Yu M Wang

20100157117, Jun 24, 2010

Nov 3, 2009

12/611200

Yu Wang - McKinney TX, US

H04N 5/335

348276, 348E05091

A vertically stacked image sensor includes two or more image sensors aligned vertically one on top of the other. One or more cutoff color filters is positioned between each image sensor. The first image sensor in the stack receives light from a subject scene and each inferior image sensor receives the light that passes through each previous cutoff color filter.

20190064354, Feb 28, 2019

Feb 9, 2017

16/079990

- Unterpremstaetten, AT
Yu WANG - Plano TX, US

G01S 17/02
G01S 7/481

An optical sensor arrangement comprises an optoelectronic device covered by a cover arrangement and being configured to emit or detect at least electromagnetic radiation with a first wavelength through an aperture of the cover arrangement. The optical sensor arrangement further comprises a mirror arrangement arranged between the optoelectronic device and the aperture and comprising a wavelength selective mirror with a passband and a stopband. The passband includes a first wavelength range including the first wavelength, the stopband includes a second wavelength range corresponding to visible light or vice versa.

20180224546, Aug 9, 2018

May 10, 2016

15/579914

- Unterpremstaetten, AT
Yu WANG - Plano TX, US

ams AG - Unterpremstaetten

G01S 17/02
G01J 1/02
G01S 7/481
G01V 8/14
G06F 3/01
G06F 3/03
H03K 17/94

An optical sensor arrangement comprises an emitting device (E) and a detection device (D) configured to emit and detect, respectively, electromagnetic radiation and a cover (C) arranged to cover the emitting and the detection device (E, D). The sensor arrangement comprises a first cover layer (C) partially covering an inner surface of the cover (C) and having a first and a second opening located above the emitting and the detection device (E, D), respectively. The sensor arrangement comprises a second and a third cover layer (C, C) covering the inner surface at areas of the first and the second opening. A reflection and/or an absorption characteristics of at least one of the second and third cover layer (C, C) is adapted to a reflection and/or an absorption characteristics of the first cover layer (C) for incident light within the specified spectrum.

20140197306, Jul 17, 2014

Jun 6, 2012

14/124235

Yu Wang - Plano TX, US
Kerry Glover - Rockwall TX, US
David Mehrl - Plano TX, US
Greg Stoltz - Flower Mound TX, US
Tom Dunn - Dallas TX, US

ams AG - Unterpremstätten

G01B 11/14

250221

An optical proximity sensor often emits light, and detects the photons in the returned light signal. Because light can be reflected and scattered by cover glass and ink layer printed on the cover glass, optical crosstalk is a concern for the optical proximity sensors. In one embodiment, the present disclosure provides an optical proximity sensor including a linear polarizer to cover the photo detector, or a polarizer to cover the light emitting device, or two polarizers to cover both the photo detector and the light emitting device. The polarizer blocks the s-polarized light and only allows the p-polarized light to pass through. Because the scattered light is predominated by the s-polarization, the optical crosstalk may be reduced.