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Yan J Zhao

from San Mateo, CA
Age ~73
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Also known as:
Yan Te Zhao, Yan L Zhao, Julie Yan Zhao, Julie Y Zhao, Ya N Zhao, Yan Zhau, Zhao Yan
Phone and address:
320 Peninsula Ave APT 219, San Mateo, CA 94401
(650) 342-0928
Related to:
Amy Yun Zhang, 48Van Zhao, 52Zhaojia R Yan, 51Yoshie Mori, 51Wenchang Yan, 55Yu Zhou, 59Zhao Yan, 52Jingsan Zhao, 67
Connected to:
Alicia E Zhao, 29Allan Zhao, 29Anni Zhao, 37April Zhao, 67Beiping Zhao, 39Betty Y Zhao, 55Bohan Zhao, 33Brandon A Zhao, 32Byron D Zhao, 57Can Zhao, 36

Yan Zhao Phones & Addresses

  • 320 Peninsula Ave APT 219, San Mateo, CA 94401 (650) 342-0928
  • Antioch, CA
  • San Jose, CA
  • 3670 Heath Way, Chandler, AZ 85248
  • Burlingame, CA

Professional Records

Medicine Doctors

Yan Zhao Photo 1

Yan S. Zhao

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Specialties:
Gastroenterology
Work:
Loma Linda Physicians Medical GroupLoma Linda Rheumatology & Gastroenterology
11370 Anderson St STE 3625, Loma Linda, CA 92354
(909) 558-2860 (phone), (909) 558-2417 (fax)
Education:
Medical School
Beijing Med Univ, Beijing City, Beijing, China
Graduated: 1993
Procedures:
Destruction of Benign/Premalignant Skin Lesions
Sigmoidoscopy
Colonoscopy
Esophageal Dilatation
Upper Gastrointestinal Endoscopy
Conditions:
Anemia
Constipation
Gastroesophageal Reflux Disease (GERD)
Gastrointestinal Hemorrhage
Inflammatory Bowel Disease (IBD)
Languages:
English
Description:
Dr. Zhao graduated from the Beijing Med Univ, Beijing City, Beijing, China in 1993. She works in Loma Linda, CA and specializes in Gastroenterology. Dr. Zhao is affiliated with Loma Linda University Medical Center.
Yan Zhao Photo 2

Yan Zhao

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Specialties:
Hematology/Oncology
Work:
University Alabama Birmingham Hematology Oncology
1802 6 Ave S STE NP2540, Birmingham, AL 35233
(205) 996-7557 (phone), (205) 975-9002 (fax)
Languages:
English
Spanish
Description:
Dr. Zhao works in Birmingham, AL and specializes in Hematology/Oncology. Dr. Zhao is affiliated with University Of Alabama Hospital.
Yan Zhao Photo 3

Yan Zhao

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Specialties:
Pathology
Anatomic Pathology & Clinical Pathology
Cytopathology
Education:
(1987)

Lawyers & Attorneys

Yan Zhao Photo 4

Yan Zhao - Lawyer

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Address:
Dla Piper Uk LLP
(213) 852-2111 (Office)
Licenses:
New York - Currently registered 2000
Education:
The George Washington University
Specialties:
Advertising - 34%
Patent Infringement - 33%
Copyright Infringement - 33%
Yan Zhao Photo 5

Yan Zhao - Lawyer

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Office:
Haiwen & Partners
ISLN:
920710065
Admitted:
People's Republic of China
Law School:
China University of Political Science and Law, LL.B., 1984

License Records

Yan Peter Zhao

License #:
285210
Category:
Physician
Issued Date:
Jun 21, 2016
Type:
MEDICINE

Resumes

Resumes

Yan Zhao Photo 6

Yan Zhao San Francisco, CA

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Work:
Department of Chemistry and Biochemistry San Francisco State University

Jan 2014 to 2000
Lecturer of chemistry survey
Department of Chemistry and Biochemistry San Francisco State University

Jun 2011 to 2000
Research Assistant
Department of Chemistry and Biochemistry San Francisco State University
San Francisco, CA
Aug 2011 to Dec 2013
Graduate Assistant of Analytical Instruments
Department of Chemistry and Biochemistry San Francisco State University
San Francisco, CA
Jan 2011 to Dec 2013
Graduate Teaching Assistant
Liaoning University Petroleum and Chemical Technology
Fushun, Liaoning, China
Apr 2008 to Jul 2010
Lab Technician
Education:
San Francisco State University
2011 to 2013
M.S. in Chemistry
Liaoning University of Petroleum and Chemical Technology
Fushun, Liaoning,China
2004 to 2008
BS in Chemistry

