Aziz Ikhlef Phones & Addresses
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Hudson, OH
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Barberton, OH
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660 Greenway Ter, Hartland, WI 53029
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3945 Bradee Rd, Brookfield, WI 53005 (262) 754-6779
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Milwaukee, WI
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Waukesha, WI
Publications
Us Patents
Method And Apparatus For Compensating Non-Uniform Detector Collimator Plates
View pageUS Patent:
20070064866, Mar 22, 2007
Filed:
Sep 20, 2005
Appl. No.:
11/230847
Inventors:
Jiang Hsieh - Brookfield WI, US
Erdogan Gurmen - Shorewood WI, US
Aziz Ikhlef - Waukesha WI, US
Bing Shen - Cary NC, US
Gregory Zeman - Waukesha WI, US
Matthew Halsmer - Waukesha WI, US
Tyler Sprenger - Milwaukee WI, US
Erdogan Gurmen - Shorewood WI, US
Aziz Ikhlef - Waukesha WI, US
Bing Shen - Cary NC, US
Gregory Zeman - Waukesha WI, US
Matthew Halsmer - Waukesha WI, US
Tyler Sprenger - Milwaukee WI, US
International Classification:
H05G 1/60
A61B 6/00
G01N 23/00
G21K 1/12
G21K 1/02
A61B 6/00
G01N 23/00
G21K 1/12
G21K 1/02
US Classification:
378019000, 378147000
Abstract:
A method for obtaining data includes scanning an object with radiation to collect projection data using an imaging system having a detector array with detector cells and a post-patient collimator, wherein the post-patient collimator has plates having non-uniform thicknesses. The method further includes applying a correction to the projection data to shift an effective center of at least some of the detector cells to compensate for the non-uniform thicknesses of the collimator plates.