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Alva T Stair

from Boston, MA
Age ~94
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Also known as:
At Stair
Phone and address:
8 Whittier Pl, Boston, MA 02114
Connected to:
Amber N Stair, 49Ami N Stair, 31Ann C Stair, 81Bert E Stair, 68Brandon Stair, 38Candy K Stair, 58Darcy Stair, 29Erica L Stair, 29Forrest M Stair, 66Jackie M Stair, 75

Alva Stair Phones & Addresses

  • 8 Whittier Pl, Boston, MA 02114
  • 8 Whittier Pl APT 20H, Boston, MA 02114
  • Ocala, FL
  • San Antonio, TX
  • 37 Independence Rd, Concord, MA 01742
  • Burlington, MA
  • Chantilly, VA
  • 17703 Arroyo Gold, San Antonio, TX 78232

Business Records

Name / Title
Company / Classification
Phones & Addresses
Alva Stair
President
Science & Engineering Application Corporation
Commercial Physical Research
111 S Bedford St, Burlington, MA 01803
(781) 272-0895
Alva T Stair
President
VISIDYNE, INC
Commercial Physical Research
111 S Bedford St SUITE 103, Burlington, MA 01803
99 S Bedford St, Burlington, MA 01803
S Bedford St, Burlington, MA 01803
8 Whittier Pl Ap #20H, Boston, MA 02114
(781) 273-2820
Alva T. Stair
Director
Aero Vision Technologies International, Inc. (Avti-USA)
111 S Bedford St, Burlington, MA 01803
Alva T. Stair
Director
AERO VISION TECHNOLOGIES INTERNATIONAL, INC. (AVTI
111 S Bedford St STE 104, Burlington, MA 01803

Publications

Us Patents

Optical Technique For Background Suppression

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US Patent:
40959007, Jun 20, 1978
Filed:
Aug 12, 1976
Appl. No.:
5/713749
Inventors:
Randall E. Murphy - Acton MA
George A. Vanasse - Chelmsford MA
Alva T. Stair - Concord MA
International Classification:
G01B 902
US Classification:
356106S
Abstract:
An optical technique utilized during target detection for suppressing background radiation. This optical technique incorporates therein an optical mask interposed between the background radiation containing a target and an interferometer capable of performing double-beaming in Fourier spectroscopy. The optical mask divides the field-of-view of the interferometer into a plurality of subfields-of-view, the subfields-of-view being divided into first beams of light containing the background radiation alone and second beams of light containing both the background and target radiation, thereby enabling the output of the interferometer to be in the form of an interferogram having structure due only to the target radiation.

Apparatus And Method For Identifying The Source Of Scattered Light

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US Patent:
20010048078, Dec 6, 2001
Filed:
Feb 27, 2001
Appl. No.:
09/794639
Inventors:
Alva Stair - Concord MA, US
Paul Joss - Dracut MA, US
International Classification:
G01J005/02
H01J040/14
US Classification:
250/340000, 356/364000, 250/221000
Abstract:
A method for determining the composition of a target includes the steps of sensing radiation in the short wave infrared range scattered by the target, measuring the polarization of the sensed radiation and determining, from the polarization of the sensed radiation, the presence of at least one of water and ice particles in the target area.
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Alva T Stair from Boston, MA, age ~94 Get Report