Business Records

Name / Title
Company / Classification
Phones & Addresses
Yan Zhao
President
LUCKY FEET, INC
Ret Shoes
2141 Tully Rd, San Jose, CA 95131
(408) 923-3888
Yan Zhao
Managing
Yuan Holding, LLC
Real Estate Investment
270 Redwood Shr Pkwy, Redwood City, CA 94065
450 Neptune Dr, Redwood City, CA 94065
Yan Zhao
Xinai Investment LLC
3180 Apperson Rdg Dr, San Jose, CA 95148
Yan Luchan Zhao
CENTURY ALTERATIONS AND TRADITIONAL GIFTS LLC
Yan Zhao
President
Northport Investments, Inc
Yan Zhao
President
Bloomage International Investment Group, Inc
200 Irene Ct, Belmont, CA 94002
Yan Zhao
President
CHONG WING SHIPPING, INC
320 Peninsula Ave STE 219, San Mateo, CA 94401

Publications

Amazon

Preparatory Textbook For Foreign Students (Peking University Edition)-Professional Chinese Course Series- Chinese Course About Chinese History (Chinese Edition)

Preparatory Textbook for Foreign Students (Peking University Edition)-Professional Chinese Course Series- Chinese Course about Chinese History (Chinese Edition)

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This is an advanced Chinese textbook, different from other Chinese textbooks mainly in the limited range of Chinese history. In terms of professional features, this book just talks about the historical common sense, rather than systematic political knowledge; in terms of teaching objectives, this bo...
Author

zhao yan feng

Binding

Paperback

Pages

199

Publisher

Peking University Press

ISBN #

7301126174

EAN Code

9787301126172

ISBN #

9

If I'd Only Known That

If I'd Only Known That

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Donald Rumsfeld famously said of the Iraq war that "There are known knowns. These are things we know that we know. There are known unknowns. That is to say, there are things that we know we don't know. But there are also unknown unknowns, the ones we don't know we don't know." He got a lot of flack ...
Author

Achaessa James, Bruce Brumberg, Jon F. Doyle, Kate Forsyth, Jennifer George, Steve Kifer, Kim Kovacs, Paul Leisey, Takis Makridis, Mark Miller, David Outlaw, Corey Rosen, Robyn Shutak, Jim Sillery, Mike Stevens, Dan Walter, Fred Whittlesey, Yan Zhao

Binding

Perfect Paperback

Pages

142

Publisher

The National Center for Employee Ownership (NCEO)

ISBN #

1932924817

EAN Code

9781932924817

ISBN #

3

Drops Of Knowledge Of C++: Practical Skills Using C++

Drops of knowledge of C++: Practical Skills using C++

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This book is about C++ language practical skills. All the skills are based on either classical C++ book or author's 20 years C++ developing career. All skills are shown in item listtogether with C++ code examples. It make reader can read and understand these skills very quickly and easily.The book i...
Author

Yan zhao

Binding

Kindle Edition

Pages

132

Publisher

Yan Zhao

ISBN #

2

C Language Drip(Chinese Edition)

C language drip(Chinese Edition)

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Author

ZHAO YAN

Binding

Paperback

Publisher

People Post Press

ISBN #

7115321981

EAN Code

9787115321985

ISBN #

6

Second Language Creative Writers: Identities And Writing Processes (Second Language Acquisition)

Second Language Creative Writers: Identities and Writing Processes (Second Language Acquisition)

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This monograph investigates 15 L2 creative writers' social constructive power in identity constructions. Through interviews and think-aloud story writing sessions, the central study considers how L2 writer voices are mediated by the writers' autobiographical identities, namely, their sense of selves...
Author

Yan Zhao

Binding

Paperback

Pages

216

Publisher

Multilingual Matters

ISBN #

1783092998

EAN Code

9781783092994

ISBN #

5

Spoken English for Academic Purposes(Chinese Edition)

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Pub Date: 2014-07-01 Pages: 268 Language: Chinese. English Publisher: Shanghai Jiaotong University Press 'academic exchanges English Graduate Public English textbook series' main line of academic exchanges. by creating interactive language environment. will read. vision. hearing. speaking. writing a...
Author

ZHAO HONG YAN

Binding

Paperback

Publisher

Shanghai Jiaotong University Press

ISBN #

7313110235

EAN Code

9787313110237

ISBN #

10

Us Patents

Method For In-Line Monitoring Of Via/Contact Holes Etch Process Based On Test Structures In Semiconductor Wafer Manufacturing

