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Wayne Chen

from Fremont, CA
Age ~47
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Also known as:
Dean W Chen, Wen Chen Dean
Phone and address:
5587 Tyler Pl, Fremont, CA 94538
Related to:
Huahuei Chen, 98Shaun H Chen, 66Lydia Chen, 45Chen Zhang, 52Liping Chen, 64
Connected to:
Ai S Chen, 71Ai Chen, 70Alfred C Chen, 53Alix Y Chen, 33Aloysius J Chen, 93Amie K Chen, 63Amily M Chen, 35Andersen Y Chen, 32Angela B Chen, 44Angeline Chen, 48

Wayne Chen Phones & Addresses

  • 5587 Tyler Pl, Fremont, CA 94538
  • 1111 Weyburn Ln, San Jose, CA 95129
  • Cupertino, CA
  • Seattle, WA

Professional Records

Lawyers & Attorneys

Wayne Chen Photo 1

Wayne Chen - Lawyer

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ISLN:
910157658
Admitted:
1996
University:
University of Chicago, B.A., 1992
Law School:
New York University, J.D., 1995
Wayne Chen Photo 2

Wayne Wei-Jen Chen - Lawyer

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Address:
(223) 258-660x (Office)
Licenses:
New York - Currently registered 1996
Education:
Nyu
Wayne Chen Photo 3

Wayne Chen - Lawyer

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Office:
Llinks Law Offices
ISLN:
920735464
Admitted:
2000
University:
East China University of Politics and Law; Fudan University

Medicine Doctors

Wayne Chen Photo 4

Wayne C. Chen

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Specialties:
Pediatrics, Adolescent Medicine
Work:
Anne Chen MD
6000 Steubenville Pike STE 101, McKees Rocks, PA 15136
(412) 787-7766 (phone), (412) 787-0370 (fax)

Anne Chen MD & Associates Pediatric & Adolescent Medicine
2715 Brownsville Rd, Pittsburgh, PA 15227
(412) 882-3654 (phone), (412) 882-0966 (fax)
Procedures:
Circumcision
Destruction of Benign/Premalignant Skin Lesions
Hearing Evaluation
Psychological and Neuropsychological Tests
Vaccine Administration
Conditions:
Acute Conjunctivitis
Acute Pharyngitis
Allergic Rhinitis
Atopic Dermatitis
Attention Deficit Disorder (ADD)
Languages:
Chinese
English
Description:
Dr. Chen works in Pittsburgh, PA and 1 other location and specializes in Pediatrics and Adolescent Medicine. Dr. Chen is affiliated with Magee Womens Hospital Of UPMC, St Clair Hospital and UPMC Mercy.
Wayne Chen Photo 5

Wayne X. Chen

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Specialties:
Internal Medicine
Work:
Prime HealthcarePrime Healthcare PC
44 Dl Rd STE 204, Avon, CT 06001
(860) 674-8830 (phone), (860) 674-8984 (fax)

Prime Healthcare
19 Woodland St STE 43, Hartford, CT 06105
(860) 549-4600 (phone), (860) 674-8984 (fax)
Education:
Medical School
UMDNJ New Jersey Medical School at Newark
Graduated: 1989
Conditions:
Acute Bronchitis
Acute Sinusitis
Acute Upper Respiratory Tract Infections
Alopecia Areata
Anxiety Phobic Disorders
Languages:
English
Portuguese
Spanish
Description:
Dr. Chen graduated from the UMDNJ New Jersey Medical School at Newark in 1989. He works in Avon, CT and 1 other location and specializes in Internal Medicine. Dr. Chen is affiliated with Saint Francis Hospital & Medical Center.
Wayne Chen Photo 6

Wayne Weiping Chen

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Specialties:
Pathology
Anatomic Pathology & Clinical Pathology
Hematology
Education:
Nanjing University Medical College (1985)

Real Estate Brokers

Wayne Chen Photo 7

Wayne Chen, Bensonhurst Brooklyn Landlord

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Work:
(917) 681-2885 (Phone)

