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Yi Tian Yu

from San Leandro, CA
Age ~64

Yi Yu Phones & Addresses

  • San Leandro, CA
  • 3921 Brookdale Ave, Oakland, CA 94619
  • 1298 34Th St, Oakland, CA 94610
  • Alameda, CA

Professional Records

License Records

Yi Yu

License #:
21369 - Expired
Category:
Architect
Issued Date:
May 12, 2009
Expiration Date:
Feb 28, 2014
Organization:
Firm Not Published

Lawyers & Attorneys

Yi Yu Photo 1

Yi Yu - Lawyer

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Address:
Vinson & Elkins LLP
Licenses:
New York - Currently registered 2005
Education:
University of Pennsylvania Law School
Specialties:
Patent Application - 34%
Patent Infringement - 33%
Communications / Media - 33%
Yi Yu Photo 2

Yi Yu - Lawyer

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Specialties:
Patent Application
Patent Infringement
Communications / Media
Communications / Media
Patent Application
ISLN:
918610759
Admitted:
2005
University:
University of Pennsylvania
Yi Yu Photo 3

Yi Yu - Lawyer

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ISLN:
1000823854
Admitted:
2018

Resumes

Resumes

Yi Yu Photo 4

Yi Yu San Francisco, CA

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Work:
GRYPHON INVESTORS

Aug 2013 to 2000
Private Equity Associate - Business Services Group

Orchid Underwriters

Nov 2014 to Nov 2014

MORGAN STANLEY

Jun 2011 to Jul 2013
Investment Banking Analyst - Media & Communications Group

Endurance Int'l Group

2011 to Dec 2011
Sole Advisor

Summer AnalystNew York, NY
Jun 2010 to Aug 2010

Education:
UNIVERSITY OF CALIFORNIA, BERKELEY
Berkeley, CA
Aug 2007 to May 2011
B.S. in Business Administration & B.A

Business Records

Name / Title
Company / Classification
Phones & Addresses
Yi Yu
DONG YING ASIAN MARKET, INC

Publications

Us Patents

Methods To Produce Ultra-Thin Metal Nanowires For Transparent Conductors

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US Patent:
20180326498, Nov 15, 2018
Filed:
Sep 25, 2015
Appl. No.:
15/513023
Inventors:
Jianwei Sun - Albany CA, US
Yi Yu - Berkeley CA, US
Fan Cui - Berkeley CA, US
International Classification:
B22F 9/24
B22F 1/00
H01B 1/02
H01B 13/00
Abstract:
The disclosure provides methods to produce ultrathin metal nanowires, the metal nanowires produced therefrom, and the use of the metal nanowires as transparent conductors.

Procedure For Formulating A Signal To Interference Plus Noise Ratio

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US Patent:
20160174126, Jun 16, 2016
Filed:
Feb 23, 2016
Appl. No.:
15/051407
Inventors:
- Waterloo, CA
Mo-Han FONG - Sunnyvale CA, US
Zhijun CAI - Ashburn VA, US
Yi YU - Reston VA, US
Yi SONG - Plano TX, US
Rose Qingyang HU - Providence UT, US
Assignee:
BlackBerry Limited - Waterloo
International Classification:
H04W 36/30
H04W 24/02
H04W 36/00
Abstract:
A method and system for formulating an SINK metric for cells using only the existing RSRP and RSRQ measurements. With this method and system side information is exchanged between eNBs of an E-UTRAN using the X2 interface where the X2 interface carries the X2 Application Protocol (X2AP). The side information is introduced either within X2AP messages exchanged between eNB nodes or via modification of existing X2AP messages. Serving cell system information block (SIB) messages may also be modified or new SIB messages introduced to facilitate computation of an SNIR metric at a UE.
Yi Tian Yu from San Leandro, CA, age ~64 Get Report