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US Patent:
6815345, Nov 9, 2004
Filed:
Nov 21, 2002
Appl. No.:
10/302809
Inventors:
Yan Zhao - San Jose CA
Chang-Chun (Roland) Yeh - Miaoli, TW
Zhongwei Chen - San Jose CA
Jack Jau - Los Altos CA
Assignee:
Hermes-Microvision (Taiwan) Inc. - Hsinchu
International Classification:
H01L 2144
US Classification:
438657, 438708, 438735
Abstract:
A method for in-line monitoring of via/contact etching process based on a test structure is described. The test structure is comprised of via/contact holes of different sizes and densities in a layout such that, for a certain process, the microloading or RIE lag induced non-uniform etch rate produce under-etch in some regions and over-etch in others. A scanning electron microscope is used to distinguish these etching differences in voltage contrast images. Image processing and simple calibration convert these voltage contrast images into a âfingerprintâ image characterizing the etching process in terms of thickness over-etched or under-etched. Tolerance of shifting or deformation of this image can be set for validating the process uniformity. This image can also be used as a measure to monitor long-term process parameter shifting, as well as wafer-to-wafer or lot-to-lot variations. Advanced process control (APC) can be performed in-line with the guidance of this image so that potential electrical defects are avoided and process yield ramp accelerated.

Common User Profile Server And Method

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US Patent:
6944677, Sep 13, 2005
Filed:
May 9, 2000
Appl. No.:
09/567255
Inventors:
Yan Zhao - Mountain View CA, US
Assignee:
Aspect Communications Corporation - San Jose CA
International Classification:
G06F015/173
US Classification:
709244, 707 10
Abstract:
A method and apparatus is provided for facilitating the exchange of user profile information between an information provider and an application system. The invention allows a user to create and edit user profile information stored by an information provider. The information provider stores the information and provides a mechanism for providing the user profile information, or portions thereof, to various application systems. When a user initiates a registration or similar process with an application system, the present invention facilitates the exchange of information between the application system and the information provider to streamline the registration process.

Method For In-Line Monitoring Of Via/Contact Holes Etch Process Based On Test Structures In Semiconductor Wafer Manufacturing

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US Patent:
7105436, Sep 12, 2006
Filed:
Jun 9, 2004
Appl. No.:
10/865230
Inventors:
Yan Zhao - San Jose CA, US
Chang-Chun Yeh - Miaoli, TW
Zhong-Wei Chen - San Jose CA, US
Jack Jau - Los Altos CA, US
Assignee:
Hermes-Microvision, Inc. - Hsinchu
International Classification:
H01L 21/4763
US Classification:
438637, 438735
Abstract:
A method for in-line monitoring of via/contact etching process based on a test structure is described. The test structure is comprised of via/contact holes of different sizes and densities in a layout such that, for a certain process, the microloading or RIE lag induced non-uniform etch rate produce under-etch in some regions and over-etch in others. A scanning electron microscope is used to distinguish these etching differences in voltage contrast images. Image processing and simple calibration convert these voltage contrast images into a “fingerprint” image characterizing the etching process in terms of thickness over-etched or under-etched. Tolerance of shifting or deformation of this image can be set for validating the process uniformity. This image can also be used as a measure to monitor long-term process parameter shifting, as well as wafer-to-wafer or lot-to-lot variations. Advanced process control (APC) can be performed in-line with the guidance of this image so that potential electrical defects are avoided and process yield ramp accelerated.

Method And System To Register A User On An Application System

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US Patent:
7373374, May 13, 2008
Filed:
Jun 8, 2005
Appl. No.:
11/149053
Inventors:
Yan Zhao - Mountain View CA, US
Assignee:
Aspect Software, Incorporated - Bombard IL
International Classification:
G06F 15/16
US Classification:
709201
Abstract:
A method and system to register a user on an application system. The system includes an application system that receives a first request to retrieve user profile information to register the user on the application system. The application system, in turn, communicates a second request for the user profile information to the information provider. Finally, the application system receives the user profile information from the information provider to register the user on the application system.