Resumes

Resumes

Wayne Chen Photo 8

Wayne Chen Ithaca, NY

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Work:
Cornell University

Sep 2010 to 2000
Nano-Composite Silicon Lubricant Research Assistant
Cornell University
Ithaca, NY
Sep 2010 to Nov 2010
Professor Tobias Hanrath's Group
Nanosys, Inc., Palo Aloto, CA

Feb 2010 to Jul 2010
Environmental and Reliability Testing Contractor
International Nano

Jun 2007 to Jul 2010
Optoelectronics Workshop Administrative Assistant
Hasnain's Group, University of California at Berkeley
Berkeley, CA
Jun 2008 to Aug 2008
Professor Connie Chang
Education:
University of California
Berkeley, CA
Dec 2008
Bachelor of Science in Chemical Engineering
Cornell University, School of Engineering
Ithaca, NY
Master of Engineering in Chemical Engineering

Business Records

Name / Title
Company / Classification
Phones & Addresses
4044 Clipper Ct, Fremont, CA 94538
Wayne Chen
Owner, President
Nu Technology Inc
Computer & Software Stores
4044 Clipper Ct, Fremont, CA 94538
(510) 226-1450, (510) 226-6107
Wayne Chen
Director
America Aopen Inc
Nonclassifiable Establishments · Ret Radio/TV/Electronics
1911 Lundy Ave, San Jose, CA 95131
Wayne T. Chen
Manager
PEI2, LC
Wayne Chen
President
Ample Investment, Inc
1070 Quesada Ave, San Francisco, CA 94124
Wayne Chen
President
TOUGH STEEL, INC
Metals Service Center
33 Elmira St, San Francisco, CA 94124
1070 Quesada Ave, San Francisco, CA 94124
(415) 330-9635
Wayne Chen
Principal
Sunshine Posada
Nonclassifiable Establishments
511 7 Ave, Kirkland, WA 98033
Wayne W. Chen
Managing
W & D Industries, LLC
Electronic Commerce
39500 Stevenson Pl, Fremont, CA 94539
43496 Laurel Gln Cmn, Fremont, CA 94539

Publications

Us Patents

System And Methods For Classifying Anomalies Of Sample Surfaces

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US Patent:
6590645, Jul 8, 2003
Filed:
May 4, 2000
Appl. No.:
09/566352
Inventors:
Wayne Chen - Palo Alto CA
Andrew Zeng - Milipitas CA
Mustafa Akbulut - Milpitas CA
Assignee:
KLA-Tencor Corporation - San Jose CA
International Classification:
G01N 2100
US Classification:
3562372, 3562374
Abstract:
Two or more defect maps may be provided for the same sample surface at different detection sensitivities and/or processing thresholds. The defect maps may then be compared for better characterization of the anomalies as scratches, area anomalies or point anomalies. This can be done without concealing the more significant and larger size defects amongst numerous small and immaterial defects. One or more defect maps can be used to report the anomalies with classified information; the results from this map(s) can be used to monitor the process conditions to obtain better yield.

System And Methods For Classifying Anomalies Of Sample Surfaces

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US Patent:
7016031, Mar 21, 2006
Filed:
Mar 1, 2004
Appl. No.:
10/791026
Inventors:
Wayne Chen - Palo Alto CA, US
Andrew Zeng - Milipitas CA, US
Mustafa Akbulut - Milpitas CA, US
Assignee:
KLA-Tencor Corporation - San Jose CA
International Classification:
G01N 21/00
US Classification:
3562372, 3562374
Abstract:
Two or more defect maps may be provided for the same sample surface at different detection sensitivities and/or processing thresholds. The defect maps may then be compared for better characterization of the anomalies as scratches, area anomalies or point anomalies. This can be done without concealing the more significant and larger size defects amongst numerous small and immaterial defects. One or more defect maps can be used to report the anomalies with classified information; the results from this map(s) can be used to monitor the process conditions to obtain better yield.

