Search

Tan Lu Phones & Addresses

  • 4661 Saint Francis Ter, Fremont, CA 94539
  • 265 William St, San Jose, CA 95112 (408) 483-9924
  • 261 William St, San Jose, CA 95112
  • 480 6Th St, San Jose, CA 95112
  • Gilroy, CA
  • Morgan Hill, CA
  • Adelanto, CA
  • Santa Clara, CA
  • Mountain View, CA

Work

Company: Vinson & Elkins LLP Address:

Specialities

China • Energy - Liquefied Natural Gas (LNG) • Energy - Oilfield Services • Energy - Upstream Oil & Gas • Mergers & Acquisitions • Employment / Labor • Private Equity • Energy / Utilities • Project Development

Professional Records

Lawyers & Attorneys

Tan Lu Photo 1

Tan Lu - Lawyer

View page
Office:
Vinson & Elkins LLP
Specialties:
China
Energy - Liquefied Natural Gas (LNG)
Energy - Oilfield Services
Energy - Upstream Oil & Gas
Mergers & Acquisitions
Employment / Labor
Private Equity
Energy / Utilities
Project Development
ISLN:
922700705
Admitted:
2011
University:
Nanjing University, B.S. Biochemistry, 2002; Vanderbilt University, Ph.D. Biological Sciences; Article Editor, Law and Contemporary Problems
Law School:
Duke University, J.D., 2011; Ann Bernard Martin Award for Excellence in Graduate Research, 2008; David Carvers Award for outstanding editing, 2011

Resumes

Resumes

Tan Lu Photo 2

Associate At Vinson & Elkins Llp

View page
Position:
Associate at Vinson & Elkins LLP
Location:
Houston, Texas
Industry:
Law Practice
Work:
Vinson & Elkins LLP - Houston, Texas since Oct 2011
Associate
Education:
Duke University School of Law 2008 - 2011
J.D. cum laude, Law
Vanderbilt University 2002 - 2008
Ph.D., Biological Sciences
Colorado State University 2004 - 2004
Certificate, Biology of Disease Vectors (BDV) Course
Nanjing University 1998 - 2002
B.S., Biochemistry
Tan Lu Photo 3

Windows Software Developer

View page
Location:
Owings Mills, MD
Industry:
Information Technology And Services
Work:
Fhr 2011 - 2012
Software Developer

State of Rhode Island 2011 - 2012
Windows Software Developer
Education:
Institute of Chemistry, Chinese Academy of Sciences 1988 - 1991
Doctorates, Doctor of Philosophy, Philosophy, Chemistry
Skills:
.Net/Wcf/Wf/Wif/Mvc
Microsoft Sql Server
Project Management
Sql
Program Management
Microsoft Office
Software Development
Research
Strategic Planning
Management
Requirements Analysis
Leadership
Xml
Analysis
Integration
Business Analysis
Tan Lu Photo 4

Tan Lu

View page

Business Records

Name / Title
Company / Classification
Phones & Addresses
Tan Sung Lu
President
T K Noodle, Inc
Eating Place
2020 Senter Rd, San Jose, CA 95112
(408) 293-6400
Tan Sung Lu
President
Tan Lu 11, Inc
265 E William St, San Jose, CA 95112
Tan Sung Lu
President
TAN LU 3, INC
261 E William St, San Jose, CA 95112
Tan Sung Lu
President
TK HOLDING, INC
Holding Company
2020 Senter Rd, San Jose, CA 95112
Tan Sung Lu
President
TK INVESTMENT, INC
Investor
2020 Senter Rd, San Jose, CA 95112
Tan Lu
Owner, President
T K Warehouse
Consumer Goods · Eating Place · Gift Shops
2010 Senter Rd, San Jose, CA 95112
2020 Senter Rd, San Jose, CA 95112
(408) 297-8888, (408) 293-6400, (408) 287-9000, (408) 287-9393
Tan Sung Lu
Partner
Lu, Tan Family Lp
Eating Place
265 E William St, San Jose, CA 95112
(408) 279-8888
Tan Sung Lu
San Ysidro Shopping Center LLC
Real Estate Commercial Renting · Ret Misc Merchandise
2020 Senter Rd, San Jose, CA 95112
848 Stewart Dr, Sunnyvale, CA 94085

Publications

Us Patents

Extended Input/Output Measurement Word Facility For Obtaining Measurement Data

View page
US Patent:
8639857, Jan 28, 2014
Filed:
Mar 22, 2013
Appl. No.:
13/848992
Inventors:
Greg A. Dyck - Morgan Hill CA, US
Tan Lu - Poughkeepsie NY, US
Kenneth J. Oakes - Poughkeepsie NY, US
William J. Rooney - Poughkeepsie NY, US
John S. Trotter - Poughkeepsie NY, US
Leslie W. Wyman - Poughkeepsie NY, US
Harry M. Yudenfriend - Poughkeepsie NY, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G06F 3/00
G01R 15/00
G06F 17/50
US Classification:
710 15, 710 20, 710 58, 702 57
Abstract:
An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.

Extended Input/Output Measurement Word Facility For Obtaining Measurement Data In An Emulated Environment

View page
US Patent:
20150199284, Jul 16, 2015
Filed:
Mar 26, 2015
Appl. No.:
14/669140
Inventors:
- Armonk NY, US
Greg A. DYCK - Morgan Hill CA, US
Tan LU - Poughkeepsie NY, US
Kenneth J. OAKES - Poughkeepsie NY, US
William J. ROONEY - Poughkeepsie NY, US
John S. TROTTER - Poughkeepsie NY, US
Leslie W. WYMAN - Poughkeepsie NY, US
Harry M. YUDENFRIEND - Poughkeepsie NY, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G06F 13/10
G06F 13/24
Abstract:
An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.

Extended Input/Output Measurement Word Facility For Obtaining Measurement Data In An Emulated Environment

View page
US Patent:
20140101344, Apr 10, 2014
Filed:
Dec 12, 2013
Appl. No.:
14/104577
Inventors:
- Armonk NY, US
Greg A. DYCK - Morgan Hill CA, US
Tan LU - Poughkeepsie NY, US
Kenneth J. OAKES - Poughkeepsie NY, US
William J. ROONEY - Poughkeepsie NY, US
John S. TROTTER - Poughkeepsie NY, US
Leslie W. WYMAN - Poughkeepsie NY, US
Harry M. YUDENFRIEND - Poughkeepsie NY, US
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION - Armonk NY
International Classification:
G06F 11/30
US Classification:
710 15
Abstract:
An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.
Tan Sung Lu from Fremont, CA, age ~94 Get Report