Method For In-Line Monitoring Of Via/Contact Holes Etch Process Based On Test Structures In Semiconductor Wafer Manufacturing

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US Patent:
7474001, Jan 6, 2009
Filed:
Jun 13, 2006
Appl. No.:
11/452544
Inventors:
Yan Zhao - San Jose CA, US
Chang-Chun Yeh - Miaoli, TW
Zhong-Wei Chen - San Jose CA, US
Jack Jau - Los Altos CA, US
Assignee:
Hermes-Microvision, Inc. - San Jose CA
International Classification:
H01L 21/31
H01L 21/469
US Classification:
257758, 257750, 438622
Abstract:
A method for in-line monitoring of via/contact etching process based on a test structure is described. The test structure is comprised of via/contact holes of different sizes and densities in a layout such that, for a certain process, the microloading or RIE lag induced non-uniform etch rate produce under-etch in some regions and over-etch in others. A scanning electron microscope is used to distinguish these etching differences in voltage contrast images. Image processing and simple calibration convert these voltage contrast images into a “fingerprint” image characterizing the etching process in terms of thickness over-etched or under-etched. Tolerance of shifting or deformation of this image can be set for validating the process uniformity. This image can also be used as a measure to monitor long-term process parameter shifting, as well as wafer-to-wafer or lot-to-lot variations. Advanced process control (APC) can be performed in-line with the guidance of this image so that potential electrical defects are avoided and process yield ramp accelerated.

Non-Coplanar High-Speed Interconnects

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US Patent:
7859367, Dec 28, 2010
Filed:
Oct 9, 2008
Appl. No.:
12/248456
Inventors:
Yan Yang Zhao - Fremont CA, US
Yuheng Lee - San Jose CA, US
Jianying Zhou - Acton MA, US
Assignee:
Finisar Corporation - Sunnyvale CA
International Classification:
H03H 7/38
H01P 1/04
US Classification:
333260, 333 33
Abstract:
In one example embodiment, a high-speed package includes first and second layers and a multi-channel non-coplanar interconnect. The first layer includes first and second sets of coplanar transmission lines. The second layer includes third and fourth sets of coplanar transmission lines. The multi-channel non-coplanar interconnect includes first and second channels. The first channel connects the first set of transmission lines to the third set of transmission lines. The second channel connects the second set of transmission lines to the fourth set of transmission lines.

Charged Particle Beam Imaging Method And System Thereof

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US Patent:
7884334, Feb 8, 2011
Filed:
Jan 22, 2009
Appl. No.:
12/357969
Inventors:
Yan Zhao - San Jose CA, US
Jack Jau - Los Altos Hills CA, US
Assignee:
Hermes Microvision, Inc. - Hsinchu
International Classification:
G01K 1/08
H01J 3/14
H01J 3/26
US Classification:
250398, 250306, 250307, 250309, 250310, 250311, 250396 R, 250397, 250423 R, 250424
Abstract:
The method includes scanning a sample in at least one first scan line using a first charged particle beam probe; scanning the sample in at least one second scan line using a second charged particle beam probe, and scanning the sample in at least one third scan line using the first charged particle beam probe. The first or second charged particle beam probe is defocused by a control module of the imaging system through adjusting a condenser lens module, an objective lens module, a sample stage of the imaging system, or their combination. An image of the sample is selectively formed from the first, second and third scan lines. The first and the second charged particle beams induce a first charging condition and a second charging condition on the sample surface respectively. The second charging condition can enhance, mitigate, eliminate, reverse or have no effect on the first charging condition.

High-Speed Interconnects

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US Patent:
7978030, Jul 12, 2011
Filed:
Feb 12, 2008
Appl. No.:
12/030142
Inventors:
Yuheng Lee - San Jose CA, US
Jianying Zhou - Acton MA, US
Yan Yang Zhao - Fremont CA, US
Christopher R. Cole - Redwood City CA, US
Bernd Huebner - Santa Clara CA, US
Assignee:
Finisar Corporation - Sunnyvale CA
International Classification:
H01P 1/00
US Classification:
333247, 333254
Abstract:
In one example embodiment, a high-speed transponder includes a printed circuit board having a set of coplanar high-speed traces, and a high-speed circuit and a package mounted to the printed circuit board. The package includes an outside housing and a second high-speed circuit positioned inside the housing. The high-speed transponder also includes a high-speed feed thru which includes an inside coplanar structure positioned inside the housing, a strip line structure positioned through the housing, and an outside coplanar structure positioned outside the housing. The second high-speed circuit is operably coupled to the inside coplanar structure, which is operably coupled to the strip line structure, which is operably coupled to the outside coplanar structure, which is operably coupled to the first high-speed circuit via the set of coplanar high-speed traces. The signal plane of the outside coplanar structure is flipped with respect to a signal plane of the inside coplanar structure.
Control profile
Yan J Zhao from San Mateo, CA, age ~73 Get Report