System And Methods For Classifying Anomalies Of Sample Surfaces

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US Patent:
7038772, May 2, 2006
Filed:
Jul 3, 2003
Appl. No.:
10/613634
Inventors:
Wayne Chen - Palo Alto CA, US
Andrew Zeng - Milipitas CA, US
Mustafa Akbulut - Milpitas CA, US
Assignee:
KLA-Tencor Corporation - San Jose CA
International Classification:
G01N 21/00
US Classification:
3562372, 3562374
Abstract:
Two or more defect maps may be provided for the same sample surface at different detection sensitivities and/or processing thresholds. The defect maps may then be compared for better characterization of the anomalies as scratches, area anomalies or point anomalies. This can be done without concealing the more significant and larger size defects amongst numerous small and immaterial defects. One or more defect maps can be used to report the anomalies with classified information; the results from this map(s) can be used to monitor the process conditions to obtain better yield.

Method And Apparatus For Efficient Hardware Based Deflate

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US Patent:
7307552, Dec 11, 2007
Filed:
Nov 16, 2005
Appl. No.:
11/281039
Inventors:
Kevin Ma - Nashua NH, US
Wayne Wei-Wen Chen - San Jose CA, US
Assignee:
Cisco Technology, Inc. - San Jose CA
International Classification:
H03M 7/34
H03M 7/38
US Classification:
341 51, 341 65, 341 67, 341 87, 341106
Abstract:
A method and apparatus provide for data compression with deflate block overhead reduction through the use of “pseudo-dynamic” Huffman codes to enable single deflate block encoding in a deflate algorithm implementation. Further, provided is data compression with deflate block overhead reduction through the use of “pseudo-dynamic” Huffman codes to enable single deflate block encoding in a deflate algorithm implementation, with inflation detection and mitigation capabilities.

System And Methods For Classifying Anomalies Of Sample Surfaces

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US Patent:
7315365, Jan 1, 2008
Filed:
Apr 25, 2006
Appl. No.:
11/411529
Inventors:
Wayne Chen - Palo Alto CA, US
Andrew Zeng - Milipitas CA, US
Mustafa Akbulut - Milpitas CA, US
Assignee:
KLA-Tencor Corporation - San Jose CA
International Classification:
G01N 21/00
US Classification:
3562372, 3562375
Abstract:
Two or more defect maps may be provided for the same sample surface at different detection sensitivities and/or processing thresholds. The defect maps may then be compared for better characterization of the anomalies as scratches, area anomalies or point anomalies. This can be done without concealing the more significant and larger size defects amongst numerous small and immaterial defects. One or more defect maps can be used to report the anomalies with classified information; the results from this map(s) can be used to monitor the process conditions to obtain better yield.

Method And System For Inspecting Surfaces With Improved Light Efficiency

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US Patent:
7564544, Jul 21, 2009
Filed:
Jan 23, 2007
Appl. No.:
11/626102
Inventors:
Guoheng Zhao - Milpitas CA, US
Zheng Yan - San Jose CA, US
Bo Li - Palo Alto CA, US
Wayne Chen - Palo Alto CA, US
Assignee:
3i Systems Corporation - Sunnyvale CA
International Classification:
G01N 21/00
US Classification:
3562372, 3562375
Abstract:
The radiation beam of discrete light source such as LEDs is shaped by a cylindrical lens and a spherical lens to form two perpendicular narrow lines to illuminate a surface. The first line is projected onto a sample surface to improve illumination efficiency, and the second line is projected onto a pupil plane of an imaging lens to improve illumination uniformity. The layout of the LED chip is optimized to match the aspect ratio of the imaging detector. Multiple LEDs at different wavelengths are combined to improve sensitivity. The full surface of the sample is inspected through the relative motion between the sample and the optics.

Automatic Inspection System For Flat Panel Substrate

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US Patent:
7714996, May 11, 2010
Filed:
Mar 5, 2007
Appl. No.:
11/714513
Inventors:
Zheng Yan - Sunnyvale CA, US
Bo Li - Sunnyvale CA, US
Wayne Chen - Sunnyvale CA, US
Tony Young - Sunnyvale CA, US
Ning Li - Sunnyvale CA, US
Jianbo Gao - Sunnyvale CA, US
Assignee:
3i Systems Corporation - Santa Clara CA
International Classification:
G01N 21/00
US Classification:
3562371, 3562375
Abstract:
Automatic optical inspection (AOI) systems are described comprising optical modules that include an illumination component and a lens array configured to direct illumination of the illumination component at a portion of a substrate. The lens array includes a Fresnel lens. The optical module includes a camera that receives reflected light resulting from an interaction of the illumination and the substrate. The camera includes a time delay integration (TDI) sensor. A telecentric imaging lens directs reflected light from the substrate to the camera. The illumination component comprises a controller coupled to multiple LED light sources, each emitting light at a different wavelength. The controller independently controls each LED light source. The illumination component includes a bright field and/or a dark field light source. The illumination component can include a front side and/or a back side light source.

