl. No.:
15/971270
Inventors:
- Farmington CT, US
Amit Surana - West Hartford CT, US
Matthew O. Williams - Honolulu HI, US
Edgar A. Bernal - Webster NY, US
Ozgur Erdinc - Mansfield CT, US
Assignee:
United Technologies Corporation - Farmington CT
International Classification:
G01N 29/26
G01N 29/11
G01N 29/44
Abstract:
A method for nondestructive inspection of a component, the method includes determining a first pulse-echo scan from a first side of a component; determining a second pulse-echo scan from a second side of the component; determining a through-transmission scan based on the, first pulse-echo scan, the second pulse-echo scan, and a model of the component, the model comprises a rigid internal structure of the component; and classifying the component based on comparing the through-transmission scan to a “gold” model.
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Amit Surana from Newington, CT, age ~47 Get Report