Memory Device For A Microprocessor Register File Having A Power Management Scheme And Method For Copying Information Between Memory Sub-Cells In A Single Clock Cycle

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US Patent:
61733792, Jan 9, 2001
Filed:
May 14, 1996
Appl. No.:
8/645653
Inventors:
Mircea Poplingher - Campbell CA
Wenliang Chen - Sunnyvale CA
Ganesh Suryanarayanan - Santa Clara CA
Wayne W. Chen - San Jose CA
Roger Y. Lo - San Jose CA
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
G06F 1300
G11C 11413
US Classification:
711165
Abstract:
A memory device including an array of memory cells and a method for copying information within the memory device. Each memory cell includes a first memory sub-cell and a second memory sub-cell. Each memory cell also includes a device that copies information from the first memory sub-cell into the second memory sub-cell. Each memory cell may include a static random access memory (SRAM) cell and may utilize tri-state inverters to make overwriting information easier and reduce power consumption. Each memory cell may also include a second copy device that allows information to be copied from the second memory sub-cell to the first memory sub-cell. The memory device may be provided in a register file of a microprocessor to copy information from an architectural branch register (ABR) file to a speculative branch register (SBR) file.

Isbn (Books And Publications)

The Year of the Robot

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Author

Wayne H. Chen

ISBN #

0918398509

Plasticity in Reinforced Concrete

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Author

Wayne F. Chen

ISBN #

0070106878

Amazon

The Sky is the Limit in International Trade: How to Make a Fortune in Import Business

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"Who should read this book?Residents in the United States of America, Central America, South America, Canada and Europe, who are interested in starting an import business. They should know how to do it and what to watch for.Manufacturers and exporters in Asian countries, such as China, Taiwan, Hong ...
Author

Ph.D Wayne Chen

Binding

Kindle Edition

Pages

269

Publisher

AuthorHouse

ISBN #

10

The Sky is the Limit in International Trade: How to Make a Fortune in Import Business

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Who should read this book?Residents in the United States of America, Central America, South America, Canada and Europe, who are interested in starting an import business. They should know how to do it and what to watch for.Manufacturers and exporters in Asian countries, such as China, Taiwan, Hong K...
Author

Wayne Chen

Binding

Paperback

Pages

276

Publisher

AuthorHouse

ISBN #

1420808893

EAN Code

9781420808896

ISBN #

3

The Fart Without Fear Cookbook

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Fart Without Fear: Comfort Food for Uncomfortable Times is the world’s first laugh-out-loud, instantly useable, self-improvement comfort food cookbook. Find out what uptight politically correct chefs, nutritionists and scientists have known for years but haven’t told you. Think fried chicken, macar...
Author

Wayne Chen, Gary Goss

Binding

Paperback

Pages

200

Publisher

PublishingWorks

ISBN #

1935557688

EAN Code

9781935557685

ISBN #

2

Reggae Routes: The Story of Jamaican Music

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Bob Marley's recordings, some twenty years after his death, still enjoy enormous international popularity. For popular music fans in most of the world, reggae looms so large as to be Jamaica's only music and Marley its consummate musician. In this book, Jamaicans Kevin Chang and Wayne Chen, offer a ...
Author

Kevin O'Brien Chang, Wayne Chen

Binding

Paperback

Pages

246

Publisher

Temple University Press

ISBN #

9781566396295

EAN Code

9781566396295

ISBN #

1

Linear network design and synthesis.

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Author

Wayne H. Chen

Binding

Paperback

Publisher

McGraw-Hill

ISBN #

7

The analysis of linear systems.

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Author

Wayne H. Chen

Binding

Paperback

Publisher

McGraw-Hill

ISBN #

6

Control profile
Wayne Chen from Fremont, CA, age ~47 Get Report